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US5742629A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor laser and production method thereof

Assignee: Panasonic Holdings Corp
•
Filing: 1996-07-19
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Granted: 1998-04-21
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Expires: 2016-07-19
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Abstract

Abstract A semiconductor laser includes: an active layer formed of a II-VI group compound semiconductor material; a first cladding layer and a second cladding layer disposed so as to put the active layer therebetween; a light confinement layer provided on the second cladding layer, having an opening for current flow and formed of ZnMgSSe; and a third cladding layer provided at the opening of the light confinement layer. The light confinement layer has high resistivity or has a conductivity type opposite to that of the third cladding layer; the second and third cladding layers are formed of ZnMgSSe; and a Mg content and a S content of the light confinement layer are larger than a Mg content and a S content of the second and third cladding layers.

Inventors

  • 👤 Takashi Nishikawa
  • 👤 Nobuyuki Uemura
  • 👤 Satoshi Kamiyama

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 09:12
CPC Classifications
B; B82; B82Y; B82Y20/00; H; H01; H01S; H01S5/00; H01S5/30; H01S5/34; H01S5/347; H01S5/20; H01S5/204; H01S5/22; H01S5/223; H01S5/2231; H01S5/32; H01S5/327

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 128 words
A semiconductor laser, comprising: an active layer formed of a II-VI group compound semiconductor material; a first cladding layer and a second cladding layer disposed so as to put said active layer therebetween; a light confinement layer provided on said second cladding layer, having an opening for current flow and formed of ZnMgSSe; and a third cladding layer provided at said opening of said light confinement layer, wherein: said light confinement layer has high resistivity or has a conductivity type opposite to that of said third cladding layer; said second and third cladding layers are formed of ZnMgSSe; and a Mg content and a S content of said light confinement layer are larger than a Mg content and a S content of said second and third cladding layers.
Claim 2
Dependent Claim 128 words
A semiconductor laser, comprising: an active layer formed of a II-VI group compound semiconductor material; a first cladding layer and a second cladding layer disposed so as to put said active layer therebetween; a light confinement layer provided on said second cladding layer, having an opening for current flow and formed of ZnMgSSe; and a third cladding layer provided at said opening of said light confinement layer, wherein: said light confinement layer has high resistivity or has a conductivity type opposite to that of said third cladding layer; said second and third cladding layers are formed of ZnMgSSe; and a Mg content and a S content of said light confinement layer are larger than a Mg content and a S content of said second and third cladding layers.
Claim 3
Dependent Claim 25 words
The semiconductor laser according to claim 1, wherein said opening of said light confinement layer is narrowed on the side closer to said active layer.
Claim 4
Dependent Claim 32 words
The semiconductor laser according to claim 1, further comprising light guiding layers provided between said active layer and said first cladding layer and between said active layer and said second cladding layer.
Claim 5
Dependent Claim 28 words
The semiconductor laser according to claim 1, wherein refractive indices of said second and third cladding layers are larger than a refractive index of said light confinement layer.
Claim 6
Dependent Claim 39 words
The semiconductor laser according to claim 1, further comprising: a contact layer provided on said third cladding layer; and an electrode provided on said contact layer, wherein said electrode and said contact layer make contact in a device area.
Claim 7
Dependent Claim 15 words
The semiconductor laser according to claim 5, wherein said contact layer includes at least ZnSe.
Claim 8
Dependent Claim 24 words
The semiconductor laser according to claim 1, further comprising an etching stopping layer provided between said second cladding layer and said light confinement layer.

References Cited (Backward Citations)

US5278856A Cited
US5268918A Cited
US5375134A Cited
US5521934A Cited
JPH077183A Cited
JPH07226562A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-04-20 2001-10-20 2002-04-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-04-20 2005-10-20 2006-04-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-04-20 2009-10-20 2010-04-21 $7700.00 Window Closed / Lapsed

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