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US5846375A Expired / Lapsed US ⏱️ 0.0 years remaining

Area specific temperature control for electrode plates and chucks used in semiconductor processing equipment

Assignee: Micron Technology Inc
•
Filing: 1996-09-26
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Granted: 1998-12-08
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Expires: 2016-09-26
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Abstract

Abstract A temperature control system to selectively control the temperature of specific areas of the chuck or electrode plate upon which a wafer is mounted during plasma etching, chemical vapor deposition and other such temperature dependent processes for the purpose of ultimately controlling the temperature of the semiconductor wafer. The temperature control system includes a plurality of conduits arranged about the center of the chuck as a series of concentric radially adjacent loops. Each conduit is connected to its own inlet and outlet to allow a heating or cooling agent to flow independently through each conduit.

Inventors

  • 👤 Robin Gilchrist
  • 👤 Michael S. Wilhoit

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 03:16
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/04; H10P72/0431; H10P72/0434; H01; H01J; H01J37/00; H01J37/32; H01J37/32431; H01J37/32715; H01J37/32724; H01J2237/00; H01J2237/20; H01J2237/2001

Claims Analysis

Total Claims: 28
Claim 1
Independent Claim 71 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops.
Claim 2
Dependent Claim 71 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops.
Claim 3
Dependent Claim 11 words
A device according to claim 1, wherein the loops are circular.
Claim 4
Dependent Claim 11 words
A device according to claim 1, wherein the loops are elliptical.
Claim 5
Dependent Claim 106 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a plurality of inlets and outlets for allowing a heating or cooling agent to flow through the conduits, respective ones of the inlets and outlets being connected to respective ones of the conduits.
Claim 6
Dependent Claim 106 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a plurality of inlets and outlets for allowing a heating or cooling agent to flow through the conduits, respective ones of the inlets and outlets being connected to respective ones of the conduits.
Claim 7
Dependent Claim 102 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; e. an inlet port connected to the reaction chamber for introducing materials into the reaction chamber; and f. an exhaust port connected to the reaction chamber for exhausting materials from the chamber.
Claim 8
Dependent Claim 102 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; e. an inlet port connected to the reaction chamber for introducing materials into the reaction chamber; and f. an exhaust port connected to the reaction chamber for exhausting materials from the chamber.
Claim 9
Dependent Claim 96 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a source of a.c. voltage operatively coupled to one of the electrodes for applying an a.c. voltage between the first and second electrodes.
Claim 10
Dependent Claim 96 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a source of a.c. voltage operatively coupled to one of the electrodes for applying an a.c. voltage between the first and second electrodes.
Claim 11
Dependent Claim 103 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a plurality of supply mechanisms for supplying a cooling agent to each of the conduits, respective ones of the supply mechanisms being operatively coupled to respective ones of the conduits.
Claim 12
Dependent Claim 103 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a plurality of supply mechanisms for supplying a cooling agent to each of the conduits, respective ones of the supply mechanisms being operatively coupled to respective ones of the conduits.
Claim 13
Dependent Claim 103 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a plurality of supply mechanisms for supplying a heating agent to each of the conduits, respective ones of the supply mechanisms being operatively coupled to respective ones of the conduits.
Claim 14
Dependent Claim 103 words
A plasma type semiconductor processing device, comprising: a. a reaction chamber; b. a first electrode in the reaction chamber, the first electrode having a surface to which a semiconductor wafer is mounted during processing; c. a second electrode disposed opposite the first electrode; and d. a plurality of conduits embedded in the first electrode and arranged about the center of the first electrode as a series of concentric radially adjacent loops; and e. a plurality of supply mechanisms for supplying a heating agent to each of the conduits, respective ones of the supply mechanisms being operatively coupled to respective ones of the conduits.
Claim 15
Dependent Claim 44 words
