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US5789303A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of adding on chip capacitors to an integrated circuit

Assignee: RPX Clearinghouse LLC
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Filing: 1996-07-11
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Granted: 1998-08-04
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Expires: 2016-07-11
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Abstract

Abstract A capacitor structure and method of forming a capacitor structure for an integrated circuit is provided. The capacitor structure, comprising a bottom electrode, capacitor dielectric and top electrode, is formed on a passivation layer overlying the interconnect metallization. The capacitor electrodes are interconnected to the underlying integrated circuit from underneath, through conductive vias, to the underlying interconnect metallization. The method provides for adding capacitors to an otherwise completed and passivated integrated circuit. The structure is particularly applicable for ferroelectric capacitors. The passivation layer acts as a barrier layer for a ferroelectric dielectric. Large area on-chip capacitors may added without affecting the interconnect routing or packing density of the underlying devices, and may be added almost independently of the process technology used formation of the underlying integrated circuit.

Inventors

  • 👤 Pak K. Leung
  • 👤 Ismail T. Emesh

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 02:54
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682; H10D1/692; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/0698; Y; Y10; Y10S; Y10S148/00; Y10S148/014

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 188 words
A method of providing a capacitor for an integrated circuit, the integrated circuit having interconnect metallization and an overlying passivation layer comprising a substantially planar surface; the method comprising: opening vias through the passivation layer for contacting the underlying interconnect metallization; filling selected vias with conductive material and selectively depositing a layer of conductive material on the surface of the passivation layer and overlying at least one via of said selected vias to define a bottom electrode of a capacitor and to form an interconnection to the underlying interconnect metallization through the at least one via; providing a capacitor dielectric on the bottom electrode, and providing on the capacitor dielectric a second conductive layer defining a top capacitor electrode, the top capacitor electrode extending laterally of the bottom electrode and overlying at least one other via of said selected vias to form an interconnection to the underlying interconnect metallization through the at least one other via, thereby routing interconnections from each of the electrodes of the capacitor to the interconnect metallization of the underlying integrated circuit through the passivation layer underneath the conductive layers forming the capacitor electrodes.
Claim 2
Independent Claim 188 words
A method of providing a capacitor for an integrated circuit, the integrated circuit having interconnect metallization and an overlying passivation layer comprising a substantially planar surface; the method comprising: opening vias through the passivation layer for contacting the underlying interconnect metallization; filling selected vias with conductive material and selectively depositing a layer of conductive material on the surface of the passivation layer and overlying at least one via of said selected vias to define a bottom electrode of a capacitor and to form an interconnection to the underlying interconnect metallization through the at least one via; providing a capacitor dielectric on the bottom electrode, and providing on the capacitor dielectric a second conductive layer defining a top capacitor electrode, the top capacitor electrode extending laterally of the bottom electrode and overlying at least one other via of said selected vias to form an interconnection to the underlying interconnect metallization through the at least one other via, thereby routing interconnections from each of the electrodes of the capacitor to the interconnect metallization of the underlying integrated circuit through the passivation layer underneath the conductive layers forming the capacitor electrodes.
Claim 3
Dependent Claim 39 words
A method according to claim 1 wherein selectively depositing a layer of conductive material on the surface of the passivation layer comprises depositing overall a layer of conductive material and then patterning said layer to define a bottom electrode.
Claim 4
Dependent Claim 34 words
A method according to claim 1 wherein the step of depositing a first layer of conductive material on the surface of the passivation layer comprises filling one of said selected vias with conductive material.
Claim 5
Dependent Claim 19 words
A method according to claim 1 wherein providing the capacitor dielectric comprises depositing a layer of a ferroelectric dielectric.
Claim 6
Dependent Claim 23 words
A method according to claim 1 comprising depositing a layer of ferroelectric dielectric selected from lead zirconate titanate and doped lead zirconate titanate.
Claim 7
Dependent Claim 31 words
A method according to claim 1 wherein the underlying interconnect metallization comprises an aluminum alloy, and the steps of providing the capacitor structure comprise processing at a temperature below 500° C.
Claim 8
Dependent Claim 28 words
A method according to claim 1 wherein the step of providing a second layer of conductive material comprises filling the at least one other via with conductive material.
Claim 9
Dependent Claim 30 words
A method according to claim 1 wherein providing the layer of conductive material forming the bottom electrode comprises forming a multilayer stack comprising a barrier layer and an adhesion layer.
Claim 10
Dependent Claim 18 words
A method according to claim 1 wherein providing the capacitor dielectric comprises selective deposition through a stencil mask.
Claim 11
Dependent Claim 23 words
A method according to claim 1 wherein providing the top electrode comprises selective deposition of the second conductive layer through a stencil mask.
Claim 12
Dependent Claim 23 words
A method according to claim 1 wherein depositing the capacitor dielectric and the top electrode comprises deposition overall and patterning by wet etching.
Claim 13
Dependent Claim 16 words
A method according to claim 1 comprising a further step of providing thereon a protecting layer.
Claim 14
Dependent Claim 15 words
