Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
179 words
A continuous scale optical proximity correction mask maker system comprising: a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; an optical proximity correction (OPC) engine receiving said CAD data file and accessing said source of distortion knowledge, said OPC engine fracturing the CAD data file into a plurality of subsets of data described by unique data level names and retaining original design grid increment and allowing for hierarchy retention and prevention of data volume increases, said OPC engine assigning a specific dose to each data level in a manner that allows for a continuous scale of compensation increments for correction of image distortion; and a mask data generator receiving said plurality of subsets of data and doses for each data level and generating a compensated mask data set.
Claim 2
Dependent Claim
179 words
A continuous scale optical proximity correction mask maker system comprising: a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; an optical proximity correction (OPC) engine receiving said CAD data file and accessing said source of distortion knowledge, said OPC engine fracturing the CAD data file into a plurality of subsets of data described by unique data level names and retaining original design grid increment and allowing for hierarchy retention and prevention of data volume increases, said OPC engine assigning a specific dose to each data level in a manner that allows for a continuous scale of compensation increments for correction of image distortion; and a mask data generator receiving said plurality of subsets of data and doses for each data level and generating a compensated mask data set.
Claim 3
Dependent Claim
31 words
A continuous scale optical proximity correction mask maker as recited in claim 1 wherein the OPC engine is a rules-based system and said source of distortion knowledge is a lookup table.
Claim 4
Dependent Claim
31 words
A continuous scale optical proximity correction mask maker as recited in claim 1 wherein the OPC engine is a convolution-based system and said source of distortion knowledge is a convolution function.
Claim 5
Dependent Claim
166 words
A continuous scale optical proximity correction mask maker system comprising: a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; an optical proximity correction (OPC) engine receiving said CAD data file and accessing said source of distortion knowledge, said OPC engine generating a mapped attribute file defining a hierarchical dose offset matching the CAD data file; and a mask data generator receiving said CAD data file and said attribute file and mapping a mask exposure level defined at a nominal dose for a given exposure system and patterning material and modified during exposure based on the mapped attribute file in a manner that allows for a continuous scale of compensation increments for correction of image distortion.
Claim 6
Dependent Claim
166 words
A continuous scale optical proximity correction mask maker system comprising: a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; an optical proximity correction (OPC) engine receiving said CAD data file and accessing said source of distortion knowledge, said OPC engine generating a mapped attribute file defining a hierarchical dose offset matching the CAD data file; and a mask data generator receiving said CAD data file and said attribute file and mapping a mask exposure level defined at a nominal dose for a given exposure system and patterning material and modified during exposure based on the mapped attribute file in a manner that allows for a continuous scale of compensation increments for correction of image distortion.
Claim 7
Dependent Claim
31 words
A continuous scale optical proximity correction mask maker as recited in claim 4 wherein the OPC engine is a rules-based system and said source of distortion knowledge is a lookup table.
Claim 8
Dependent Claim
31 words
A continuous scale optical proximity correction mask maker as recited in claim 4 wherein the OPC engine is a convolution-based system and said source of distortion knowledge is a convolution function.
Claim 9
Independent Claim
175 words
A method of generating a continuous scale optical proximity correction in a mask maker system comprising the steps of: generating a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; generating a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; receiving said CAD data file and fracturing the CAD data file into a plurality of subsets of data described by unique data level names and retaining original design grid increment and allowing for hierarchy retention and prevention of data volume increases; accessing said source of distortion knowledge and assigning a specific dose to each data level in a manner that allows for a continuous scale of compensation increments for correction of image distortion; and receiving said plurality of subsets of data and doses for each data level and generating a compensated mask data set.
Claim 10
Independent Claim
175 words
A method of generating a continuous scale optical proximity correction in a mask maker system comprising the steps of: generating a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; generating a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; receiving said CAD data file and fracturing the CAD data file into a plurality of subsets of data described by unique data level names and retaining original design grid increment and allowing for hierarchy retention and prevention of data volume increases; accessing said source of distortion knowledge and assigning a specific dose to each data level in a manner that allows for a continuous scale of compensation increments for correction of image distortion; and receiving said plurality of subsets of data and doses for each data level and generating a compensated mask data set.
Claim 11
Independent Claim
165 words
A method of generating a continuous scale optical proximity correction in a mask maker system comprising the steps of: generating a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; generating a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; receiving said CAD data file and accessing said source of distortion knowledge to generate a mapped attribute file defining a hierarchical dose offset matching the CAD data file; and receiving said CAD data file and said attribute file and mapping a mask exposure level defined at a nominal dose for a given exposure system and patterning material and modified during exposure based on the mapped attribute file in a manner that allows for a continuous scale of compensation increments for correction of image distortion.
Claim 12
Independent Claim
165 words
A method of generating a continuous scale optical proximity correction in a mask maker system comprising the steps of: generating a computer aided design (CAD) data file of a pattern to be optically formed and replicated on a substrate; generating a source of distortion knowledge generated based on feature analysis of the pattern, features of the pattern being analyzed based on varying dimensions, distance to nearest neighbor, etch loading environments, or any pattern transfer parameter which effects a specific shape's character; receiving said CAD data file and accessing said source of distortion knowledge to generate a mapped attribute file defining a hierarchical dose offset matching the CAD data file; and receiving said CAD data file and said attribute file and mapping a mask exposure level defined at a nominal dose for a given exposure system and patterning material and modified during exposure based on the mapped attribute file in a manner that allows for a continuous scale of compensation increments for correction of image distortion.