US5828459A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus and method for scanning laser microscopy
Assignee: Yeda Research and Development Co Ltd
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Filing: 1997-04-28
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Granted: 1998-10-27
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Expires: 2017-04-28
Abstract
Abstract A method for determining the fine structure of materials by means of a nonlinear scanning laser microscope, including the steps of forming an image of a specimen by scanning selected points thereof with a focusable laser beam of a predetermined fundamental frequency w, thereby exciting the points to generate signals constituting the third harmonic 3w of said fundamental frequency w, collecting the signals by collecting means, substantially filtering out from the collected 3w signals, signals of a frequency other than the third harmonic 3w, feeding the filtered 3w signals to a detector, and storing the output of the detector for processing and display. A nonlinear scanning laser microscope adapted to form an image of a specimen by scanning it point by point with a focusable laser beam of a predetermined fundamental frequency, is also provided.
Inventors
- 👤 Yaron Silberberg
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 16:09
CPC Classifications
G; G01; G01B; G01B9/00; G01B9/04; G02; G02B; G02B21/00; G02B21/0004; G02B21/002
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
103 words
A method for determining the fine structure of materials by means of a nonlinear scanning laser microscope, comprising the steps of: forming an image of a specimen by scanning selected points thereof with a focusable laser beam of a predetermined fundamental frequency w, thereby exciting said points to generate signals constituting the third harmonic 3w of said fundamental frequency w; collecting said signals by collecting means; substantially filtering out from said collected 3w signals, signals of a frequency other than said third harmonic 3w; feeding said filtered 3w signals to a detector, and storing the output of said detector for processing and display.
Claim 2
Independent Claim
103 words
A method for determining the fine structure of materials by means of a nonlinear scanning laser microscope, comprising the steps of: forming an image of a specimen by scanning selected points thereof with a focusable laser beam of a predetermined fundamental frequency w, thereby exciting said points to generate signals constituting the third harmonic 3w of said fundamental frequency w; collecting said signals by collecting means; substantially filtering out from said collected 3w signals, signals of a frequency other than said third harmonic 3w; feeding said filtered 3w signals to a detector, and storing the output of said detector for processing and display.
Claim 3
Dependent Claim
24 words
The method as claimed in claim 1, wherein said scanning is effected by introducing a relative movement between said focusable beam and said specimen.
Claim 4
Dependent Claim
26 words
The method as claimed in claim 1, wherein said scanning is effected along a line and/or across a plane and/or throughout a volume of said specimen.
Claim 5
Dependent Claim
70 words
A nonlinear scanning laser microscope adapted to form an image of a specimen by scanning it point by point with a focusable laser beam of a predetermined fundamental frequency, thereby exciting said points to generate signals constituting a harmonic of said fundamental frequency, which signals are stored in storage means for purpose of processing and display, characterised in that said harmonic of said fundamental frequency is the third harmonic thereof.
Claim 6
Dependent Claim
70 words
A nonlinear scanning laser microscope adapted to form an image of a specimen by scanning it point by point with a focusable laser beam of a predetermined fundamental frequency, thereby exciting said points to generate signals constituting a harmonic of said fundamental frequency, which signals are stored in storage means for purpose of processing and display, characterised in that said harmonic of said fundamental frequency is the third harmonic thereof.
Claim 7
Dependent Claim
16 words
The microscope as claimed in claim 4, wherein said beam is produced by a short-pulse laser.
Claim 8
Dependent Claim
30 words
The microscope as claimed in claim 5, wherein said short-pulse laser operates in the near infrared spectrum region, thereby placing said third harmonic in the visible or ultraviolet wavelength region.
Claim 9
Dependent Claim
22 words
The microscope as claimed in claim 4, further comprising means to introduce a relative movement between said focusable beam and said specimen.
Claim 10
Dependent Claim
25 words
The microscope as claimed in claim 5, wherein said short-pulse laser beam is produced by a CW mode-locked laser with pulses in the subpicosecond range.
References Cited (Backward Citations)
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-10-26 | 2002-04-27 | 2002-10-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-10-26 | 2006-04-27 | 2006-10-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-10-26 | 2010-04-27 | 2010-10-27 | $7700.00 | Window Closed / Lapsed |