US5900941A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High speed pattern inspection method and system
Assignee: Fujitsu Ltd
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Filing: 1997-05-29
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Granted: 1999-05-04
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Expires: 2017-05-29
Abstract
Abstract A pattern inspection method includes the steps of: copying design data representative of a design pattern in a storage unit; generating index data and storing the index data in the storage unit, the index data indicating data at what position of the design pattern is stored at which location of the storage unit; picking up an image of a real pattern on a stage and generating real pattern data; reading the design data by using the index data in accordance with a position on the real pattern; generating design pattern data in accordance with the read design data; and comparing the real pattern data with the design pattern data to detect any defect in the real pattern data. A pattern inspection method and system is provided which can perform die-to-database inspection at high speed.
Inventors
- 👤 Takayoshi Matsuyama
- 👤 Ken-ichi Kobayashi
- 👤 Katsuyoshi Nakashima
- 👤 Yasunori Hada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 23:33
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/95; G01N21/956; G01N21/95607
Claims Analysis
Total Claims: 34
Claim 1
Independent Claim
111 words
A pattern inspection method comprising the steps of: copying design data representative of a design pattern in a storage unit; generating index data and storing the generated index data in the storage unit, the index data indicating where data corresponding to an area of the design pattern is stored in the storage unit; imaging a real pattern on a stage and generating real pattern data; reading the design data using the generated index data corresponding to a position of the real pattern; generating design pattern data corresponding to the read design data; and comparing the real pattern data with the design pattern data to detect defects in the real pattern data.
Claim 2
Dependent Claim
111 words
A pattern inspection method comprising the steps of: copying design data representative of a design pattern in a storage unit; generating index data and storing the generated index data in the storage unit, the index data indicating where data corresponding to an area of the design pattern is stored in the storage unit; imaging a real pattern on a stage and generating real pattern data; reading the design data using the generated index data corresponding to a position of the real pattern; generating design pattern data corresponding to the read design data; and comparing the real pattern data with the design pattern data to detect defects in the real pattern data.
Claim 3
Dependent Claim
38 words
A pattern inspection method according to claim 1, wherein said imaging step is executed in units corresponding to a small partition of the real pattern, and said reading step reads the design data corresponding to the small partition.
Claim 4
Dependent Claim
39 words
A pattern inspection method according to claim 2, wherein the design pattern and the real pattern have different coordinate systems, and said reading step and said design pattern data generating step execute data conversion, including converting the coordinate systems.
Claim 5
Dependent Claim
27 words
A pattern inspection method according to claim 3, wherein the different coordinate systems are related with at least one of relationships including rotation, mirror reflection, and magnification/reduction.
Claim 6
Dependent Claim
73 words
A pattern inspection method according to claim 1, wherein said reading step includes the steps of: converting coordinates of a small partition of the real pattern into coordinates of the design pattern; searching the index data corresponding to the coordinates of the design pattern to obtain an address in the storage unit; and reading design data of the design pattern, corresponding to the small partition, from the obtained address of the storage unit.
Claim 7
Dependent Claim
54 words
A pattern inspection method according to claim 5, wherein said design pattern data generating step includes the steps of: converting coordinates of the read design data from a design pattern coordinate system into a real pattern coordinate system; and generating the design pattern data in accordance with the converted coordinates of the design data.
Claim 8
Dependent Claim
47 words
A pattern inspection method according to claim 2, wherein said imaging step includes the step of consecutively scanning the real pattern, and said reading step and said design pattern data generating step execute processes in parallel on a plurality of consecutive small partitions of the real pattern.
Claim 9
Dependent Claim
37 words
A pattern inspection method according to claim 1, wherein the design data is stored in a plurality of files, and said copying step, said index data generating step, and said reading step are performed for each file.
Claim 10
Dependent Claim
28 words
A pattern inspection method according to claim 8, wherein said design pattern data generating step accumulates a transparent area in each file to generate the design pattern data.
