US5780350A
Expired / Lapsed
US
⏱️ 0.0 years remaining
MOSFET device with improved LDD region and method of making same
Assignee: Bell Semiconductor LLC
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Filing: 1997-01-30
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Granted: 1998-07-14
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Expires: 2017-01-30
Abstract
Abstract LDD regions of a MOSFET device in an integrated circuit structure are formed in a semiconductor substrate, after formation of the source/drain regions of the MOSFET device by forming spacers on the sidewalls of the gate electrode prior to doping of the substrate to form source/drain regions by implantation and annealing/activating. The sidewall spacers are then removed, and the portion of the substrate exposed by removal of the spacers is then lightly doped to form the desired LDD regions in the substrate between the respective source/drain regions and a channel region of the substrate below the gate oxide. In this manner, the dopant used to form the LDD regions is not exposed to the heat used to anneal and activate the implanted source/drain regions. In a preferred embodiment, where the semiconductor substrate is a silicon substrate and the gate electrode is a polysilicon gate electrode, metal silicide contacts are also formed, respectively over the source/drain regions and the polysilicon gate electrode, prior to removal of the spacers and prior to the formation of the LDD regions, so that the dopant used to form the LDD regions is also not exposed to the heat used to form the metal silicide contacts.
Inventors
- 👤 Ashok K. Kapoor
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 08:59
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D30/60; H10D30/601
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
214 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming decomposable spacers on the sidewalls of said gate electrode; c) implanting exposed portions of said semiconductor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said decomposable spacers from said sidewalls of said gate electrode after formation of said source/drain regions by heating said decomposable spacers to a temperature at which said spacers decompose, and maintaining that temperature until said spacers are removed; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 2
Dependent Claim
214 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming decomposable spacers on the sidewalls of said gate electrode; c) implanting exposed portions of said semiconductor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said decomposable spacers from said sidewalls of said gate electrode after formation of said source/drain regions by heating said decomposable spacers to a temperature at which said spacers decompose, and maintaining that temperature until said spacers are removed; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 3
Dependent Claim
212 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming spacers on the sidewalls of said gate electrode, said spacers formed from a material selected from the group consisting of amorphous germanium dioxide, germanium dinitride, germanium monoxide, and germanium tetranitride; c) implanting exposed portions of said semiconductor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said spacers from said sidewalls of said gate electrode after formation of said source/drain regions; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 4
Dependent Claim
212 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming spacers on the sidewalls of said gate electrode, said spacers formed from a material selected from the group consisting of amorphous germanium dioxide, germanium dinitride, germanium monoxide, and germanium tetranitride; c) implanting exposed portions of said semiconductor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said spacers from said sidewalls of said gate electrode after formation of said source/drain regions; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 5
Dependent Claim
215 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a ) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming sublimable spacers on the sidewalls of said gate electrode; c) implanting exposed portions of said semicondutor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said sublimable spacers from said sidewalls of said gate electrode after formation of said source/drain regions by heating said substrate to a temperature at which said spacers sublime , and maintaining this temperature until said spacers are removed; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 6
Dependent Claim
215 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a ) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming sublimable spacers on the sidewalls of said gate electrode; c) implanting exposed portions of said semicondutor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said sublimable spacers from said sidewalls of said gate electrode after formation of said source/drain regions by heating said substrate to a temperature at which said spacers sublime , and maintaining this temperature until said spacers are removed; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 7
Dependent Claim
13 words
The process of claim 3 wherein said sublimable spacers comprise germanium monoxide (GeO).
Claim 8
Dependent Claim
17 words
The process of claim 1 wherein said decomposable spacers comprise germanium tetranitride (Ge 3 N 4 ).
