Correction method and correction apparatus of mask pattern

Claim 3

The method for correcting as set forth in claim 1, wherein the simulation step to the deformation step are repeated at least one time using the design pattern deformed by the deformation step.

Claim 4

The method for correcting a mask pattern as set forth in claim 1 or 2, wherein in the simulation step, transfer images are simulated under a number of types of transfer conditions based on a combination of a plurality of amounts of exposure within a range of a preliminary set margin of exposure and a plurality of focal positions within the range of the preliminary set depth of focus to obtain a plurality of transfer images; and in the comparison step, the difference of each of the plurality or transfer images from the design pattern is compared for every evaluation point to calculate a plurality of types of differences for every evaluation point; and in the deformation step, the design pattern is deformed so that the plurality of types of differences for every evaluation point become small according to a predetermined reference.

Claim 5

The method for correcting a mask pattern as set forth in claim 3, wherein the predetermined reference in the deformation step is a reference such that a mean value of the plurality of types of differences for every evaluation point becomes the minimum.

Claim 6

The method for correcting a mask pattern as set forth in claim 3, wherein the predetermined reference is a reference such an absolute value of the maximum difference among the plurality of types of differences for every evaluation point becomes the minimum.

Claim 7

The method for correcting a mask pattern as set forth in claim 3, wherein the predetermined reference is a reference such that a square average of the plurality of types of differences for every evaluation point becomes the minimum.

Claim 8

The method for correcting a mask pattern as set forth in claim 1 or 3, wherein, in the simulation step, two-dimensional light intensities on a substrate are calculated based on the design pattern and exposure conditions; effects of the light intensities at a plurality of peripheral positions on exposure energy at an arbitrary position are calculated and cumulatively added based on the light intensities at the peripheral positions of that arbitrary position on the two-dimensional plane of the substrate and the distance between that particular position and the peripheral positions, whereby a latent image formation intensity at that arbitrary position is calculated on the two-dimensional plane of the substrate; and further comprising the steps of: finding a distribution of the latent image formation intensities on the two-dimensional plane of the substrate; determining a threshold value of the latent image formation intensity corresponding to the amount of exposure and development conditions; finding contour lines at the threshold value for the distribution of the latent image formation intensities; and calculating the pattern defined by the contour lines as a transfer image.

Claim 9

The method for correcting a mask pattern as set forth in claim 1 or 3, wherein, in the deformation step, the boundary line of the mask pattern adjacent the evaluation point is moved in a reverse direction of the difference compared for every evaluation point by exactly an amount obtained by multiplying the magnitude of difference by a constant coefficient.

Claim 10

The method for correcting a mask pattern as set forth in claim 8, wherein the coefficient is larger than 0 and less than 1.

Claim 11

The method for correcting a mask pattern as set forth in claim 1 or 3, wherein, in the evaluation point arrangement step, a plurality of evaluation points are arranged along an outer periphery of the pattern of the desired design pattern and, at the same time, target points are set at predetermined evaluation points separate from the evaluation points; in the comparison step, the difference between the simulated transfer image and the design pattern is compared for every evaluation point at positions at which only the evaluation points are set and a difference of the target points and the transfer image is compared at the positions where the target points are set; and in the deformation step, the design pattern is deformed so that the difference becomes smaller depending upon the difference compared for every evaluation point or every target point.

Claim 12

The method for correcting a mask pattern as set forth in claim 10, wherein the target points are set corresponding to the evaluation points positioned at convex corners or concave corners of the design pattern, the target points are determined inside the corner at the convex corners, and the target points are determined outside the corner at the concave corners.