EEPROM having coplanar on-insulator FET and control gate

Claim 2

An electrically erasable programmable read-only memory (EEPROM) device comprising: a floating gate having a planar surface; a control gate being capacitively coupled to said floating gate; and an insulated-gate field-effect transistor having a gate electrode, said gate electrode being formed by said floating gate, said control gate and said insulated-gate field-effect transistor being made from the same layer of semiconductor material lying on a first insulating layer, wherein said insulated-gate field-effect transistor and said control gate are coplanar, a second insulating layer lying over a channel region of said insulated-gate field-effect transistor and said control gate, said floating gate lying over said second insulating layer over both said control gate and said channel region of said insulated-gate field effect transistor, said planar surface of said floating gate being parallel to said coplanar surfaces of said control gate and said insulated-gate field-effect transistor, and said second insulating layer having a same thickness between (i) said coplanar surface of said control gate and said planar surface of said floating gate and (ii) said coplanar surface of said insulated-gate field-effect transistor and said planar surface of said floating gate.

Claim 3

The EEPROM device of claim 1 wherein said layer of semiconductor material is a material selected from the group consisting of silicon, germanium, silicon carbide, silicon germanium, gallium arsenide, gallium nitride, indium gallium arsenide and indium phosphide.

Claim 4

The EEPROM device of claim 1 wherein said layer of semiconductor material is selected from the group consisting of single crystal, polycrystalline and amorphous semiconductor material.

Claim 5

The EEPROM device of claim 1 wherein said control gate and said insulated-gate field effect transistor are spaced apart on separate semiconductor islands formed by patterning said layer of semiconductor material.

Claim 6

The EEPROM device of claim 4 further including insulating material between said separate semiconductor islands.

Claim 7

The EEPROM device of claim 5 wherein said insulating material is substantially coplanar with said separate semiconductor islands.

Claim 8

The EEPROM device of claim 1 wherein the source and drain of said insulated-gate field-effect transistor is formed by ion implantation using said floating gate as a mask.

Claim 9

The EEPROM device of claim 1 wherein the perimeter of said floating gate has sidewalls along said perimeter of a dielectric material.

Claim 10

The EEPROM device of claim 8 further including a layer of refractory metal silicide on the upper surface of said floating gate and on the upper surface of said control gate and said insulated-gate field effect transistor exterior of said sidewalls to provide low ohmic resistance.

Claim 11

The EEPROM device of claim 4 wherein said floating gate lying over said control gate terminates interior of one or more edges of said semiconductor island whereby an upper surface of said semiconductor island is exposed around one or more edges of said floating gate.

Claim 12

The EEPROM device of claim 10 further including a layer of refractory metal silicide on the upper surface of said semiconductor island around one or more edges of said floating gate to permit low ohmic resistance when a plurality of control gates are coupled in series.

Claim 13

The EEPROM according to claim 1, wherein said floating gate extends over said control gate so as to provide a capacitive coupling having a predetermined value such that substantially a majority of programming voltage falls across said insulated-gate field-effect transistor.

Claim 14

The EEPROM according to claim 1, wherein said layer of semiconductor material comprises an only layer of semiconductor material for forming said field effect transistor and said control gate.

Claim 15

A memory including electrically erasable programmable read-only memory (EEPROM) devices, each of said EEPROM devices comprising: a floating gate; a control gate being capacitively coupled to said floating gate; and an insulated-gate field-effect transistor having a gate electrode, said gate electrode being formed by said floating gate, said control gate and said insulated-gate field-effect transistor being made from the same layer of semiconductor material lying on a first insulating layer, wherein said insulated-gate field-effect transistor and said control gate are coplanar, a second insulating layer lying over a channel region of said insulated-gate field-effect transistor and said control gate, said floating gate lying over said second insulating layer over both said control gate and said channel region of said insulated-gate field effect transistor, a first plurality of said EEPROM devices being arranged in a plurality of rows and columns to form a first memory array, the control gates of said EEPROM devices corresponding to one of said plurality of rows coupled in series to form a word line for selecting said row, wherein the drain of said insulated-gate field-effect transistor of one of said EEPROM devices from each of said plurality of rows are coupled in common to form a bit line, and a third insulating layer over said first plurality of said EEPROM devices, and a second plurality of said EEPROM devices on said third insulating layer arranged in a plurality of rows and columns to form a second memory array.

