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US5720845A Expired / Lapsed US ⏱️ 0.0 years remaining

Wafer polisher head used for chemical-mechanical polishing and endpoint detection

Assignee: Individual
•
Filing: 1996-01-17
•
Granted: 1998-02-24
•
Expires: 2016-01-17
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Abstract

Abstract A polishing head is suitable for polishing a semiconductor wafer and for providing endpoint detection during chemical-mechanical polishing. The head features an arrangement of patterned active actuators and load cells above the wafer to fully control the wafer surface profile changes and provide endpoint detection during the polishing processes. Each active actuator applies pressure according to the local coated thin film thickness on the wafer and relative velocity between the wafer and polishing pad. The load cell senses the actual force pressing on the wafer and feeds the information back to the actuator to adjust the force to a preset value, The planar endpoint is detected by sensing a change in friction force between different thin film material on the wafer. The change in friction force is detected by the load cell and a signal is produced to adjust or stop the process.

Inventors

  • 👤 Keh-Shium Liu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 00:16
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/12; H10P90/129; B; B24; B24B; B24B37/00; B24B37/27; B24B37/30; B24B49/00

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 159 words
A polishing head for polishing a semiconductor wafer on a platen, comprising: a flexible plate; a plurality of actuators, each of which has a DC-motor and a moving part coupled with said DC-motor to exert a force on said flexible plate; a reaction plate for fixing said actuators; a motor driver sequentially driving said DC-motors; a packing plate comprising a plurality of attachment packed together; a plurality of load cells, each of which is correspondingly sandwiched between said flexible plate and one of said attachments, for sensing said force and then outputting first signals; a flexible carrier plate provided with a plurality of holes and fixed on a bottom of said head for carrying said packing plate; a vacuum source for providing a vacuum force through said holes to hold said wafer on said bottom of said head; and a microprocessor for receiving said first signals from said load cells and controlling said motor driver to drive said DC-motors.
Claim 2
Dependent Claim 159 words
A polishing head for polishing a semiconductor wafer on a platen, comprising: a flexible plate; a plurality of actuators, each of which has a DC-motor and a moving part coupled with said DC-motor to exert a force on said flexible plate; a reaction plate for fixing said actuators; a motor driver sequentially driving said DC-motors; a packing plate comprising a plurality of attachment packed together; a plurality of load cells, each of which is correspondingly sandwiched between said flexible plate and one of said attachments, for sensing said force and then outputting first signals; a flexible carrier plate provided with a plurality of holes and fixed on a bottom of said head for carrying said packing plate; a vacuum source for providing a vacuum force through said holes to hold said wafer on said bottom of said head; and a microprocessor for receiving said first signals from said load cells and controlling said motor driver to drive said DC-motors.
Claim 3
Dependent Claim 27 words
The polishing head for polishing a semiconductor wafer as claimed in claim 1, further comprising a metal plate glued between said packing plate and said load cells.
Claim 4
Dependent Claim 18 words
The polishing head for polishing a semiconductor wafer as claimed in claim 1, wherein said attachments are hexagonal.
Claim 5
Dependent Claim 18 words
The polishing head for polishing a semiconductor wafer as claimed in claim 1, wherein said attachments are circular.
Claim 6
Dependent Claim 48 words
The polishing head for polishing a semiconductor wafer as claimed in claim 1, wherein said load cells further sense shear friction forces between said wafer and said platen and then sends second signals to said microprocessor which decides when to stop polishing said wafer based on an endpoint.
Claim 7
Dependent Claim 33 words
The polishing head for polishing a semiconductor wafer as claimed in claim 5, wherein said endpoint is defined as an oxide coating of said wafer polished to a surface including a different material.
Claim 8
Dependent Claim 25 words
The polishing head for polishing a semiconductor wafer as claimed in claim 5, wherein said endpoint is defined as changes of said shear friction forces.
Claim 9
Dependent Claim 52 words
The polishing head for polishing a semiconductor wafer as claimed in claim 5, wherein said wafer has a flat cut, and said load cells can detect said flat cut and send third signals to said microprocessor which then adjusts said force exerted by said DC-motor based on said first and third signals.

References Cited (Backward Citations)

JPS5815238A Cited
US4606151A Cited
US4873792A Cited
US5036015A Cited
US5321304A Cited
US5472374A Cited
JPH06196456A Cited
JPH06216095A Cited
JPH0786393A Cited
JPH07130686A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-02-23 2001-08-25 2002-02-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-02-23 2005-08-25 2006-02-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-02-23 2009-08-25 2010-02-24 $7700.00 Window Closed / Lapsed

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