US5875146A
Expired / Lapsed
US
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Semiconductor integrated circuit device with burst length invariant internal circuit
Assignee: Mitsubishi Electric Corp
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Filing: 1997-07-11
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Granted: 1999-02-23
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Expires: 2017-07-11
Abstract
Abstract A burst mode semiconductor integrated circuit device comprises an internal voltage step-down circuit for stepping down an external power supply voltage to generate an internal power supply voltage based on a particular reference voltage, and a burst length detector for detecting a burst length from address data input from an external system and wherein the internal voltage step-down circuit increases the speed at which the output current rises in response to a drop in the internal power supply voltage as the burst length determined by the burst length detector increases.
Inventors
- 👤 Takashi Itou
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 20:33
CPC Classifications
G; G11; G11C; G11C5/00; G11C5/14; G11C5/147; G11C7/00; G11C7/10; G11C7/1015; G11C7/1018
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
112 words
A semiconductor integrated circuit device that operates in a burst mode comprising: an internal voltage step-down means for stepping down a power supply voltage supplied from an external system to generate and output an internal power supply voltage based on a particular reference voltage; and a burst length evaluation means for determining the burst length from an address data input from the external system, wherein said internal voltage step-down means increases the speed at which rate of increase of a current output from said internal voltage step-down means rises in response to a drop in the internal power supply voltage as the burst length determined by said burst length evaluation means increases.
Claim 2
Dependent Claim
112 words
A semiconductor integrated circuit device that operates in a burst mode comprising: an internal voltage step-down means for stepping down a power supply voltage supplied from an external system to generate and output an internal power supply voltage based on a particular reference voltage; and a burst length evaluation means for determining the burst length from an address data input from the external system, wherein said internal voltage step-down means increases the speed at which rate of increase of a current output from said internal voltage step-down means rises in response to a drop in the internal power supply voltage as the burst length determined by said burst length evaluation means increases.
Claim 3
Dependent Claim
100 words
The semiconductor integrated circuit device according to claim 1 wherein said internal voltage step-down means comprises a differential amplifier to which the output internal power supply voltage and a particular reference voltage are input, a gain control means for controlling a current flowing through said differential amplifier to control the gain of said differential amplifier, and an output circuit for changing the current supply capacity according to the output voltage of said differential amplifier, wherein said gain control means increases the current flow to said differential amplifier and increases the gain of said differential amplifier as the burst length increases.
Claim 4
Dependent Claim
53 words
The semiconductor integrated circuit device according to claim 2 wherein said gain control means comprises plural MOS transistors of varying gate sizes for supplying current to said differential amplifier, and increases the current flow to said differential amplifier as the burst length increases by operating a MOS transistor with a larger drain current.
Claim 5
Dependent Claim
47 words
The semiconductor integrated circuit device according to claim 2 wherein said gain control means comprises plural MOS transistors for supplying current to said differential amplifier, and increases the current flow to said differential amplifier as the burst length increases by increasing the number of operating MOS transistors.
Claim 6
Dependent Claim
73 words
The semiconductor integrated circuit device according to claim 2 wherein said gain control means comprises a MOS transistor for supplying current to said differential amplifier, and a gate voltage control circuit for controlling the gate voltage of said MOS transistor according to the burst length, and said gate voltage control circuit controls the gate voltage of said MOS transistor to increase the current supply to said differential amplifier as the burst length increases.
Claim 7
Dependent Claim
79 words
The semiconductor integrated circuit device according to claim 1 further comprising a substrate voltage generating means for generating and outputting a semiconductor substrate bias voltage, and applying the substrate voltage to a semiconductor substrate of the device, and wherein said substrate voltage generating means improves response to an increase in the substrate voltage, and increases the speed at which a rise in the substrate voltage is detected, as the burst length determined by said burst length evaluation means increases.
Claim 8
Dependent Claim
72 words
The semiconductor integrated circuit device according to claim 1 further comprising a step-up voltage generating means for generating and outputting a step-up voltage by boosting the externally supplied power voltage, and wherein said step-up voltage generating means improves response to a drop in the step-up voltage, and increases the speed at which a drop in the step-up voltage is detected, as the burst length determined by said burst length evaluation means increases.
Claim 9
Dependent Claim
88 words
A semiconductor integrated circuit device that operates in a burst mode comprising: an internal voltage step-down means for stepping down a power supply voltage supplied from an external system to generate and output an internal power supply voltage based on a particular reference voltage; and a burst length evaluation means for determining the burst length from address data input from the external system, and wherein said internal voltage step-down means increases the output current supply capacity as the burst length determined by the burst length evaluation means increases.
Claim 10
Dependent Claim
88 words
A semiconductor integrated circuit device that operates in a burst mode comprising: an internal voltage step-down means for stepping down a power supply voltage supplied from an external system to generate and output an internal power supply voltage based on a particular reference voltage; and a burst length evaluation means for determining the burst length from address data input from the external system, and wherein said internal voltage step-down means increases the output current supply capacity as the burst length determined by the burst length evaluation means increases.
Claim 11
Dependent Claim
64 words
The semiconductor integrated circuit device according to claim 8 wherein said internal voltage step-down means comprises a differential amplifier to which the output internal power supply voltage and a particular reference voltage are input, and an output circuit for changing the current supply capacity according to the burst length, wherein said output circuit increases the output current supply capacity as the burst length increases.
Claim 12
Dependent Claim
79 words
The semiconductor integrated circuit device according to claim 8 further comprising a substrate voltage generating means for generating and outputting a semiconductor substrate bias voltage, and applying the substrate voltage to a semiconductor substrate of the device, and wherein said substrate voltage generating means improves response to an increase in the substrate voltage, and increases the speed at which a rise in the substrate voltage is detected, as the burst length determined by said burst length evaluation means increases.
Claim 13
Dependent Claim
72 words
The semiconductor integrated circuit device according to claim 8 further comprising a step-up voltage generating means for generating and outputting a step-up voltage by boosting the externally supplied power voltage, and wherein said step-up voltage generating means improves response to a drop in the step-up voltage, and increases the speed at which a drop in the step-up voltage is detected, as the burst length determined by said burst length evaluation means increases.
References Cited (Backward Citations)
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