Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
175 words
A method for fabricating a piezoelectric resonator having a specified resonant frequency, the method comprising: fabricating a substrate having a top and bottom surface and having a top electrode on the top surface of the substrate and having a bottom electrode on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the top electrode comprising a primary layer of conducting material, a portion of the top electrode overlapping with a portion of the bottom electrode and said overlapping portions defining the resonator, adding a differential layer of conducting material on top of the top electrode, said differential layer of conducting material shifting the resonant frequency of the resonator to approximately the specified resonant frequency, removing from the top electrode portions of the top electrode that include, but are not necessarily limited to, those portions of the top electrode that overlap with a portion of the bottom electrode and that are not composed of a portion of both the primary layer of conducting material and the differential layer of conducting material.
Claim 2
Independent Claim
175 words
A method for fabricating a piezoelectric resonator having a specified resonant frequency, the method comprising: fabricating a substrate having a top and bottom surface and having a top electrode on the top surface of the substrate and having a bottom electrode on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the top electrode comprising a primary layer of conducting material, a portion of the top electrode overlapping with a portion of the bottom electrode and said overlapping portions defining the resonator, adding a differential layer of conducting material on top of the top electrode, said differential layer of conducting material shifting the resonant frequency of the resonator to approximately the specified resonant frequency, removing from the top electrode portions of the top electrode that include, but are not necessarily limited to, those portions of the top electrode that overlap with a portion of the bottom electrode and that are not composed of a portion of both the primary layer of conducting material and the differential layer of conducting material.
Claim 3
Independent Claim
234 words
A method for fabricating first and second piezoelectric resonators, the resonant frequency of the first resonator being shifted in frequency relative to the resonant frequency of the second resonator, the method comprising: fabricating a substrate having a top and bottom surface and having first and second top electrodes on the top surface of the substrate and having first and second bottom electrodes on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the first and second top electrodes comprising a primary layer of conducting material, and the first and second bottom electrodes comprising a primary layer of conducting material and the first top electrode additionally comprising a differential layer of conducting material, a portion of the first top electrode overlapping with a portion of the first bottom electrode and said overlapping portions defining the first resonator, a portion of the second top electrode overlapping with a portion of the second bottom electrode and said overlapping portions defining the second resonator, said differential layer of conducting material of said first top electrode shifting the resonant frequency of the first resonator relative to the resonant frequency of the second resonator, removing from the first top electrode those portions of the first electrode that overlap with the first bottom electrode and that are not composed of a portion of both the layer of conducting material and the differential layer of conducting material.
Claim 4
Independent Claim
234 words
A method for fabricating first and second piezoelectric resonators, the resonant frequency of the first resonator being shifted in frequency relative to the resonant frequency of the second resonator, the method comprising: fabricating a substrate having a top and bottom surface and having first and second top electrodes on the top surface of the substrate and having first and second bottom electrodes on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the first and second top electrodes comprising a primary layer of conducting material, and the first and second bottom electrodes comprising a primary layer of conducting material and the first top electrode additionally comprising a differential layer of conducting material, a portion of the first top electrode overlapping with a portion of the first bottom electrode and said overlapping portions defining the first resonator, a portion of the second top electrode overlapping with a portion of the second bottom electrode and said overlapping portions defining the second resonator, said differential layer of conducting material of said first top electrode shifting the resonant frequency of the first resonator relative to the resonant frequency of the second resonator, removing from the first top electrode those portions of the first electrode that overlap with the first bottom electrode and that are not composed of a portion of both the layer of conducting material and the differential layer of conducting material.
Claim 5
Dependent Claim
111 words
The method of claim 2 wherein the step of fabricating a substrate having a top and bottom surface and having first and second top electrodes on the top surface of the substrate and having first and second bottom electrodes on the bottom surface of the substrate includes the steps of: fabricating a primary layer of conducting material on the top surface of the substrate to form first and second top electrodes on the top surface of the substrate, and fabricating a differential layer of conducting material upon the first top electrode so as to shift the resonant frequency of the first resonator relative to the resonant frequency of the second resonator.
Claim 6
Dependent Claim
118 words
The method of claim 2 wherein the step of fabricating a substrate having a top and bottom surface and having first and second top electrodes on the top surface of the substrate and having first and second bottom electrodes on the bottom surface of the substrate includes the steps of: fabricating a differential layer of conducting material on the top surface of the substrate, and fabricating a primary layer of conducting material on the top surface of the substrate to form first and second top electrodes on the top surface of the substrate, said differential layer of conducting material on the top surface of the substrate underlying the primary layer of conducting material of the first top electrode.
