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US5770260A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for forming silicon dioxide film

Assignee: Fujitsu Semiconductor Ltd
•
Filing: 1997-06-30
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Granted: 1998-06-23
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Expires: 2017-06-30
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Abstract

Abstract A process capable of forming an inorganic film which can be used at a relatively large thickness equivalent to, or greater than, the thickness of an organic SOG, without being subjected to oxidation by O 2 plasma treatment used in a fabrication process of a semiconductor device. Polysilazane is first coated on a base, and the resulting polysilazane film is converted to a silicon dioxide film.

Inventors

  • 👤 Shun-ichi Fukuyama
  • 👤 Daitei Shin
  • 👤 Yuki Komatsu
  • 👤 Hideki Harada
  • 👤 Yoshihiro Nakata
  • 👤 Michiko Kobayashi
  • 👤 Yoshiyuki Okura

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 19:29
CPC Classifications
C; C23; C23C; C23C18/00; C23C18/02; C23C18/12; C23C18/1204; C23C18/122; C23C18/1208; C23C18/1212; C23C18/125; C23C18/1283; C23C18/1295; C23C18/14; C23C18/143; H; H10; H10P; H10P14/00; H10P14/60; H10P14/65; H10P14/6516; H10P14/6529; H10P14/6532; H10P14/6534; H10P14/6536; H10P14/6538; H10P14/63; H10P14/6326; H10P14/6342; H10P14/66; H10P14/668; H10P14/6681; H10P14/6687; H10P14/6689; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 41 words
A process for forming a silicon dioxide film comprising applying a mixture of polysilazane and a compound containing a phenolic hydroxyl group on a base to form a coated film, and converting the resulting coated film to said silicon dioxide film.
Claim 2
Dependent Claim 41 words
A process for forming a silicon dioxide film comprising applying a mixture of polysilazane and a compound containing a phenolic hydroxyl group on a base to form a coated film, and converting the resulting coated film to said silicon dioxide film.
Claim 3
Dependent Claim 33 words
A process according to claim 1, wherein the conversion of the coated film to said silicon dioxide film is carried out by subjecting said coated film to heat treatment in an oxidizing atmosphere.
Claim 4
Dependent Claim 16 words
A process according to claim 2, wherein said oxidizing atmosphere is an oxygen-containing or steam-containing atmospheres.
Claim 5
Dependent Claim 42 words
A process according to claim 2, wherein heat treatment for drying a solvent in said coated film and/or for melting and flattening said coated film is carried out before said heat treatment for converting said coated film to said silicon dioxide film.
Claim 6
Dependent Claim 51 words
A process according to claim 4, wherein said coated film is subjected to water absorption treatment before said heat treatment for converting said coated film to said silicon dioxide film and after said heat treatment for drying said solvent in said coated film and/or for melting and flattening said coated film.
Claim 7
Dependent Claim 34 words
A process according to claim 4, wherein said heat treatment for drying said solvent in said coated film and/or for melting and flattening said coated film is carried out under irradiation with ultraviolet rays.
Claim 8
Dependent Claim 18 words
A process according to claim 1, wherein said silicon dioxide film is further subjected to oxygen plasma treatment.

References Cited (Backward Citations)

US4116658A Cited
JPH05121572A Cited
JPH05243212A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-06-22 2001-12-22 2002-06-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-06-22 2005-12-22 2006-06-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-06-22 2009-12-22 2010-06-23 $7700.00 Window Closed / Lapsed

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