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US5928207A Expired / Lapsed US ⏱️ 0.0 years remaining

Microneedle with isotropically etched tip, and method of fabricating such a device

Assignee: University of California
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Filing: 1997-06-30
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Granted: 1999-07-27
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Expires: 2017-06-30
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Abstract

Abstract A microneedle includes an elongated body with a top surface, a bottom surface, a first side wall between the top surface and the bottom surface, and a second side wall between the top surface and the bottom surface. An end is defined by the bottom surface converging into a tip, an isotropically etched portion of the first side wall converging into the tip, and an isotropically etched portion of the second side wall converging into the tip. The elongated body is less than approximately 700 μm wide and less than approximately 200 μm thick. The elongated body may incorporate a fluid channel. The elongated body may be formed of silicon that is not doped with Boron. In such a configuration, integrated circuitry or a micromachined device, such as a heater or pump may also be formed on the device. A number of novel processing techniques are associated with the fabrication of the device. The device may be formed by relying solely on isotropic etching. Alternately, a combination of isotropic and anisotropic etching may be used. Unlike prior art micromachined devices, the disclosed device may be processed at relatively low temperatures below 1100° C. and without using the carcinogen ethylenediamin pyrocatechol.

Inventors

  • 👤 Albert P. Pisano
  • 👤 Kyle S. Lebouitz

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 23:17
CPC Classifications
A; A61; A61B; A61B5/00; A61B5/145; A61B5/14542; A61M; A61M5/00; A61M5/178; A61M5/31; A61M5/32; A61B5/1468; A61B5/1473; A61B5/24; A61B5/25; A61B5/279; A61B5/296; A61B5/68; A61B5/6846; A61B5/6847; A61B5/6848; A61B5/685

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 70 words
A method of fabricating a lancet, said method comprising the steps of: providing a semiconductor substrate; defining a mask configuration on said semiconductor substrate, said mask configuration corresponding to the shape of a lancet for lancing tissue; and applying an isotropic etchant to said semiconductor substrate, said mask configuration causing said isotropic etchant to etch said semiconductor substrate to define a lancet with isotropically etched sidewalls converging into a tip.
Claim 2
Independent Claim 70 words
A method of fabricating a lancet, said method comprising the steps of: providing a semiconductor substrate; defining a mask configuration on said semiconductor substrate, said mask configuration corresponding to the shape of a lancet for lancing tissue; and applying an isotropic etchant to said semiconductor substrate, said mask configuration causing said isotropic etchant to etch said semiconductor substrate to define a lancet with isotropically etched sidewalls converging into a tip.
Claim 3
Dependent Claim 23 words
The method of claim 1 wherein said providing step includes the step of providing a silicon on-insulator (SOI) wafer as said semiconductor substrate.
Claim 4
Dependent Claim 17 words
The method of claim 1 wherein said applying step is performed at temperatures below approximately 1100° C.
Claim 5
Dependent Claim 24 words
The method of claim 1 wherein said applying step results in a lancet that is between approximately 100 μm wide and 700 μm wide.
Claim 6
Dependent Claim 24 words
The method of claim 1 wherein said applying step results in a lancet that is between approximately 100 μm thick and 200 μm thick.
Claim 7
Independent Claim 82 words
A method of fabricating a lancet, said method comprising the steps of: providing a semiconductor substrate; defining a mask configuration on said semiconductor substrate, said mask configuration corresponding to the shape of a lancet for lancing tissue; and applying an isotropic etchant to said semiconductor substrate, said mask configuration causing said isotropic etchant to etch said semiconductor substrate to define a lancet with isotropically etched sidewalls converging into a tip, wherein said applying step is performed without the use of ethylenediamine pyrocatechol.
Claim 8
Independent Claim 82 words
A method of fabricating a lancet, said method comprising the steps of: providing a semiconductor substrate; defining a mask configuration on said semiconductor substrate, said mask configuration corresponding to the shape of a lancet for lancing tissue; and applying an isotropic etchant to said semiconductor substrate, said mask configuration causing said isotropic etchant to etch said semiconductor substrate to define a lancet with isotropically etched sidewalls converging into a tip, wherein said applying step is performed without the use of ethylenediamine pyrocatechol.
Claim 9
Independent Claim 96 words
A method of fabricating a needle, said method comprising the steps of: providing a semiconductor substrate; defining a mask configuration on said semiconductor substrate, said mask configuration corresponding to the shape of a needle; applying an isotropic etchant to said semiconductor substrate, said mask configuration causing said isotropic etchant to etch said semiconductor substrate to define a needle with isotropically etched sidewalls converging into a tip, wherein said applying step is performed without the use of ethylenediamine pyrocatechol; and fabricating a cap on said needle to establish a channel between said cap and said semiconductor substrate.
Claim 10
Independent Claim 96 words
A method of fabricating a needle, said method comprising the steps of: providing a semiconductor substrate; defining a mask configuration on said semiconductor substrate, said mask configuration corresponding to the shape of a needle; applying an isotropic etchant to said semiconductor substrate, said mask configuration causing said isotropic etchant to etch said semiconductor substrate to define a needle with isotropically etched sidewalls converging into a tip, wherein said applying step is performed without the use of ethylenediamine pyrocatechol; and fabricating a cap on said needle to establish a channel between said cap and said semiconductor substrate.

References Cited (Backward Citations)

US5030228A Cited
US5178628A Cited
US5263974A Cited
US5464422A Cited
US5342397A Cited
US5591139A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-07-26 2003-01-25 2003-07-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-07-26 2007-01-25 2007-07-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-07-26 2011-01-25 2011-07-27 $7700.00 Window Closed / Lapsed

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