US5834353A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making deep sub-micron meter MOSFET with a high permitivity gate dielectric
Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1997-10-20
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Granted: 1998-11-10
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Expires: 2017-10-20
Abstract
Abstract The method of the present invention includes forming a silicon oxynitride layer on a substrate. Then, a dielectric layer with high permitivity is deposited by chemical vapor deposition on the silicon oxynitride layer. Subsequently, a rapid thermal process (RTP) anneal is performed in N 2 O or NO ambient to reduce the dielectric leakage. A multiple conductive layer consisting of TiN/Ti/TiN is then formed on the dielectric layer. Then, the multiple conductive layer, the dielectric layer, and the silicon oxynitride layer are patterned to form gate structure. A plasma immersion is performed to form ultra shallow extended source and drain junctions. Side wall spacers are formed on the side walls of the gate structure. Next, an ion implantation is carried out to dope ions into the substrate. Next, a rapid thermal process (RTP) anneal is performed to form shallow junctions of the source and the drain.
Inventors
- 👤 Shye-Lin Wu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:35
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01318; H10D64/01332; H10D64/01336; H10D64/0134; H10D64/01342; H10D64/01344; H10D64/60; H10D64/66; H10D64/667; H10D64/68; H10D64/681; H10D64/685; H10D64/691; H10D64/693; H10P; H10P32/00; H10P32/10; H10P32/12; H10P32/1204
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
172 words
A method for manufacturing a transistor on a semiconductor substrate, said method comprising the steps of: forming a silicon oxynitride layer on said semiconductor substrate; forming a dielectric layer having relatively high permitivity to an oxide layer on said silicon oxynitride layer; performing a first rapid thermal process (RTP) to reduce dielectric leakage of said dielectric layer; forming a barrier layer on said dielectric layer; forming a metal layer in said barrier layer; forming a anti-refractive layer on said metal layer; patterning said anti-refractive layer, said metal layer, said barrier layer, said dielectric layer and said silicon oxynitride layer to form a gate structure; performing a plasma immersion using said gate structure as a mask to form extended source and drain junctions; forming side wall spacers on side walls of said gate structure; performing an ion implantation using said side wall spacers and said gate structure as a mask to form a source and a drain; and performing a second rapid thermal process (RTP) to form junctions of said source and drain.
Claim 2
Independent Claim
172 words
A method for manufacturing a transistor on a semiconductor substrate, said method comprising the steps of: forming a silicon oxynitride layer on said semiconductor substrate; forming a dielectric layer having relatively high permitivity to an oxide layer on said silicon oxynitride layer; performing a first rapid thermal process (RTP) to reduce dielectric leakage of said dielectric layer; forming a barrier layer on said dielectric layer; forming a metal layer in said barrier layer; forming a anti-refractive layer on said metal layer; patterning said anti-refractive layer, said metal layer, said barrier layer, said dielectric layer and said silicon oxynitride layer to form a gate structure; performing a plasma immersion using said gate structure as a mask to form extended source and drain junctions; forming side wall spacers on side walls of said gate structure; performing an ion implantation using said side wall spacers and said gate structure as a mask to form a source and a drain; and performing a second rapid thermal process (RTP) to form junctions of said source and drain.
Claim 3
Dependent Claim
19 words
The method of claim 1, wherein said first rapid thermal process (RTP) is performed in N 2 O ambient.
Claim 4
Dependent Claim
23 words
The method of claim 2, wherein said first rapid thermal process (RTP) is performed at a temperature at about 800 to 1150 centigrade.
Claim 5
Dependent Claim
17 words
The method of claim 1, wherein said first rapid thermal process (RTP) is performed in NO ambient.
Claim 6
Dependent Claim
23 words
The method of claim 4, wherein said first rapid thermal process (RTP) is performed at a temperature at about 800 to 1150 centigrade.
Claim 7
Dependent Claim
23 words
The method of claim 1, wherein said second rapid thermal process (RTP) is performed at a temperature at about 800 to 1150 centigrade.
Claim 8
Dependent Claim
13 words
The method of claim 1, wherein said dielectric layer comprises TiO 2 .
Claim 9
Dependent Claim
15 words
The method of claim 1, wherein said dielectric layer comprises Ta 2 O 5 .
Claim 10
Dependent Claim
11 words
The method of claim 1, wherein said dielectric layer comprises PZT.
Claim 11
Dependent Claim
11 words
The method of claim 1, wherein said dielectric layer comprises BST.
Claim 12
Dependent Claim
19 words
The method of claim 1, wherein said silicon oxynitride layer is formed by oxidation in N 2 O ambient.
Claim 13
Dependent Claim
17 words
The method of claim 1, wherein said silicon oxynitride layer is formed by oxidation in NO ambient.
Claim 14
Dependent Claim
11 words
The method of claim 1, wherein said barrier layer comprises TiN.
Claim 15
Dependent Claim
11 words
The method of claim 1, wherein said metal layer comprises titanium.
Claim 16
Dependent Claim
11 words
The method of claim 1, wherein said metal layer comprises tungsten.
Claim 17
Dependent Claim
11 words
The method of claim 1, wherein said anti-refractive layer comprises TiN.
References Cited (Backward Citations)
US5464783A
Cited
US5712208A
Cited
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