← Back to Patent Explorer
US5666197A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus and methods employing phase control and analysis of evanescent illumination for imaging and metrology of subwavelength lateral surface topography

Assignee: Intellectual Ventures I LLC
•
Filing: 1996-08-21
•
Granted: 1997-09-09
•
Expires: 2016-08-21
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Imaging and metrology devices employ controlled phase shifting and analysis of evanescent light to provide enhanced ability to image and/or resolve substantially subwavelength lateral features on a surface illuminated by the evanescent light. The light waves comprising the evanescent electromagnetic field are inhomogeneous in that their planes of equal phase are substantially perpendicular to the direction of propagation and to their planes of constant amplitude. The planes of equal phase are therefore normal to the surface to which the evanescent field is adjacent and to a sample surface illuminated by this field as well. By controlling the phase of the source of illumination and analyzing the output from the surface, either by phase analysis or phase to amplitude decoding, subwavelength lateral surface topography resolution is enhanced without sacrificing vertical resolution. Methods and means for dynamic or static phase shifting of inhomogeneous waves comprising the evanescent field are disclosed, as well as other non-imaging applications.

Inventors

  • 👤 John M. Guerra

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 19:53
CPC Classifications
B; B82; B82Y; B82Y10/00; G; G01; G01B; G01B11/00; G01B11/30; G01B11/303; G01B9/00; G01B9/04; G02; G02B; G02B26/00; G02B26/06; G11; G11B; G11B7/00; G11B7/004; G11B7/12; G11B7/135; G11B7/1365; G11B7/1367; G11B7/1387; G11B2007/0003; G11B2007/0009; G11B2007/0013; G11B7/1372; G11B2007/13727; Y; Y10; Y10S; Y10S977/00; Y10S977/70; Y10S977/832; Y10S977/834; Y10S977/84; Y10S977/88; Y10S977/881

