Abstract A probe head includes analog amplifier inputs, a ground plane, and hundreds of probe leads between the inputs and the pins of a circuit under test. The customer defines the grounded pins of the circuit under test. Non-active probe leads, i.e. leads corresponding to the grounded pins are connected to the ground plane, maximizing the connections between the grounds of the probe and the circuit under test and minimizing unequal ground potentials. The probe circuit is on a probe circuit board, while the connections between the ground plane and the leads are fusible elements on a separate ground personality board. The probe is placed on a simulated circuit under test, the grounded pins on the circuit under test are protected by an insulating cap, and a voltage is placed on the remainder of the pins to fuse the elements corresponding the active probe leads.
An analog voltage probe comprising: a probe circuit board having an analog probe circuit including a plurality of probe input leads and a probe ground; a ground personality circuit board having a ground personality circuit comprising: a plurality of electrical conductors and a ground element, each of said conductors including a terminal adapted to be electrically connected to a circuit under test, and selected ones of said conductors electrically connected to said ground element; and an electrical connector connecting each of said electrical conductors to one of said probe input leads and said ground element to said probe ground.
Claim 2
Dependent Claim
99 words
An analog voltage probe comprising: a probe circuit board having an analog probe circuit including a plurality of probe input leads and a probe ground; a ground personality circuit board having a ground personality circuit comprising: a plurality of electrical conductors and a ground element, each of said conductors including a terminal adapted to be electrically connected to a circuit under test, and selected ones of said conductors electrically connected to said ground element; and an electrical connector connecting each of said electrical conductors to one of said probe input leads and said ground element to said probe ground.
Claim 3
Dependent Claim
53 words
An analog voltage probe as in claim 1 wherein each of said terminals is adapted to be connected to one of the pins of said circuit under test, and said selected ones of said conductors are those corresponding to the pins of said circuit under test that are connected to the device ground.
Claim 4
Dependent Claim
28 words
An analog voltage probe as in claim 1 wherein said electrical connector comprises an elastomer element compressible between said probe circuit board and said ground personality circuit board.
Claim 5
Dependent Claim
29 words
An analog voltage probe as in claim 1 wherein said ground personality circuit board includes a fusible element connecting said selected ones of said conductors to said ground element.