A temperature control system for regulating the temperature of a chuck used to hold a wafer in semiconductor processing equipment, the temperature control system comprising a plurality of conduits arranged about the center of the chuck as a series of concentric radially adjacent loops.
Claim 16
Dependent Claim 44 words
A temperature control system for regulating the temperature of a chuck used to hold a wafer in semiconductor processing equipment, the temperature control system comprising a plurality of conduits arranged about the center of the chuck as a series of concentric radially adjacent loops.
Claim 17
Dependent Claim 13 words
A temperature control system according to claim 9, wherein the loops are circular.
Claim 18
Dependent Claim 13 words
A temperature control system according to claim 9, wherein the loops are elliptical.
Claim 19
Dependent Claim 49 words
A temperature control system for regulating the temperature of a chuck used to hold a wafer in semiconductor processing equipment, the temperature control system comprising a plurality of conduits embedded in the chuck and arranged about the center of the chuck as a series of concentric radially adjacent loops.
Claim 20
Dependent Claim 49 words
A temperature control system for regulating the temperature of a chuck used to hold a wafer in semiconductor processing equipment, the temperature control system comprising a plurality of conduits embedded in the chuck and arranged about the center of the chuck as a series of concentric radially adjacent loops.
Claim 21
Dependent Claim 80 words
A temperature control system for regulating the temperature of a chuck used to hold a wafer in semiconductor processing equipment, the temperature control system comprising: a. a plurality of conduits arranged about the center of the chuck as a series of concentric radially adjacent loops; and b. a plurality of inlets and outlets for allowing a heating or cooling agent to flow through the conduits, respective ones of the inlets and outlets being connected to respective ones of the conduits.
Claim 22
Dependent Claim 80 words
A temperature control system for regulating the temperature of a chuck used to hold a wafer in semiconductor processing equipment, the temperature control system comprising: a. a plurality of conduits arranged about the center of the chuck as a series of concentric radially adjacent loops; and b. a plurality of inlets and outlets for allowing a heating or cooling agent to flow through the conduits, respective ones of the inlets and outlets being connected to respective ones of the conduits.
Claim 23
Dependent Claim 57 words
A chuck for holding a semiconductor wafer in semiconductor processing equipment, the chuck comprising: a. a generally disc shaped body to which the wafer is mounted during processing; and b. a plurality of conduits embedded in the body of the chuck and arranged about the center of the chuck as a series of concentric radially adjacent loops.
Claim 24
Dependent Claim 57 words
A chuck for holding a semiconductor wafer in semiconductor processing equipment, the chuck comprising: a. a generally disc shaped body to which the wafer is mounted during processing; and b. a plurality of conduits embedded in the body of the chuck and arranged about the center of the chuck as a series of concentric radially adjacent loops.
Claim 25
Dependent Claim 11 words
A chuck according to claim 14, wherein the loops are circular.
Claim 26
Dependent Claim 11 words
A chuck according to claim 14, wherein the loops are elliptical.
Claim 27
Dependent Claim 91 words
A chuck for holding a semiconductor wafer in semiconductor processing equipment, the chuck comprising: a. a generally disc shaped body to which the wafer is mounted during processing; b. a plurality of conduits embedded in the body of the chuck and arranged about the center of the chuck as a series of concentric radially adjacent loops; and c. a plurality of inlets and outlets for allowing a heating or cooling agent to flow through the conduits, respective ones of the inlets and outlets being connected to respective ones of the conduits.
Claim 28
Dependent Claim 91 words
A chuck for holding a semiconductor wafer in semiconductor processing equipment, the chuck comprising: a. a generally disc shaped body to which the wafer is mounted during processing; b. a plurality of conduits embedded in the body of the chuck and arranged about the center of the chuck as a series of concentric radially adjacent loops; and c. a plurality of inlets and outlets for allowing a heating or cooling agent to flow through the conduits, respective ones of the inlets and outlets being connected to respective ones of the conduits.

References Cited (Backward Citations)

US4399016A Cited
US4565601A Cited
US5192849A Cited
US5294778A Cited
US5213349A Cited
US5567267A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-12-07 2002-06-08 2002-12-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-12-07 2006-06-08 2006-12-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-12-07 2010-06-08 2010-12-08 $7700.00 Window Closed / Lapsed

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