Claims Analysis

Total Claims: 39
Claim 1
Independent Claim 306 words
A phase controlled evanescent field imaging system for visualizing and measuring subwavelength topographic features of a sample, said system comprising: lighting means for providing at least one beam of radiation having at least one predetermined wavelength and phase angle; optical means for receiving said beam of radiation from said lighting means and creating at a surface a wavelength evanescent field having planes of equal intensity parallel to said surface and planes of equal phase substantially perpendicular to said surface so that light initially bound within said wavelength evanescent field may be converted into propagating light when the sample is brought proximate to said surface and such that, in the absence of a sample near said surface, or if a sample surface is distant from said surface, no evanescent light energy is converted into propagating light, the phase and intensity of said propagating light varying in correspondence with the topographic features of said surface and their local proximity to said evanescent field; phase control means for selectively controlling said predetermined wavelength and phase angle of said beam of radiation such that the intensity of said evanescent light varies as a function of the phase of said beam of radiation and the lateral position of the local topographic features of the sample; imaging means having at least one optical axis positioned to collect said propagating light and form images with it in which the topographic features of the surface are encoded as imagewise variations in image intensity in correspondence with the phase of said beam of radiation; photodetector means for generating image signals having an amplitude that varies in accordance with the imagewise variation in intensity in said images; and image processing means for receiving said image signals and generating a composite image signal from which the topographic features of the sample can be visually displayed or measured.
Claim 2
Dependent Claim 306 words
A phase controlled evanescent field imaging system for visualizing and measuring subwavelength topographic features of a sample, said system comprising: lighting means for providing at least one beam of radiation having at least one predetermined wavelength and phase angle; optical means for receiving said beam of radiation from said lighting means and creating at a surface a wavelength evanescent field having planes of equal intensity parallel to said surface and planes of equal phase substantially perpendicular to said surface so that light initially bound within said wavelength evanescent field may be converted into propagating light when the sample is brought proximate to said surface and such that, in the absence of a sample near said surface, or if a sample surface is distant from said surface, no evanescent light energy is converted into propagating light, the phase and intensity of said propagating light varying in correspondence with the topographic features of said surface and their local proximity to said evanescent field; phase control means for selectively controlling said predetermined wavelength and phase angle of said beam of radiation such that the intensity of said evanescent light varies as a function of the phase of said beam of radiation and the lateral position of the local topographic features of the sample; imaging means having at least one optical axis positioned to collect said propagating light and form images with it in which the topographic features of the surface are encoded as imagewise variations in image intensity in correspondence with the phase of said beam of radiation; photodetector means for generating image signals having an amplitude that varies in accordance with the imagewise variation in intensity in said images; and image processing means for receiving said image signals and generating a composite image signal from which the topographic features of the sample can be visually displayed or measured.
Claim 3
Dependent Claim 14 words
The system of claim 1 wherein said phase control means is dynamic in operation.
Claim 4
Dependent Claim 14 words
The system of claim 1 wherein said phase control means is static in operation.
Claim 5
Dependent Claim 27 words
The system of claim 1 wherein said phase control means comprises filtering means for selectively controlling the output of said lighting means to preselected wavelengths of radiation.
Claim 6
Dependent Claim 18 words
The system of claim 4 wherein said filtering means is structured to pass at least two different wavelengths.
Claim 7
Dependent Claim 13 words
The system of claim 1 wherein said phase control means comprises polarization means.
Claim 8
Dependent Claim 14 words
The system of claim 1 wherein said phase control means comprises an electro-optic modulator.
Claim 9
Dependent Claim 15 words
The system of claim 1 wherein said phase control means comprises a tunable optical cavity.
Claim 10
Dependent Claim 26 words
The system of claim 1 wherein said phase control means comprises means for changing the angle of incidence of said beam of radiation from said lighting.
Claim 11
Dependent Claim 15 words
The system of claim 1 wherein said phase control mean comprises a retarding phase plate.
Claim 12
Dependent Claim 21 words
The system of claim 10 wherein said retarding phase plate comprises annular phase masks with different numerical apertures greater than one.
Claim 13
Dependent Claim 14 words
The system of claim 1 wherein said phase control means comprises a split polarizer.
Claim 14
Dependent Claim 15 words
The system of claim 1 wherein said phase control means comprises a split color filter.
Claim 15
Dependent Claim 29 words
The system of claim 1 wherein said phase control means comprises means for selecting the azimuthal angle of the incident illumination, and thus the direction of the Goos-Haenchen shift.
Claim 16
Dependent Claim 22 words
The system of claim 1 wherein said optical means comprises a tapered dielectric near-field probe with subwavelength aperture to increase lateral resolution.
Claim 17
Dependent Claim 31 words
The system of claim 15 wherein said near-field probe is formed of a multiple dielectric layer Bragg-type reflector having an aperture where the evanescent field is restricted in the lateral plane.
Claim 18
Dependent Claim 26 words
The system of claim 16 wherein said probe and Bragg reflector are formed together by drawing a preform containing the Bragg layers scaled up to size.
Claim 19
Dependent Claim 44 words
The system of claim 1 wherein said optical means comprises a plurality of probes arranged in a close-packed matrix for locally scanning over a small distance so that lateral phase shifting is achieved in addition to increasing total scan area and reducing scan time.
Claim 20
Dependent Claim 29 words
The system of claim 18 wherein said close-packed matrix of said plurality of probes is arranged to comprise a phase-array so that together said probes form a synthetic aperture.
Claim 21
Dependent Claim 57 words
The system of claim 1 wherein said optical means comprises a diffractive grating structure having a spatial grating period smaller than the wavelength of said beam of radiation from said lighting means such that the diffracted orders are evanescent where the local phase of the evanescent field is determined by and phase-locked to said diffractive grating structure.
Claim 22
Dependent Claim 27 words
The system of claim 20 further including means for varying said spatial grating period of said diffractive grating structure to shift the phase of the evanescent field.