Claim 9
Dependent Claim
205 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a ) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming water-soluble spacers on the sidewalls of said gate electrode; c) implanting exposed portions of said semiconductor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said water-soluble spacers from said sidewalls of said gate electrode after formation of said source/drain regions by contacting said water-soluble spacers with water until said spacers are removed; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 10
Dependent Claim
205 words
A process for forming in a semiconductor substrate a MOSFET device with lightly doped drain (LDD) regions which comprises: a ) forming a gate oxide over a portion of an exposed region of said semiconductor substrate at least partially surrounded by insulation, and a gate electrode over said gate oxide; b) forming water-soluble spacers on the sidewalls of said gate electrode; c) implanting exposed portions of said semiconductor substrate with either P+ or N+ dopant to implant source/drain regions in said substrate; d) heating said substrate sufficiently to anneal and activate said dopant implanted into said substrate to form said source/drain regions; e) removing said water-soluble spacers from said sidewalls of said gate electrode after formation of said source/drain regions by contacting said water-soluble spacers with water until said spacers are removed; and f) then implanting the portions of said semiconductor substrate exposed by removal of said spacers with a P- or N- dopant to form said LDD regions between said source/drain regions and a channel region in said substrate below said gate oxide; whereby said dopant in said LDD regions is not exposed to the heat used to anneal and activate the dopant in said source/drain regions during the formation of said source/drain regions.
Claim 11
Dependent Claim
80 words
The process of claim 6 wherein said semiconductor substrate comprises a silicon substrate and said gate electrode comprises a polysilicon gate electrode, and which further includes the step of forming metal silicide contacts over said source/drain regions in said silicon substrate and over said gate electrode after formation of said source/drain regions and prior to formation of said LDD regions, whereby said dopant in said LDD regions is not exposed to the heat used to form said metal silicide contacts.
Claim 12
Dependent Claim
12 words
The process of claim 6 wherein said spacers comprise amorphous germanium dioxide.
Claim 13
Dependent Claim
46 words
The process of claim 2 wherein said spacers comprise germanium dinitride, and said step of removing said germanium dinitride spacers further comprises heating said substrate to a temperature at which said germanium dinitride spacers sublime, and maintaining this temperature until said germanium dinitride spacers are removed.
Claim 14
Dependent Claim
33 words
The process of claim 9 wherein said step of heating said substrate to a temperature at which said germanium dinitride spacers sublime further comprises heating said substrate to a temperature over 650° C.
Claim 15
Dependent Claim
73 words
The process of claim 7 wherein said step of forming said metal silicide contacts over said source/drain regions in said silicon substrate and on said polysilicon gate electrode further includes the steps of: a) blanket depositing over said integrated circuit structure a metal capable of reacting with silicon to form a metal silicide; b) heating said substrate to form said metal silicide contacts; and c) removing unreacted metal from said integrated circuit structure.
Claim 16
Dependent Claim
30 words
The process of claim 2 wherein said spacers comprise a water-soluble material and said step of removing said spacers comprises contacting said spacers with water until said spacers are removed.
Claim 17
Dependent Claim
40 words
The process of claim 2 wherein said spacers comprise a sublimable material and said step of removing said spacers comprises heating said substrate to a temperature at which said spacers sublime, and maintaining this temperature until said spacers are removed.
Claim 18
Dependent Claim
40 words
The process of claim 2 wherein said spacers comprise a decomposable material and said step of removing said spacers comprises heating said substrate to a temperature at which said spacers decompose, and maintaining this temperature until said spacers are removed.
Claim 19
Dependent Claim
49 words
The process of claim 3 wherein said sublimable spacers comprise germanium dinitride, and said step of removing said germanium dinitride spacers further comprises heating said substrate to a temperature over 650° C. to sublime said germanium dinitride spacers, and maintaining this temperature until said germanium dinitride spacers are removed.
References Cited (Backward Citations)
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| 3.5 Years (Year 4) | 2001-07-13 | 2002-01-12 | 2002-07-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-07-13 | 2006-01-12 | 2006-07-14 | $3760.00 | Window Closed / Lapsed |
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