US5723368A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Porous dielectric material with improved pore surface properties for electronics applications
Assignee: Individual
•
Filing: 1995-06-07
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Granted: 1998-03-03
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Expires: 2015-06-07
Abstract
Abstract This invention provides an improved porous structure for semiconductor devices and a process for making the same. This process may be applied to an existing porous structure 28, which may be deposited, for example, between patterned conductors 24. The process may include baking the structure in a reducing atmosphere, preferably a forming gas, to dehydroxylate the pore surfaces. The process may include baking the structure in a halogen-containing atmosphere to bond halogens to the pore surfaces. It has been found that a porous structure treated in such a manner generally exhibits improved dielectric properties relative to an untreated sample.
Inventors
- 👤 Chi-Chen Cho
- 👤 Bruce E. Gnade
- 👤 Douglas M. Smith
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 09:12
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/45; H10W20/48; H10W20/01; H10W20/071; H10W20/072; H10W20/46; H10W20/495
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
94 words
A method of constructing a semiconductor device, said method comprising: providing a substrate containing an uncapped porous dielectric layer having a first thickness and having a porosity greater than 50% and an average pore diameter between 2 and 80 nm; and heating said substrate to one or more temperatures between 100° C. and 450° C. in an atmosphere comprising at least one fluorine compound, thereby at least partially fluorinating pore surfaces in said porous dielectric while reducing said first thickness by less than 5%; whereby said porous dielectric is rendered both hydrophobic and oleophobic.
Claim 2
Independent Claim
94 words
A method of constructing a semiconductor device, said method comprising: providing a substrate containing an uncapped porous dielectric layer having a first thickness and having a porosity greater than 50% and an average pore diameter between 2 and 80 nm; and heating said substrate to one or more temperatures between 100° C. and 450° C. in an atmosphere comprising at least one fluorine compound, thereby at least partially fluorinating pore surfaces in said porous dielectric while reducing said first thickness by less than 5%; whereby said porous dielectric is rendered both hydrophobic and oleophobic.
Claim 3
Dependent Claim
17 words
The method of claim 1, further comprising depositing a substantially solid cap layer over said porous dielectric.
Claim 4
Dependent Claim
22 words
The method of claim 1, further comprising depositing a substantially solid cap layer over said porous dielectric by a wet deposition technique.
Claim 5
Dependent Claim
25 words
The method of claim 1, wherein said fluorine compound is selected from the group consisting of: ammonium fluoride, hydrogen fluoride, fluorine gas, and combinations thereof.
Claim 6
Dependent Claim
25 words
The method of claim 1, wherein said heating said substrate step is carried out at one or more temperatures between 300° C. and 450° C.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-03-02 | 2001-09-01 | 2002-03-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-03-02 | 2005-09-01 | 2006-03-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-03-02 | 2009-09-01 | 2010-03-03 | $7700.00 | Window Closed / Lapsed |