Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
113 words
A process for manufacturing semiconductor components including the step of testing the semiconductor components using a semiconductor test system operated according to a method comprising the steps of: a) providing a library containing a plurality of control objects, each of the control objects having a visible representation associated therewith; b) selecting a portion of the plurality of control objects using the visible representations associated therewith; c) executing an initiation phase whereby identifications of selected control objects are stored; d) executing a test job by activating a control object whereby during execution of the test job control objects use the stored identifications of selected control objects to share information with other selected control objects.
Claim 2
Dependent Claim
113 words
A process for manufacturing semiconductor components including the step of testing the semiconductor components using a semiconductor test system operated according to a method comprising the steps of: a) providing a library containing a plurality of control objects, each of the control objects having a visible representation associated therewith; b) selecting a portion of the plurality of control objects using the visible representations associated therewith; c) executing an initiation phase whereby identifications of selected control objects are stored; d) executing a test job by activating a control object whereby during execution of the test job control objects use the stored identifications of selected control objects to share information with other selected control objects.
Claim 3
Dependent Claim
27 words
The process of claim 1 wherein a portion of the control objects comprise operator controls having associated therewith a visible display for use by a human operator.
Claim 4
Dependent Claim
17 words
The process of claim 1 wherein a portion of the control objects comprise host message control objects.
Claim 5
Dependent Claim
16 words
The process of claim 1 wherein a portion of the control objects comprise tester control objects.
Claim 6
Dependent Claim
16 words
The process of claim 1 wherein a portion of the control objects comprise handler control objects.
Claim 7
Dependent Claim
18 words
The method of claim 5 wherein the library contains control objects for a plurality of types of handlers.
Claim 8
Dependent Claim
28 words
The process of claim 1 wherein the control objects are self contained control objects that are selected by moving the visible representations associated therewith to an active window.
Claim 9
Dependent Claim
26 words
The method of claim 1 wherein the step of executing an initiation phase comprises controlling the selected control objects to search for other selected control objects.
Claim 10
Dependent Claim
28 words
The method of claim 1 wherein the step of executing an initiation phase to store an identification of selected control objects comprises storing handles to selected control objects.
Claim 11
Dependent Claim
125 words
A process for manufacturing semiconductor components including the step of testing the semiconductor components using a semiconductor test system operated according to a method comprising the steps of: a) providing a library containing a plurality of control objects, each of the control objects having a visible representation associated therewith; b) selecting control objects from the library by dragging and dropping the visible representations associated therewith into an active window; c) executing an initialization routine during which selected control objects search for other selected control objects and store indications of other selected control objects; d) executing a test job by activating a first control object and a second control object whereby the second control object is accessed by the first control object using the stored identification.
Claim 12
Dependent Claim
125 words
A process for manufacturing semiconductor components including the step of testing the semiconductor components using a semiconductor test system operated according to a method comprising the steps of: a) providing a library containing a plurality of control objects, each of the control objects having a visible representation associated therewith; b) selecting control objects from the library by dragging and dropping the visible representations associated therewith into an active window; c) executing an initialization routine during which selected control objects search for other selected control objects and store indications of other selected control objects; d) executing a test job by activating a first control object and a second control object whereby the second control object is accessed by the first control object using the stored identification.
Claim 13
Dependent Claim
13 words
The process of claim 10 wherein the control objects include Active-X control objects.
Claim 14
Dependent Claim
26 words
The process of claim 10 wherein the step of activating a first control object comprises a human operator activating a button display on a computer screen.
Claim 15
Dependent Claim
19 words
The process of claim 10 wherein the step of executing a test job is performed in a production environment.
Claim 16
Dependent Claim
27 words
The process of claim 13 wherein the step of selecting control objects and executing a test job are performed by different human operators of the test system.
Claim 17
Dependent Claim
112 words
A process for manufacturing semiconductor components including the step of testing the semiconductor components using a semiconductor test system operated according to a method comprising the steps of: a) providing a library containing a plurality of control objects, each of the control objects having a visible representation associated therewith; b) forming a production interface by selecting control objects from the library using a drag and drop human interface, thereby placing visual representations associated with selected control objects in an active window; c) initializing the production interface by storing handles representing selected control objects; d) executing a test job during which a selected control object accesses another control object using the stored handles.
Claim 18
Dependent Claim
112 words
A process for manufacturing semiconductor components including the step of testing the semiconductor components using a semiconductor test system operated according to a method comprising the steps of: a) providing a library containing a plurality of control objects, each of the control objects having a visible representation associated therewith; b) forming a production interface by selecting control objects from the library using a drag and drop human interface, thereby placing visual representations associated with selected control objects in an active window; c) initializing the production interface by storing handles representing selected control objects; d) executing a test job during which a selected control object accesses another control object using the stored handles.
Claim 19
Dependent Claim
30 words
The process of claim 15 wherein the step of initializing comprises iterating through all selected controls, identifying controls of a predetermined type and storing a handle to the identified controls.
Claim 20
Dependent Claim
15 words
The process of claim 15 wherein the library of control objects comprises ACTIVE-X control objects.
Claim 21
Dependent Claim
20 words
The process of claim 15 wherein the step of executing a test job comprises a human activating a control object.