US5891797A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of forming a support structure for air bridge wiring of an integrated circuit
Assignee: Micron Technology Inc
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Filing: 1997-10-20
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Granted: 1999-04-06
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Expires: 2017-10-20
Abstract
Abstract A process of manufacturing integrated circuits is disclosed for designing and implementing a hierarchical wiring system. The interconnection requirements are sorted and designed into a particular wiring level according to length. Support structures may be constructed to allow more flexibility in designing air bridge dimensions. The support structures may take the form of lateral ribs or intermediate posts, and may be fabricated of either insulating or conductive material. One integrated circuit described is a memory device, such as a dynamic random access memory.
Inventors
- 👤 Paul A. Farrar
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 18:27
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/01; H10W10/021; H10W10/20; H10W20/00; H10W20/01; H10W20/071; H10W20/072; H10W20/40; H10W20/41; H10W20/43; H10W20/432; H10W20/45; H10W20/46
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
150 words
A process for constructing a support structure for an air-bridge in an integrated circuit, the process comprising: depositing low temperature SiO 2 to a thickness defining a height of the air-bridge; applying a photo resist to the SiO 2 ; selectively removing the SiO 2 from an area where the support structure is desired; applying a polymer in the area where the SiO 2 was removed; planerizing the polymer and the SiO 2 to a common height; applying a photo resist to the polymer and the SiO 2 ; selectively removing the polymer and/or the SiO 2 from areas where vertical wiring connectors are desired; depositing a conductive material over the polymer and the SiO 2 , and into the areas defined for the vertical wiring connectors; etching a pattern for the air-bridge from the conductive material; and removing the SiO 2 thereby leaving the air-bridge and polymer support structure.
Claim 2
Dependent Claim
150 words
A process for constructing a support structure for an air-bridge in an integrated circuit, the process comprising: depositing low temperature SiO 2 to a thickness defining a height of the air-bridge; applying a photo resist to the SiO 2 ; selectively removing the SiO 2 from an area where the support structure is desired; applying a polymer in the area where the SiO 2 was removed; planerizing the polymer and the SiO 2 to a common height; applying a photo resist to the polymer and the SiO 2 ; selectively removing the polymer and/or the SiO 2 from areas where vertical wiring connectors are desired; depositing a conductive material over the polymer and the SiO 2 , and into the areas defined for the vertical wiring connectors; etching a pattern for the air-bridge from the conductive material; and removing the SiO 2 thereby leaving the air-bridge and polymer support structure.
Claim 3
Dependent Claim
16 words
The process of claim 1 wherein Si 3 N 4 is substituted for SiO 2 .
Claim 4
Dependent Claim
16 words
The process of claim 1 wherein a high temperature polymer is substituted for SiO 2 .
Claim 5
Dependent Claim
12 words
The process of claim 3 wherein the high temperature polymer is polyimide.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-04-05 | 2002-10-05 | 2003-04-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-04-05 | 2006-10-05 | 2007-04-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-04-05 | 2010-10-05 | 2011-04-06 | $7700.00 | Window Closed / Lapsed |