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US5945704A Expired / Lapsed US ⏱️ 0.0 years remaining

Trench capacitor with epi buried layer

Assignee: Infineon Technologies AG
•
Filing: 1998-06-26
•
Granted: 1999-08-31
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Expires: 2018-06-26
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Abstract

Abstract A trench capacitor with an epi layer in the lower portion of the trench. The epi layer serves as the buried plate of the trench capacitor. A diffusion region surrounds the lower portion of the trench to enhance the dopant concentration of the epi layer. The diffusion region is formed by, for example, gas phase doping, plasma doping, or plasma immersion ion implantation.

Inventors

  • 👤 Martin Schrems
  • 👤 Jack Mandelman
  • 👤 Joachim Hoepfner
  • 👤 Herbert Schaefer
  • 👤 Reinhard Stengl

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 09:01
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10B12/038; H10D; H10D1/00; H10D1/60; H10D1/62; H10D1/66; H10D1/665

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 76 words
A semiconductor integrated circuit comprising: a trench capacitor, wherein the trench capacitor comprises an epitaxial layer lining the lower portion of sidewalls of a trench below an oxide collar which lines an upper portion of the trench, the epitaxial layer abutting the oxide collar in the trench such that the oxide collar and the epitaxial layer do not overlap on the sidewalls of the trench; and a diffusion region surrounding the lower portion of the trench.
Claim 2
Dependent Claim 76 words
A semiconductor integrated circuit comprising: a trench capacitor, wherein the trench capacitor comprises an epitaxial layer lining the lower portion of sidewalls of a trench below an oxide collar which lines an upper portion of the trench, the epitaxial layer abutting the oxide collar in the trench such that the oxide collar and the epitaxial layer do not overlap on the sidewalls of the trench; and a diffusion region surrounding the lower portion of the trench.
Claim 3
Dependent Claim 38 words
The semiconductor integrated circuit as recited in claim 1, wherein the trench capacitor is formed in a substrate, the substrate having a dopant concentration and the diffusion region having a dopant concentration greater than the substrate dopant concentration.
Claim 4
Dependent Claim 24 words
The semiconductor integrated circuit as recited in claim 1, further comprises a continuous dielectric layer formed on the epitaxial layer and the oxide collar.
Claim 5
Dependent Claim 33 words
The semiconductor integrated circuit as recited in claim 1, wherein the epitaxial layer includes a reduced surface roughness over a roughness of the trench sidewalls such that improved capacitor breakdown voltage is provided.
Claim 6
Dependent Claim 24 words
The semiconductor integrated circuit as recited in claim 1, wherein the epitaxial layer is substantially defectless such that improved capacitor breakdown voltage is provided.
Claim 7
Dependent Claim 32 words
The semiconductor integrated circuit as recited in claim 1, wherein the diffusion region has dopants provided by one of a gas phased doping, a plasma doping and a plasma immersion ion implantation.
Claim 8
Dependent Claim 15 words
The semiconductor integrated circuit as recited in claim 1, wherein the epitaxial layer includes polysilicon.
Claim 9
Dependent Claim 21 words
The semiconductor integrated circuit as recited in claim 1, wherein the epitaxial layer is comprised of a plurality of epitaxial layers.
Claim 10
Dependent Claim 24 words
The semiconductor integrated circuit as recited in claim 1, wherein the diffusion region includes a dopant concentration of greater than about 1×10 18 atoms/cc.
Claim 11
Dependent Claim 30 words
The semiconductor integrated circuit as recited in claim 1, wherein the diffusion region includes a surface junction depth of about 0.1 times to about 0.7 times a minimum feature size.

References Cited (Backward Citations)

US5629226A Cited
US5731226A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-08-30 2003-03-01 2003-08-31 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-08-30 2007-03-01 2007-08-31 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-08-30 2011-03-01 2011-08-31 $7700.00 Window Closed / Lapsed

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