Claim 11
Dependent Claim
42 words
A pattern inspection method according to claim 1, wherein the design pattern and the real pattern have a relationship of a negative/positive reversal, and said design pattern data generating step includes the step of executing a negative/positive reversal of the design data.
Claim 12
Dependent Claim
22 words
A pattern inspection method according to claim 1, wherein said index data generating step is executed in parallel with said copying step.
Claim 13
Dependent Claim
46 words
A pattern inspection method according to claim 1, wherein said index data generating step divides the design data into data of small partitions, and the generated index data indicates an address where information corresponding to data of each small partition is stored in the storage unit.
Claim 14
Dependent Claim
57 words
A pattern inspection method according to claim 12, wherein said index data generating step includes the step of forming a table containing the number of patterns located in each small partition and a design data write start address indicating an address where information corresponding to each of the number of patterns is stored in said storage unit.
Claim 15
Dependent Claim
70 words
A pattern inspection method according to claim 13, wherein the index data includes a header part indicating a size of the design pattern, an index part indicating, for each of the small partitions of the design pattern, an address of the design data in each small partition, and a design data address part indicating, for each small partition, the number of patterns and a write start address of each pattern.
Claim 16
Dependent Claim
38 words
A pattern inspection method according to claim 13, wherein if one pattern is disposed in a plurality of small partitions, the write start address in the index data is the same for all the plurality of small partitions.
Claim 17
Dependent Claim
147 words
A pattern inspection system comprising: a storage unit for storing design data corresponding to a design pattern having a plurality of data positions, and for storing index data indicating a location where data corresponding to each of the plurality of data positions of the design pattern is stored in the storage unit; writing means for writing the design data into the storage unit, generating the index data, and writing the index data into the storage unit; an image pickup optical system for imaging a real pattern and generating real pattern data; means for reading the design data using the index data corresponding to a position of the real pattern; image developing means for generating design pattern data in accordance with the read design data; and defect detecting means for comparing the real pattern data with the design pattern data to detect defects in the real pattern data.
Claim 18
Dependent Claim
147 words
A pattern inspection system comprising: a storage unit for storing design data corresponding to a design pattern having a plurality of data positions, and for storing index data indicating a location where data corresponding to each of the plurality of data positions of the design pattern is stored in the storage unit; writing means for writing the design data into the storage unit, generating the index data, and writing the index data into the storage unit; an image pickup optical system for imaging a real pattern and generating real pattern data; means for reading the design data using the index data corresponding to a position of the real pattern; image developing means for generating design pattern data in accordance with the read design data; and defect detecting means for comparing the real pattern data with the design pattern data to detect defects in the real pattern data.
Claim 19
Dependent Claim
83 words
A pattern inspection system according to claim 16, wherein the design pattern is divided into small partitions, and wherein the index data includes a header part indicating a size of the design pattern, an index part indicating, for each partition, an address where the design data in each small partition is stored in the storage unit, and a design data address part indicating, for each small partition, a number of patterns and a write start address of each pattern in the storage unit.
Claim 20
Dependent Claim
38 words
A pattern inspection method according to claim 17, wherein if one pattern is disposed in a plurality of small partitions, the write start address in the index data is the same for all the plurality of small partitions.
Claim 21
Dependent Claim
81 words
A pattern inspection method comprising the steps of: generating index data indicating where design data corresponding to an area of a design pattern is located; reading design data from the generated index data corresponding to a real pattern; converting coordinates of the read design data to coordinates of the real pattern; generating design pattern data corresponding to the converted read design data; and comparing the real pattern data with the design pattern data to detect defects in the real pattern data.
Claim 22
Dependent Claim
81 words
A pattern inspection method comprising the steps of: generating index data indicating where design data corresponding to an area of a design pattern is located; reading design data from the generated index data corresponding to a real pattern; converting coordinates of the read design data to coordinates of the real pattern; generating design pattern data corresponding to the converted read design data; and comparing the real pattern data with the design pattern data to detect defects in the real pattern data.
