System and method for efficiently generating testing program code for use in automatic test equipment

Claim 1

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the library of ATE platform parameters further comprises: a set of characterization information storing characteristics specific to each of the plurality of ATE platforms; and a set of templates storing electronic device-independent program modules, the means for generating the testing program code further comprising means for forming the testing program code using the program modules for at least one such template with characteristics for the characterization information corresponding to the ATE platform interconnectable to the testing workstation.

Claim 2

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the library of ATE platform parameters further comprises: a set of characterization information storing characteristics specific to each of the plurality of ATE platforms; and a set of templates storing electronic device-independent program modules, the means for generating the testing program code further comprising means for forming the testing program code using the program modules for at least one such template with characteristics for the characterization information corresponding to the ATE platform interconnectable to the testing workstation.

Claim 3

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the library further stores ATE platform parameters for a plurality of ATE platforms.

Claim 4

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the library further stores ATE platform parameters for a plurality of ATE platforms.

Claim 5

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and means for cyclizing simulation results from the testing workstation into the waveform data.

Claim 6

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and means for cyclizing simulation results from the testing workstation into the waveform data.

Claim 7

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the intermediate representation comprises a unified data description including pin information, pattern information and format and timing information.

Claim 8

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the intermediate representation comprises a unified data description including pin information, pattern information and format and timing information.

Claim 9

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and means for loading the testing program code from the testing workstation into the ATE platform.

Claim 10

A system for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the electronic device under test being removably coupled to the ATE platform, the ATE platform further comprising means for testing the electronic device responsive to the testing program code, the system comprising: a testing workstation comprising a processor, memory and input/output facilities, the testing workstation being interconnectable to the ATE platform, the input/output facilities of the testing workstation including means for controlling testing of the electronic device on the ATE platform and means for displaying results from the testing of the electronic device; a library of ATE platform parameters associated with the testing workstation and storing ATE platform parameters for the ATE platform interconnectable to the testing workstation; means for transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; means for completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and means for loading the testing program code from the testing workstation into the ATE platform.

Claim 11

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; controlling testing of the electronic device on the ATE platform; and displaying results from the testing of the electronic device using the input/output facilities of the testing workstation.

Claim 12

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; controlling testing of the electronic device on the ATE platform; and displaying results from the testing of the electronic device using the input/output facilities of the testing workstation.

Claim 13

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; loading the testing program code into the ATE platform from the testing workstation; and testing the electronic device responsive to the loaded testing program code on the ATE platform.

Claim 14

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; loading the testing program code into the ATE platform from the testing workstation; and testing the electronic device responsive to the loaded testing program code on the ATE platform.

Claim 15

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the step of maintaining a library further comprises the steps of: storing characteristics specific to each of the plurality of ATE platforms into a set of characterization information in the library; and storing electronic device-independent program modules into a set of templates in the library, the step of generating the testing program code further comprising forming the testing program code using the program modules for at least one such template with characteristics for the characterization information corresponding to the ATE platform interconnectable to the testing workstation.

Claim 16

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; wherein the step of maintaining a library further comprises the steps of: storing characteristics specific to each of the plurality of ATE platforms into a set of characterization information in the library; and storing electronic device-independent program modules into a set of templates in the library, the step of generating the testing program code further comprising forming the testing program code using the program modules for at least one such template with characteristics for the characterization information corresponding to the ATE platform interconnectable to the testing workstation.

Claim 17

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; transforming waveform data into an intermediate representation, the waveform data comprising events and signals for application during testing to the electronic device under test; and completing a template with the intermediate representation, the completed template forming the testing program code.

Claim 18

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; transforming waveform data into an intermediate representation, the waveform data comprising events and signals for application during testing to the electronic device under test; and completing a template with the intermediate representation, the completed template forming the testing program code.

Claim 19

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test: completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and cyclizing simulation results from the testing workstation into the waveform data.

Claim 20

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test: completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and cyclizing simulation results from the testing workstation into the waveform data.

Claim 21

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and cyclizing simulation results received from a further testing workstation interconnectable to the testing workstation into a cyclized waveform description.

Claim 22

A method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform, the ATE platform being interconnectable to a testing workstation comprising a processor, memory and input/output facilities, the electronic device under test being removably coupled to the ATE platform, comprising the steps of: maintaining a library of ATE platform parameters associated with the testing workstation and storing the ATE platform parameters for a plurality of ATE platforms in the library; transforming waveform data into an intermediate representation using the ATE platform parameters in the library, the waveform data comprising events and signals for application during testing to the electronic device under test; and completing a template with the intermediate representation, the completed template forming the testing program code specific to the ATE platform interconnectable to the testing workstation; and cyclizing simulation results received from a further testing workstation interconnectable to the testing workstation into a cyclized waveform description.

Claim 23

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; and combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment, wherein the waveform description is a cyclized waveform description, the method further comprising the step of processing simulation results using a cyclization process module to form the cyclized waveform description; the step of forming a unified data description further comprising the step of transforming the cyclization waveform description into the unified data description.

Claim 24

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; and combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment, wherein the waveform description is a cyclized waveform description, the method further comprising the step of processing simulation results using a cyclization process module to form the cyclized waveform description; the step of forming a unified data description further comprising the step of transforming the cyclization waveform description into the unified data description.

Claim 29

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; and maintaining a set of characterization information for use in the step of forming a unified data description.

Claim 30

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; and maintaining a set of characterization information for use in the step of forming a unified data description.

Claim 31

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; and maintaining a set of templates for use in the step of combining the unified data description.

Claim 32

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; and maintaining a set of templates for use in the step of combining the unified data description.

Claim 33

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; and combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; wherein the waveform description includes a complex shape representing a data pattern associated with a waveform template defined for a number of signals, the step of forming a unified data description further comprising the step of translating the complex shape of the waveform description into the waveform description.

Claim 34

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; and combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; wherein the waveform description includes a complex shape representing a data pattern associated with a waveform template defined for a number of signals, the step of forming a unified data description further comprising the step of translating the complex shape of the waveform description into the waveform description.

Claim 35

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; and combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; wherein the waveform description further comprises a high level description of the complex shape of the waveform description including an indicia of direct waveform characteristics, the step of forming a unified data description further comprising the step of interpreting the high level description of the complex shape into the waveform description.

Claim 36

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; and combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; wherein the waveform description further comprises a high level description of the complex shape of the waveform description including an indicia of direct waveform characteristics, the step of forming a unified data description further comprising the step of interpreting the high level description of the complex shape into the waveform description.

Claim 37

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; maintaining a library of data for a plurality of the automatic test equipment data; the step of forming a unified data description further comprising the step of accessing the data library for characteristics for one such automatic test equipment; and the step of combining the unified data description further comprising accessing the data library for a template describing a layout of the testing program code.

Claim 38

A method for efficiently generating testing program code for use in automatic test equipment, the testing program code specifying testing for a device under test connected to the automatic test equipment, comprising the steps of: forming a unified data description using a waveform analyzer module responsive to a waveform description which stores processed simulation results for the device under test; combining the unified data description with a template using a template completion module to form the testing program code for use in the automatic test equipment; maintaining a library of data for a plurality of the automatic test equipment data; the step of forming a unified data description further comprising the step of accessing the data library for characteristics for one such automatic test equipment; and the step of combining the unified data description further comprising accessing the data library for a template describing a layout of the testing program code.