A method according to claim 12 wherein the protecting layer is a layer of dielectric.
Claim 15
Independent Claim 177 words
A method of adding an on-chip capacitor to an integrated circuit chip comprising a substrate having active devices formed thereon, interconnect metallization and an overlying passivation layer having a planar surface, the method comprising forming capacitors on top of the passivation layer comprising: defining vias through the passivation layer for contacting the interconnect metallization; filling the vias with conductive material and forming a capacitor on the surface of the passivation layer by providing a bottom electrode overlying at least one via of the vias filled with conductive material to form an interconnection from the bottom electrode to the underlying interconnect metallization, providing on the bottom electrode a capacitor dielectric, and providing a top electrode extending over the capacitor dielectric and over at least another via of the vias filled with conductive material to form an interconnection from the top electrode to the underlying interconnect metallization, thereby routing interconnections from each of the electrodes of the capacitor to the interconnect metallization of the underlying integrated circuit through the passivation layer underneath the conductive layers forming the capacitor electrodes.
Claim 16
Independent Claim 177 words
A method of adding an on-chip capacitor to an integrated circuit chip comprising a substrate having active devices formed thereon, interconnect metallization and an overlying passivation layer having a planar surface, the method comprising forming capacitors on top of the passivation layer comprising: defining vias through the passivation layer for contacting the interconnect metallization; filling the vias with conductive material and forming a capacitor on the surface of the passivation layer by providing a bottom electrode overlying at least one via of the vias filled with conductive material to form an interconnection from the bottom electrode to the underlying interconnect metallization, providing on the bottom electrode a capacitor dielectric, and providing a top electrode extending over the capacitor dielectric and over at least another via of the vias filled with conductive material to form an interconnection from the top electrode to the underlying interconnect metallization, thereby routing interconnections from each of the electrodes of the capacitor to the interconnect metallization of the underlying integrated circuit through the passivation layer underneath the conductive layers forming the capacitor electrodes.
Claim 17
Independent Claim 187 words
A method of adding capacitors to an integrated circuit chip comprising a substrate having active devices formed thereon, interconnect metallization and an overlying passivation layer having a planar surface with bond pad openings to the underlying metallization; the method comprising: forming capacitors on top of the passivation layer by steps comprising: defining contact openings to the interconnect metallization by opening a plurality of vias through the passivation layer; forming a capacitor on the surface of the passivation layer overlying the plurality of vias by providing a layer of conductive material to form a first electrode contacting the underlying interconnect metallization through one of the plurality of vias, providing a layer of a capacitor dielectric on the first electrode, and providing a second layer of conductive material defining a second electrode extending over the capacitor dielectric and extending laterally of the first electrode, contacting the underlying interconnect metallization through a second via of the plurality of vias thereby routing interconnections from each of the electrodes of the capacitor to the interconnect metallization of the underlying integrated circuit through the passivation layer underneath the conductive layers forming the capacitor.
Claim 18
Independent Claim 187 words
A method of adding capacitors to an integrated circuit chip comprising a substrate having active devices formed thereon, interconnect metallization and an overlying passivation layer having a planar surface with bond pad openings to the underlying metallization; the method comprising: forming capacitors on top of the passivation layer by steps comprising: defining contact openings to the interconnect metallization by opening a plurality of vias through the passivation layer; forming a capacitor on the surface of the passivation layer overlying the plurality of vias by providing a layer of conductive material to form a first electrode contacting the underlying interconnect metallization through one of the plurality of vias, providing a layer of a capacitor dielectric on the first electrode, and providing a second layer of conductive material defining a second electrode extending over the capacitor dielectric and extending laterally of the first electrode, contacting the underlying interconnect metallization through a second via of the plurality of vias thereby routing interconnections from each of the electrodes of the capacitor to the interconnect metallization of the underlying integrated circuit through the passivation layer underneath the conductive layers forming the capacitor.
Claim 19
Dependent Claim 38 words
A method according to claim 15 wherein a plurality of capacitors are provided on the passivation layer of the integrated circuit, and the method comprises coupling selected ones of the plurality of capacitors through the underlying interconnect metallization.
Claim 20
Dependent Claim 19 words
A method according to claim 15 wherein providing the capacitor dielectric comprises depositing a layer of a ferroelectric dielectric.
Claim 21
Dependent Claim 30 words
A method according to claim 17 comprising depositing a layer of ferroelectric dielectric selected, from lead zirconate titanate, doped lead zirconate titanate, barium strontium titanate and doped barium strontium titanate.
Claim 22
Dependent Claim 31 words
A method according to claim 15 wherein the underlying interconnect metallization comprises an aluminum alloy, and the steps of providing the capacitor structure comprise processing at a temperature below 500° C.

References Cited (Backward Citations)

US5536672A Cited
US5352622A Cited
US5366920A Cited
US5407855A Cited
US5489548A Cited
US5504041A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-08-03 2002-02-02 2002-08-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-08-03 2006-02-02 2006-08-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-08-03 2010-02-02 2010-08-04 $7700.00 Window Closed / Lapsed

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