Claim 16

A memory including electrically erasable programmable read-only memory (EEPROM) devices, each of said EEPROM devices comprising: a floating gate; a control gate being capacitively coupled to said floating gate; and an insulated-gate field-effect transistor having a gate electrode, said gate electrode being formed by said floating gate, said control gate and said insulated-gate field-effect transistor being made from the same layer of semiconductor material lying on a first insulating layer, wherein said insulated-gate field-effect transistor and said control gate are coplanar, a second insulating layer lying over a channel region of said insulated-gate field-effect transistor and said control gate, said floating gate lying over said second insulating layer over both said control gate and said channel region of said insulated-gate field effect transistor, a first plurality of said EEPROM devices being arranged in a plurality of rows and columns to form a first memory array, the control gates of said EEPROM devices corresponding to one of said plurality of rows coupled in series to form a word line for selecting said row, wherein the drain of said insulated-gate field-effect transistor of one of said EEPROM devices from each of said plurality of rows are coupled in common to form a bit line, and a third insulating layer over said first plurality of said EEPROM devices, and a second plurality of said EEPROM devices on said third insulating layer arranged in a plurality of rows and columns to form a second memory array.

Claim 17

The memory of claim 14, wherein the source of said insulated-gate field-effect transistor of said plurality of EEPROM devices are coupled in common to a first voltage potential.

Claim 18

The memory of claim 14, wherein said bit line comprises a folded bit line with the drain of said insulated-gate field effect transistor of said EEPROM devices in a column in odd rows connected to a first conductor and in even rows connected to a second conductor, said first and second conductors extending substantially parallel to one another through said first memory array.

Claim 19

The memory of claim 14, further including at least one insulating layer over said second memory array, with a plurality of said EEPROM devices on each of said at least one insulating layer arranged in a plurality of rows and columns to form a third memory array.

Claim 20

The memory of claim 17, wherein said bit line connecting said drain of said insulated-gate field-effect transistor of said EEPROM device in the upper-most of said third memory array also connects said drain of said insulated-gate field-effect transistor of one of said EEPROM devices from each of said memory arrays below said third memory array, said EEPROM devices thus connected to said bit line being substantially vertically directly below one another.

Claim 21

The memory of claim 14, wherein said bit line connecting said drain of said insulated-gate field-effect transistor of said EEPROM device in said second memory array also connects said drain of said insulated-gate field-effect transistor of one of said EEPROM devices in said first memory array, said EEPROM devices thus connected being substantially vertically one above another.

Claim 22

The memory according to claim 14, wherein said floating gate extends over said control gate so as to provide a capacitive coupling having a predetermined value such that substantially a majority of programming voltage falls across said insulated-gate field-effect transistor.

Claim 23

The memory according to claim 14, wherein said layer of semiconductor material comprises an only layer of semiconductor material for forming said field effect transistor and said control gate.

Claim 24

A memory device for storing data comprising: a substrate; a layer of insulation over said substrate; first and second semiconductor regions spaced apart on said layer of insulation, said spaces between said first and second semiconductor regions being filled with a first dielectric material; a layer of second dielectric material formed over at least a portion of said first semiconductor region and over said second semiconductor region; and a layer of silicon formed on said layer of second dielectric and patterned to form a floating gate over said second semiconductor region and over a portion of said first semiconductor region, said floating gate having a planar surface, said first semiconductor region and said second semiconductor region being coplanar, wherein said planar surface of said floating gate is parallel to said coplanar regions of said first semiconductor region and said second semiconductor region such that said layer of second dielectric material has a same thickness in substantially all areas between said coplanar regions and said planar surface of said floating gate.

Claim 25

A memory device for storing data comprising: a substrate; a layer of insulation over said substrate; first and second semiconductor regions spaced apart on said layer of insulation, said spaces between said first and second semiconductor regions being filled with a first dielectric material; a layer of second dielectric material formed over at least a portion of said first semiconductor region and over said second semiconductor region; and a layer of silicon formed on said layer of second dielectric and patterned to form a floating gate over said second semiconductor region and over a portion of said first semiconductor region, said floating gate having a planar surface, said first semiconductor region and said second semiconductor region being coplanar, wherein said planar surface of said floating gate is parallel to said coplanar regions of said first semiconductor region and said second semiconductor region such that said layer of second dielectric material has a same thickness in substantially all areas between said coplanar regions and said planar surface of said floating gate.

Claim 26

The memory device according to claim 22, wherein said first semiconductor region includes a source, drain and channel region of a field-effect transistor (FET) formed therein, and said second semiconductor region includes a control gate formed therein, and wherein said first and second semiconductor regions are formed by a same layer of semiconductor material, the same layer of semiconductor layer comprises an only layer of semiconductor material for forming said FET and said control gate.