Claim 23
Dependent Claim
39 words
The pattern inspection method of claim 19, said reading step further comprising imaging a real pattern in units corresponding to a partition of the real pattern and reading design data from the generated index data corresponding to the units.
Claim 24
Dependent Claim
62 words
A pattern inspection method according to claim 19, said reading step further comprising: converting coordinates of a small partition of the real pattern into coordinates of the design pattern; searching the index data corresponding to the coordinates of the design pattern to obtain an address; and reading design data of the design pattern, corresponding to the small partition, from the obtained address.
Claim 25
Dependent Claim
45 words
A pattern inspection method according to claim 20, wherein said imaging includes consecutively scanning the real pattern, and said design data reading step and said design pattern data generating step execute processes in parallel on a plurality of consecutive small partitions of the real pattern.
Claim 26
Dependent Claim
55 words
A pattern inspection method according to claim 19, further comprising the step of copying design data of a design pattern, wherein the design data is stored in a plurality of files, and said copying step, said index data generating step, and said design data reading step are performed for each of the plurality of files.
Claim 27
Dependent Claim
32 words
A pattern inspection method according to claim 19, wherein said design pattern data generating step accumulates a transparent area in each of the plurality of files to generate the design pattern data.
Claim 28
Dependent Claim
39 words
A pattern inspection method according to claim 19, wherein the design pattern and the real pattern have a relationship of a negative/positive reversal, and said design pattern data generating step includes executing a negative/positive reversal of the design data.
Claim 29
Dependent Claim
36 words
A pattern inspection method according to claim 19, wherein said index data generating step divides the design data into partitions, and the generated index data indicates an address where information corresponding to the partitions is stored.
Claim 30
Dependent Claim
51 words
A pattern inspection method according to claim 26, wherein said index data generating step includes forming a table containing the number of patterns located in each of the partitions and a design data write start address indicates an address where information corresponding to each of the number of patterns is stored.
Claim 31
Dependent Claim
67 words
A pattern inspection method according to claim 27, wherein the index data includes a header part indicating a size of the design pattern, an index part indicating, for each of the partitions, an address of the design data in each of the partitions, and a design data address part indicating, for each of the partitions, the number of patterns and a write start address of each pattern.
Claim 32
Dependent Claim
45 words
A pattern inspection method according to claim 27, wherein if a pattern of the number of patterns is disposed in more than one of the partitions, the write address in the generated index data is the same for all of the more than one partitions.
Claim 33
Dependent Claim
102 words
A pattern inspection system for detecting defects on a real pattern, comprising: a storage device to store design data of a design pattern and index data indicating a location of data corresponding to data positions of the design pattern in the storage device; a reading device to read the stored design data that corresponds to the real pattern, and to convert coordinates of the read design data into coordinates of the real pattern; an imaging device to generate design pattern data corresponding to the read design data; and a detecting device to compare the real pattern data with the design pattern data.
Claim 34
Dependent Claim
102 words
A pattern inspection system for detecting defects on a real pattern, comprising: a storage device to store design data of a design pattern and index data indicating a location of data corresponding to data positions of the design pattern in the storage device; a reading device to read the stored design data that corresponds to the real pattern, and to convert coordinates of the read design data into coordinates of the real pattern; an imaging device to generate design pattern data corresponding to the read design data; and a detecting device to compare the real pattern data with the design pattern data.
References Cited (Backward Citations)
US4347001A
Cited
US4532650A
Cited
US4555798A
Cited
JPS61245068A
Cited
US4805123A
Cited
US4805123B1
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-05-03 | 2002-11-02 | 2003-05-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-05-03 | 2006-11-02 | 2007-05-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-05-03 | 2010-11-02 | 2011-05-04 | $7700.00 | Window Closed / Lapsed |