Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
180 words
An improved X-ray inspection system for reducing afterglow noise during the inspection of an object, said improved system comprising: a pulsed X-ray source for radiating a cone of X ray pulses that penetrate the object at a rate of at least about 2,000 pulses per second, said pulses being asserted for a duration period of time and adjacent of said pulses being separated by a separation period of time, said separation period being substantially longer than said duration period; and a detector for intercepting said X-ray pulses penetrating the object and for transforming said X-ray pulses into image data, said detector comprising at least one scintillating screen optically coupled to a plurality of photoemissive detecting elements such that when said X-ray pulses are intercepted by said detector, outputs of said photoemissive detecting elements are sampled for a sampling period of time immediately followed by a quiescent period of time during which said photoemissive detecting elements are not sampled, said quiescent period being substantially longer than said sampling period so as to significantly reduce afterglow noise during inspection of the object.
Claim 2
Dependent Claim
180 words
An improved X-ray inspection system for reducing afterglow noise during the inspection of an object, said improved system comprising: a pulsed X-ray source for radiating a cone of X ray pulses that penetrate the object at a rate of at least about 2,000 pulses per second, said pulses being asserted for a duration period of time and adjacent of said pulses being separated by a separation period of time, said separation period being substantially longer than said duration period; and a detector for intercepting said X-ray pulses penetrating the object and for transforming said X-ray pulses into image data, said detector comprising at least one scintillating screen optically coupled to a plurality of photoemissive detecting elements such that when said X-ray pulses are intercepted by said detector, outputs of said photoemissive detecting elements are sampled for a sampling period of time immediately followed by a quiescent period of time during which said photoemissive detecting elements are not sampled, said quiescent period being substantially longer than said sampling period so as to significantly reduce afterglow noise during inspection of the object.
Claim 3
Dependent Claim
31 words
The improved X-ray inspection system of claim 1 wherein said separation period is approximately equal to said quiescent period and wherein said duration period is approximately equal to said sampling period.
Claim 4
Dependent Claim
25 words
The improved X-ray inspection system of claim 1 further comprising a rotating cylindrical collimator for converting said X-ray pulses into a pencil-beam of X-ray pulses.
Claim 5
Dependent Claim
34 words
The improved X-ray inspection system of claim 3 further comprising an enclosure for containing said source, said enclosure having an integrally-formed precollimator that limits said radiated cone to a fan-beam of X ray pulses.
Claim 6
Dependent Claim
17 words
The improved X-ray inspection system of claim 4 wherein said precollimator comprises a shield and a slit.
Claim 7
Dependent Claim
37 words
The improved X-ray inspection system of claim 5 further comprising a fixed-slit collimator arranged between said rotating cylindrical collimator and the object, said fixed-slit collimator further limiting said pencil-beam of X-ray pulses prior to penetrating the object.
Claim 8
Dependent Claim
29 words
The improved X-ray inspection system of claim 1 wherein said source is a high-energy pulsed linear accelerator having a repetition rate of about 2,000 to 10,000 pulses per second.
Claim 9
Dependent Claim
25 words
The improved X-ray inspection system of claim 1 wherein said source is a low-energy X-ray tube having a peak energy of 200 to 800 KeV.
Claim 10
Dependent Claim
29 words
The improved X-ray inspection system of claim 1 wherein said detector comprises a plurality of scintillating screens arranged in a back-to-back configuration to increase the efficiency of said detector.
Claim 11
Dependent Claim
16 words
The improved X-ray inspection system of claim 9 wherein said photoemissive detecting elements comprise photomultiplier tubes.
Claim 12
Independent Claim
126 words
A method of reducing afterglow noise during inspection of an object by an X-ray inspection system, said method comprising the steps of: generating X-ray pulses at a rate of least 2,000 pulses per second, wherein each of said pulses has a time duration that is substantially less than a separation of time between adjacent of said pulses; intercepting said X-ray pulses using a scintillating screen optically coupled to a plurality of photoemissive detecting elements of a detector, each of said photoemissive detecting elements generating an electrical output signal in response to visible light produced by said scintillating screen; and sampling said outputs of said plurality of photoemissive detecting elements during said duration of time of said X-ray pulses to reduce the afterglow noise of said system.
Claim 13
Independent Claim
126 words
A method of reducing afterglow noise during inspection of an object by an X-ray inspection system, said method comprising the steps of: generating X-ray pulses at a rate of least 2,000 pulses per second, wherein each of said pulses has a time duration that is substantially less than a separation of time between adjacent of said pulses; intercepting said X-ray pulses using a scintillating screen optically coupled to a plurality of photoemissive detecting elements of a detector, each of said photoemissive detecting elements generating an electrical output signal in response to visible light produced by said scintillating screen; and sampling said outputs of said plurality of photoemissive detecting elements during said duration of time of said X-ray pulses to reduce the afterglow noise of said system.
Claim 14
Dependent Claim
128 words
Apparatus for reducing afterglow noise during inspection of an object by an X-ray inspection system, said apparatus comprising: means for generating X-ray pulses at rate of at least about 2,000 pulses per second, wherein each of said pulses has a time duration that is substantially less than a separation of time between adjacent of said pulses; means for intercepting said X-ray pulses using a scintillating screen optically coupled to a plurality of photoemissive detecting elements of a detector, said photoemissive detecting elements generating current at outputs thereof in response to visible light produced by said scintillating screen; and means for sampling said outputs of said plurality of photoemissive detecting elements during said duration of time of said X-ray pulses to thereby reduce the afterglow noise of said system.
Claim 15
Dependent Claim
128 words
Apparatus for reducing afterglow noise during inspection of an object by an X-ray inspection system, said apparatus comprising: means for generating X-ray pulses at rate of at least about 2,000 pulses per second, wherein each of said pulses has a time duration that is substantially less than a separation of time between adjacent of said pulses; means for intercepting said X-ray pulses using a scintillating screen optically coupled to a plurality of photoemissive detecting elements of a detector, said photoemissive detecting elements generating current at outputs thereof in response to visible light produced by said scintillating screen; and means for sampling said outputs of said plurality of photoemissive detecting elements during said duration of time of said X-ray pulses to thereby reduce the afterglow noise of said system.