Claim 7
Dependent Claim
178 words
A piezoelectric resonator having specified resonant frequency fabricated by: fabricating a substrate having a top and bottom surface and having a top electrode on the top surface of the substrate and having a bottom electrode on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the top electrode comprising a primary layer of conducting material, a portion of the top electrode overlapping with a portion of the bottom electrode and said overlapping portions defining the resonator, adding a differential layer of conducting material on top of the top electrode, said differential layer of conducting material shifting the resonant frequency of the resonator to approximately the specified resonant frequency, removing from the top electrode those portions of the top electrode that overlap with a portion of the bottom electrode and that are not composed of a portion of both the primary layer of conducting material and the differential layer of conducting material whereby the remaining portion of the top electrode that overlaps with a portion of the bottom electrode has a substantially uniform thickness.
Claim 8
Dependent Claim
178 words
A piezoelectric resonator having specified resonant frequency fabricated by: fabricating a substrate having a top and bottom surface and having a top electrode on the top surface of the substrate and having a bottom electrode on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the top electrode comprising a primary layer of conducting material, a portion of the top electrode overlapping with a portion of the bottom electrode and said overlapping portions defining the resonator, adding a differential layer of conducting material on top of the top electrode, said differential layer of conducting material shifting the resonant frequency of the resonator to approximately the specified resonant frequency, removing from the top electrode those portions of the top electrode that overlap with a portion of the bottom electrode and that are not composed of a portion of both the primary layer of conducting material and the differential layer of conducting material whereby the remaining portion of the top electrode that overlaps with a portion of the bottom electrode has a substantially uniform thickness.
Claim 9
Independent Claim
252 words
A device comprising first and second piezoelectric resonators, the resonant frequency of the first resonator being shifted in frequency relative to the resonant frequency of the second resonator, fabricated by: fabricating a substrate having a top and bottom surface and having first and second top electrodes on the top surface of the substrate and having first and second bottom electrodes on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the first and second electrodes comprising a primary layer of conducting material, and the first and second bottom electrodes comprising a primary layer of conducting material and the first top electrode additionally comprising a differential layer of conducting material, a portion of the first top electrode overlapping with a portion of the first bottom electrode and said overlapping portions defining the first resonator, a portion of the second top electrode overlapping with a portion of the second bottom electrode and said overlapping portions defining the second resonator, said differential layer of conducting material of said first top electrode shifting the resonant frequency of the first resonator relative to the resonant frequency of the second resonator, removing from the first top electrode those portions of the first electrode that overlap with the first bottom electrode and that are not composed of a portion of both the layer of conducting material and the differential layer of conducting material whereby the remaining portion of the first top electrode that overlaps with the first bottom electrode has a substantially uniform thickness.
Claim 10
Independent Claim
252 words
A device comprising first and second piezoelectric resonators, the resonant frequency of the first resonator being shifted in frequency relative to the resonant frequency of the second resonator, fabricated by: fabricating a substrate having a top and bottom surface and having first and second top electrodes on the top surface of the substrate and having first and second bottom electrodes on the bottom surface of the substrate, the substrate including a layer of piezoelectric material, the first and second electrodes comprising a primary layer of conducting material, and the first and second bottom electrodes comprising a primary layer of conducting material and the first top electrode additionally comprising a differential layer of conducting material, a portion of the first top electrode overlapping with a portion of the first bottom electrode and said overlapping portions defining the first resonator, a portion of the second top electrode overlapping with a portion of the second bottom electrode and said overlapping portions defining the second resonator, said differential layer of conducting material of said first top electrode shifting the resonant frequency of the first resonator relative to the resonant frequency of the second resonator, removing from the first top electrode those portions of the first electrode that overlap with the first bottom electrode and that are not composed of a portion of both the layer of conducting material and the differential layer of conducting material whereby the remaining portion of the first top electrode that overlaps with the first bottom electrode has a substantially uniform thickness.
Claim 11
Dependent Claim
87 words
The device of claim 6 wherein the step of fabricating first and second top electrodes on the top surface of the substrate includes the steps of: fabricating a primary layer of conducting material on the top surface of the substrate to form first and second top electrodes on the top surface of the substrate, and fabricating a differential layer of conducting material upon the first top electrode so as to shift the resonant frequency of the first resonator relative to the resonant frequency of the second resonator.
Claim 12
Dependent Claim
94 words
The device of claim 6 wherein the step of fabricating first and second top electrodes on the top surface of the substrate includes the steps of: fabricating a differential layer of conducting material on the top surface of the substrate, and fabricating a primary layer of conducting material on the top surface of the substrate to form first and second top electrodes on the top surface of the substrate, said differential layer of conducting material on the top surface of the substrate underlying the primary layer of conducting material of the first top electrode.
Claim 13
Dependent Claim
54 words
The method of claim 1 in which the specified resonant frequency to which the resonant frequency of the resonator is shifted is specified as a specified shift in resonant frequency of the resonator relative to the resonant frequency of a second resonator fabricated as part of the same process set forth in claim 1.
Claim 14
Dependent Claim
48 words
The piezoelectric resonator of claim 5 in which the specified resonant frequency of the resonator is specified as a specified shift in resonant frequency of the resonator relative to the resonant frequency of a second resonator fabricated as part of the same process set forth in claim 5.