Multiple model supervisor control system and method of operation

Claim 2

A multiple model supervisor control system for use in a manufacturing environment including a plurality of model based statistical process control units associated with equipment, the multiple model supervisor control system comprising: a database which stores model coefficient shift data received from a plurality of model based statistical process control units, the coefficient shift data representing statistically significant drifts in output measurables that are associated with the model based statistical process control units; a supervisor control unit coupled to the database, the supervisor control unit operable to access the coefficient shift data stored in the database; a multiple model map of coefficient shift history generated by the supervisor control unit, the multiple model map showing a history of the coefficient shift data for the equipment against a common domain; and a user interface coupled to the supervisor control unit, the user interface operable to provide user access to the multiple model map of coefficient shift history to allow identification of problems caused by equipment drift and problems caused by environmental change.

Claim 3

The multiple model supervisor control system of claim 1, further comprising an expert system operable to access the multiple model map of coefficient shift history and to automatically identify problems and previously unidentified problems.

Claim 4

The multiple model supervisor control system of claim 1, further comprising: a pattern database comprising patterns identified as indicating specified problems; and an expert system operable to access pattern database and the multiple model map of coefficient shift history and to automatically identify problems by matching to patterns in the pattern database.

Claim 5

The multiple model supervisor control system of claim 1, wherein the common domain comprises time.

Claim 6

The multiple model supervisor control system of claim 1, wherein the common domain comprises events.

Claim 7

The multiple model supervisor control system of claim 1, wherein the common domain comprises accumulated parameters.

Claim 8

The multiple model supervisor control system of claim 1, wherein the supervisor control unit is further operable to generate a multiple model map automatically after coefficient shift data is received by the database.

Claim 9

The multiple model supervisor control system of claim 1, wherein the supervisor control unit is further operable to generate a multiple model map automatically at a specified time.

Claim 10

A manufacturing environment, comprising: a plurality of pieces of equipment each operable to produce a product and to provide equipment control settings data; a plurality of model based statistical process control units, each model based statistical process control unit associated with one of the plurality of pieces of equipment, the model based statistical process control units operable to receive the equipment control settings data and to receive material measurements data and the model based statistical process control units operable to provide control data for associated equipment and to provide coefficient shift data representing statistically significant drifts in associated output measurables; a database storing model coefficient shift data received from the plurality of model based statistical process control units; a supervisor control unit coupled to the database, the supervisor control unit operable to access the coefficient shift data stored in the database and to receive domain information; a multiple model map of coefficient shift history generated by the supervisor control unit, the multiple model map showing a history of the coefficient shift data for each of the plurality of models against a common domain; and a user interface coupled to the supervisor control unit, the user interface operable to provide user access to the multiple model map of coefficient shift history to allow identification of problems caused by machine drift and problems caused by environmental change.

Claim 11

A manufacturing environment, comprising: a plurality of pieces of equipment each operable to produce a product and to provide equipment control settings data; a plurality of model based statistical process control units, each model based statistical process control unit associated with one of the plurality of pieces of equipment, the model based statistical process control units operable to receive the equipment control settings data and to receive material measurements data and the model based statistical process control units operable to provide control data for associated equipment and to provide coefficient shift data representing statistically significant drifts in associated output measurables; a database storing model coefficient shift data received from the plurality of model based statistical process control units; a supervisor control unit coupled to the database, the supervisor control unit operable to access the coefficient shift data stored in the database and to receive domain information; a multiple model map of coefficient shift history generated by the supervisor control unit, the multiple model map showing a history of the coefficient shift data for each of the plurality of models against a common domain; and a user interface coupled to the supervisor control unit, the user interface operable to provide user access to the multiple model map of coefficient shift history to allow identification of problems caused by machine drift and problems caused by environmental change.

Claim 12

The manufacturing environment of claim 9, further comprising an expert system operable to access the multiple model map of coefficient shift history and to automatically identify problems and prior unknown patterns.

Claim 13

The manufacturing environment of claim 9, further comprising: a pattern database comprising patterns identified as indicating specified problems; and an expert system operable to access pattern database and the multiple model map of coefficient shift history and to automatically identify problems by matching to patterns in the pattern database.

Claim 14

The manufacturing environment of claim 9, wherein the supervisor control unit is further operable to generate a multiple model map automatically after coefficient shift data is received by the database.

Claim 15

The manufacturing environment of claim 9, wherein the supervisor control unit is further operable to generate a multiple model map automatically at a specified time.

Claim 18

The method of claim 14, wherein analyzing the multiple model map of coefficient shift history is accomplished by an expert system to automatically identify problems and new patterns.

Claim 19

The method of claim 14, further comprising providing a pattern database comprising patterns identified as indicating specified problems, and wherein analyzing the multiple model map of coefficient shift history is accomplished by an expert system to automatically identify problems by matching to patterns in the pattern database.

Claim 20

The method of claim 14, wherein generating a multiple model map uses time as the common domain.

Claim 21

The method of claim 14, wherein generating a multiple model map uses events as the common domain.

Claim 22

The method of claim 14, wherein generating a multiple model map uses parameter accumulation as the common domain.

Claim 23

The method of claim 14, wherein generating the multiple model map is accomplished automatically after coefficient shift data is received in the step of creating.