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US5777480A Expired / Lapsed US ⏱️ 0.0 years remaining

Connector conduction tester, and terminal locking method for connector conduction test

Assignee: Yazaki Corp
•
Filing: 1996-07-03
•
Granted: 1998-07-07
•
Expires: 2016-07-03
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Abstract

Abstract A connector conduction tester includes a conduction testing section and a connector holding section which are arranged on a stand frame and an operating section for moving the conducting testing section towards the connector holding section, in which a conduction testing operation is carried out with testing pins of the conduction testing section abutted against terminals in a connector. In the tester, the stand frame has a spacer supplying hole which is confronted with a spacer inserting hole formed in a connector set in the connector holding section, and spacer pushing device located below the spacer supplying hole. Furthermore, a conduction testing method in which a connector is set in a connector holding section and a conduction testing section is moved, so that the conduction of terminals in the connector is tested with testing pins, in which a spacer is supplied to a spacer supplying hole in a stand frame which hole is confronted with a spacer inserting hole formed in the connector, and when the connector is engaged with the conduction testing section, the spacer is pushed into the spacer inserting hole from the spacer supplying hole with the aid of pushing device.

Inventors

  • 👤 Yuji Hatagishi
  • 👤 Toshihiko Yamamoto
  • 👤 Kimihiro Abe
  • 👤 Toshiaki Okabe

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 18:44
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/50; G01R31/66

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 119 words
A connector conduction tester, comprising: a stand frame; a connector holding section, for holding a connector having terminals, arranged on said stand frame; a conduction testing section arranged on said stand frame, said conduction testing section having testing pins; an operation section for moving said conducting testing section towards said connector holding section to abut the testing pins against the terminals in the connector; and a spacer pushing member, wherein said stand frame has a spacer supplying hole located below said connector holding section and in alignment with a spacer inserting hole provided in the connector and wherein said spacer pushing member is used to push a spacer through said spacer supplying hole and into said spacer inserting hole.
Claim 2
Dependent Claim 119 words
A connector conduction tester, comprising: a stand frame; a connector holding section, for holding a connector having terminals, arranged on said stand frame; a conduction testing section arranged on said stand frame, said conduction testing section having testing pins; an operation section for moving said conducting testing section towards said connector holding section to abut the testing pins against the terminals in the connector; and a spacer pushing member, wherein said stand frame has a spacer supplying hole located below said connector holding section and in alignment with a spacer inserting hole provided in the connector and wherein said spacer pushing member is used to push a spacer through said spacer supplying hole and into said spacer inserting hole.
Claim 3
Dependent Claim 52 words
The connector conduction tester of claim 1, wherein said stand frame also has a spacer lead-in hole which communicates with said spacer supplying hole for introducing said spacer therein and a pushing-member inserting hole which is located below said spacer supplying hole and in communication therewith, said pushing member being insertable therein.
Claim 4
Dependent Claim 22 words
The connector conduction tester of claim 2, wherein the spacer lead-in hole is formed in a side wall of said stand frame.
Claim 5
Independent Claim 90 words
A method of locking terminal for a connector conduction test, said method comprising the steps of: setting a connector in a connector holding section; moving a conduction testing section to test a conduction of terminals in the connector with testing pins; supplying a spacer to a spacer supplying hole in a stand frame on which said connector holding section is supported, said spacer supplying hole being aligned with a spacer inserting hole provided in the connector; and pushing the spacer into the spacer inserting hole from the spacer supplying hole.
Claim 6
Independent Claim 90 words
A method of locking terminal for a connector conduction test, said method comprising the steps of: setting a connector in a connector holding section; moving a conduction testing section to test a conduction of terminals in the connector with testing pins; supplying a spacer to a spacer supplying hole in a stand frame on which said connector holding section is supported, said spacer supplying hole being aligned with a spacer inserting hole provided in the connector; and pushing the spacer into the spacer inserting hole from the spacer supplying hole.

References Cited (Backward Citations)

US4902968A Cited
EP0354124A1 Cited
JPH03163371A Cited
FR2690250A1 Cited
US5429519A Cited
US5528821A Cited
US5582523A Cited
US5512833A Cited
US5614820A Cited
US5586900A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-07-06 2002-01-05 2002-07-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-07-06 2006-01-05 2006-07-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-07-06 2010-01-05 2010-07-07 $7700.00 Window Closed / Lapsed

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