Claim 23
Dependent Claim 20 words
The system of claim 21 wherein said means for varying said spatial grating period comprises a tunable acoustic wave modulator.
Claim 24
Dependent Claim 19 words
The system of claim 21 wherein said means for varying said spatial grating period comprises a piezo crystal modulator.
Claim 25
Dependent Claim 67 words
The system of claim 1 wherein said optical means comprises a light transmissive body having an entrance facet for receiving said beam of radiation from said lighting means from which said evanescent field is formed, a distal facet at which said evanescent field is formed so that a sample surface can be brought proximate to it, and at least one exit facet from which propagating light emerges.
Claim 26
Dependent Claim 51 words
The system of claim 24 where said light transmissive body, said entrance facet and said exit facet thereof are structured and arranged with respect to one another so that said distal facet is a totally internally reflecting barrier where said evanescent field is caused by photons tunneling beyond said distal facet.
Claim 27
Dependent Claim 12 words
The system of claim 1 wherein said propagating radiation is specularly reflected.
Claim 28
Dependent Claim 11 words
The system of claim 1 wherein said propagating radiation is scattered.
Claim 29
Independent Claim 279 words
A method for visualizing and measuring subwavelength topographic features of a sample utilizing phase controlled evanescent field illumination, said method comprising the steps of: providing at least one beam of radiation having at least one predetermined wavelength and phase angle; receiving said beam of radiation and creating at a surface a wavelength evanescent field having planes of equal intensity parallel to said surface and planes of equal phase substantially perpendicular to said surface so that light initially bound within said wavelength evanescent field may be converted into propagating light when the sample is brought proximate to said surface and such that, in the absence of a sample near said surface, or if a sample surface is distant from said surface, no evanescent light energy is converted into propagating light, the phase and intensity of said propagating light varying in correspondence with the topographic features of said surface and their local proximity to said evanescent field; selectively controlling said predetermined wavelength and phase angle of said beam of radiation such that the intensity of said evanescent light varies as a function of the phase of said beam of radiation and the lateral position of the local topographic features of the sample; collecting said propagating light and forming images with it in which the microtopographic features of the surface are encoded as imagewise variations in image intensity in correspondence with the phase of said beam of radiation; generating image signals having an amplitude that varies in accordance with the imagewise variation in intensity in said images; and receiving said image signals and generating a composite image signal from which the topographic features of the sample can be visually displayed or measured.
Claim 30
Independent Claim 279 words
A method for visualizing and measuring subwavelength topographic features of a sample utilizing phase controlled evanescent field illumination, said method comprising the steps of: providing at least one beam of radiation having at least one predetermined wavelength and phase angle; receiving said beam of radiation and creating at a surface a wavelength evanescent field having planes of equal intensity parallel to said surface and planes of equal phase substantially perpendicular to said surface so that light initially bound within said wavelength evanescent field may be converted into propagating light when the sample is brought proximate to said surface and such that, in the absence of a sample near said surface, or if a sample surface is distant from said surface, no evanescent light energy is converted into propagating light, the phase and intensity of said propagating light varying in correspondence with the topographic features of said surface and their local proximity to said evanescent field; selectively controlling said predetermined wavelength and phase angle of said beam of radiation such that the intensity of said evanescent light varies as a function of the phase of said beam of radiation and the lateral position of the local topographic features of the sample; collecting said propagating light and forming images with it in which the microtopographic features of the surface are encoded as imagewise variations in image intensity in correspondence with the phase of said beam of radiation; generating image signals having an amplitude that varies in accordance with the imagewise variation in intensity in said images; and receiving said image signals and generating a composite image signal from which the topographic features of the sample can be visually displayed or measured.
Claim 31
Dependent Claim 24 words
The method of claim 28 wherein said step of selectively controlling the wavelength and phase of said beam of radiation is dynamic in operation.
Claim 32
Dependent Claim 24 words
The method of claim 28 wherein said step of selectively controlling the wavelength and phase of said beam of radiation is static in operation.
Claim 33
Dependent Claim 34 words
The method of claim 28 wherein said step of controlling the wavelength and phase of said beam of radiation comprises filtering said beam of radiation to restrict its output to preselected wavelengths of radiation.
Claim 34
Dependent Claim 25 words
The method of claim 28 wherein said step of controlling the wavelength and phase of said beam of radiation comprises polarizing said beam of radiation.
Claim 35
Dependent Claim 34 words
The method of claim 28 wherein said step of controlling the wavelength and phase of said beam of radiation comprises changing the angle of incidence of said beam of radiation from said lighting means.
Claim 36
Dependent Claim 25 words
The method of claim 28 wherein said step of controlling the wavelength and phase of said beam of radiation comprises retarding said beam of radiation.
Claim 37
Dependent Claim 36 words
The method of claim 28 wherein said step of controlling the wavelength and phase of said beam of radiation comprises selecting the azimuthal angle of the incident illumination, and thus the direction of the Goos-Haenchen shift.
Claim 38
Dependent Claim 64 words
The method of claim 28 wherein said step of receiving and creating said evanescent field comprises illuminating a diffractive grating structure having a spatial grating period smaller than the wavelength of said beam of radiation from said lighting means such that the diffracted orders are evanescent where the local phase of the evanescent field is determined by and phase-locked to said diffractive grating structure.
Claim 39
Dependent Claim 28 words
The method of claim 36 further including the step of varying said spatial grating period of said diffractive grating structure to shift the phase of the evanescent field.

References Cited (Backward Citations)

US4660980A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2000-09-08 2001-03-10 2001-09-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2004-09-08 2005-03-10 2005-09-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2008-09-08 2009-03-10 2009-09-09 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag