US5701274A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor device with selectable device information
Assignee: Fujitsu Semiconductor Ltd
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Filing: 1995-06-06
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Granted: 1997-12-23
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Expires: 2015-06-06
Abstract
Abstract A semiconductor device has a function of reading device information specific to the device as and when required. The semiconductor device has storage units for storing plural pieces of device information and a selector for selecting a predetermined one of the information pieces stored in the storage units when a device information read mode is set, so that the read information may match device data such as a manufacturer name and part name printed on the semiconductor device.
Inventors
- 👤 Takao Akaogi
- 👤 Masanobu Yoshida
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 01:35
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G11C16/10; G11C16/20; G11C5/00; G11C5/14; G11C5/145
Claims Analysis
Total Claims: 26
Claim 1
Independent Claim
110 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; a selection signal generation means for generating a selection signal where selection information indicating specific device information to be selected is programmed; and a selection means for selecting a predetermined one of the information pieces stored in said storage means in accordance with the selection signal generated by said selection signal generation means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device.
Claim 2
Dependent Claim
110 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; a selection signal generation means for generating a selection signal where selection information indicating specific device information to be selected is programmed; and a selection means for selecting a predetermined one of the information pieces stored in said storage means in accordance with the selection signal generated by said selection signal generation means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device.
Claim 3
Dependent Claim
25 words
A semiconductor device as claimed in claim 1, wherein said selection means selects one of the information pieces according to at least one bonding wire.
Claim 4
Dependent Claim
24 words
A semiconductor device as claimed in claim 2, wherein said bonding wire is optionally prepared in an assembling step of assembling said semiconductor device.
Claim 5
Dependent Claim
25 words
A semiconductor device as claimed in claim 1, wherein said selection means selects one of the information pieces by use of at least one fuse.
Claim 6
Dependent Claim
27 words
A semiconductor device as claimed in claim 4, wherein said fuse is cut by using a laser beam in a wafer testing step of testing a wafer.
Claim 7
Dependent Claim
40 words
A semiconductor device as claimed in claim 4, wherein said fuse is cut by applying a voltage between predetermined pins of said semiconductor device in a wafer sorting step or in a final testing step of testing a semiconductor product.
Claim 8
Dependent Claim
27 words
A semiconductor device as claimed in claim 1, wherein said selection means selects one of the information pieces by use of at least one nonvolatile memory transistor.
Claim 9
Dependent Claim
33 words
A semiconductor device as claimed in claim 1, wherein said selection means selects one of the information pieces according to at least one mask on a master slice in a wafer fabricating step.
Claim 10
Dependent Claim
22 words
A semiconductor device as claimed in claim 8, wherein said mask is used as the last mask in said wafer fabricating step.
Claim 11
Dependent Claim
34 words
A semiconductor device as claimed in claim 1, wherein said semiconductor device is a nonvolatile semiconductor memory, and said storage means is a part of a memory cell array in said nonvolatile semiconductor memory.
Claim 12
Dependent Claim
71 words
A semiconductor device as claimed in claim 10, wherein said nonvolatile semiconductor memory has first memory cell array, first decoder for selecting bit and word lines connected to said first memory cell array, a storage means involving second memory cell arrays for storing the device information pieces, and a second decoder for selecting one word line connected to said second memory cell array when said device information read mode is set.
Claim 13
Dependent Claim
18 words
A semiconductor device as claimed in claim 1, wherein the device information includes manufacturer code and device code.
Claim 14
Dependent Claim
44 words
A semiconductor device as claimed in claim 1, wherein said semiconductor device further comprises a high-voltage detector serving as an information read mode setting means that sets the information read mode only when a voltage higher than a normal source voltage is externally provided.
Claim 15
Dependent Claim
24 words
A semiconductor device as claimed in claim 1, wherein the device data indicating said semiconductor device includes a manufacturer logo, and a part name.
Claim 16
Dependent Claim
109 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said selection means selects one of the information pieces according to at least one bonding wire, and wherein said bonding wire is optionally prepared in an assembling step of assembling said semiconductor device.
Claim 17
Dependent Claim
109 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said selection means selects one of the information pieces according to at least one bonding wire, and wherein said bonding wire is optionally prepared in an assembling step of assembling said semiconductor device.
Claim 18
Dependent Claim
93 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said selection means selects one of the information pieces with the use of at least one fuse.
Claim 19
Dependent Claim
93 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said selection means selects one of the information pieces with the use of at least one fuse.
Claim 20
Dependent Claim
27 words
A semiconductor device as claimed in claim 16, wherein said fuse is cut by using a laser beam in a wafer testing step of testing a wafer.
Claim 21
Dependent Claim
41 words
A semiconductor device as claimed in claim 16, wherein said fuse is cut by applying a voltage between predetermined pins of said semiconductor device in one of a wafer sorting step and a final testing step of testing a semiconductor product.
Claim 22
Dependent Claim
100 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said selection means selects one of the information pieces according to at least one mask on a master slice in a wafer fabricating step.
Claim 23
Dependent Claim
100 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said selection means selects one of the information pieces according to at least one mask on a master slice in a wafer fabricating step.
Claim 24
Dependent Claim
22 words
A semiconductor device as claimed in claim 19, wherein said mask is used as a last mask in said wafer fabricating step.
Claim 25
Dependent Claim
111 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said semiconductor device further comprises a high-voltage detector serving as an information read mode setting means that sets the information read mode only when a voltage higher than a normal source voltage is externally provided.
Claim 26
Dependent Claim
111 words
A semiconductor device having a function of reading device information specific to the device as and when required, said semiconductor device comprising: a storage means for storing plural pieces of device information; and a selection means for selecting a predetermined one of the information pieces stored in said storage means when a device information read mode is set so that the selected and read device information is matched with device data indicating said semiconductor device, wherein said semiconductor device further comprises a high-voltage detector serving as an information read mode setting means that sets the information read mode only when a voltage higher than a normal source voltage is externally provided.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-12-22 | 2001-06-23 | 2001-12-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-12-22 | 2005-06-23 | 2005-12-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-12-22 | 2009-06-23 | 2009-12-23 | $7700.00 | Window Closed / Lapsed |