Method of producing cylindrical storage node of capacitor on semiconductor substrate

Claim 1

A method of producing a cylindrical storage node of a capacitor on a semiconductor substrate, the method comprising the steps of: (a) forming a first conductor layer, which becomes a base part of the storage node, on the substrate; (b) forming a sacrificing layer over the first conductor layer; (c) overlaying the sacrificing layer with a positive resist layer for electron beam lithography which undergoes a reversal to negative and becomes undissolvable by a slight overexposure; (d) exposing the positive resist layer to an electron beam in a circular area above the first conductor layer to perform a slight overexposure in a major region of the circular area and a proper exposure only in a peripheral region of the circular area; (e) developing the resist layer to thereby form a cylindrical slit in the resist layer in the peripheral region of said circular area; (f) etching said sacrificing layer by using the remaining resist layer as mask to thereby form a cylindrical slit in the sacrificing layer under the cylindrical slit in the resist layer and thereafter removing the resist layer; (g) depositing a second conductor layer on the sacrificing layer to fill said cylindrical slit in the sacrificing layer with the deposited conductor; and (h) etching the second conductor layer until the upper surface of the sacrificing layer is exposed and removing the sacrificing layer, whereby the conductor in said cylindrical slit in the sacrificing layer appears as a hollow cylinder standing on said first conductor layer.

Claim 2

A method of producing a cylindrical storage node of a capacitor on a semiconductor substrate, the method comprising the steps of: (a) forming a first conductor layer, which becomes a base part of the storage node, on the substrate; (b) forming a sacrificing layer over the first conductor layer; (c) overlaying the sacrificing layer with a positive resist layer for electron beam lithography which undergoes a reversal to negative and becomes undissolvable by a slight overexposure; (d) exposing the positive resist layer to an electron beam in a circular area above the first conductor layer to perform a slight overexposure in a major region of the circular area and a proper exposure only in a peripheral region of the circular area; (e) developing the resist layer to thereby form a cylindrical slit in the resist layer in the peripheral region of said circular area; (f) etching said sacrificing layer by using the remaining resist layer as mask to thereby form a cylindrical slit in the sacrificing layer under the cylindrical slit in the resist layer and thereafter removing the resist layer; (g) depositing a second conductor layer on the sacrificing layer to fill said cylindrical slit in the sacrificing layer with the deposited conductor; and (h) etching the second conductor layer until the upper surface of the sacrificing layer is exposed and removing the sacrificing layer, whereby the conductor in said cylindrical slit in the sacrificing layer appears as a hollow cylinder standing on said first conductor layer.

Claim 5

A method of producing a cylindrical storage node of a capacitor on a semiconductor substrate, the storage node having at least two concentrically cylindrical parts, the method comprising the steps of: (a) forming a first conductor layer, which becomes a base part of the storage node, on the substrate; (b) forming a sacrificing layer over the first conductor layer; (c) overlaying the sacrificing layer with a positive resist for electron beam lithography which undergoes a reversal to negative and becomes dissolvable by a slight overexposure; (d) exposing the positive resist layer to an electron beam in a first circular area above the first conductor layer to perform a slight overexposure in the major region of the circular area and a proper exposure only in a peripheral region of said circular area; (e) developing the resist layer to thereby form a first cylindrical slit in the resist layer in the peripheral region of said circular area; (f) again exposing the resist layer to an electron beam in a second circular area, which is concentrical with and wider than said first circular area, to perform a slight overexposure in a major region of the second circular area and a proper exposure only in a peripheral region of the second circular area; (g) again developing the resist layer to thereby form a second cylindrical slit in the resist layer in the peripheral region of said second circular area; (h) etching said sacrificing layer by using the remaining resist layer as mask to thereby form two concentrically cylindrical slits in the sacrificing layer under the first and second cylindrical slits in the resist layer; (i) removing the resist layer; (j) depositing a second conductor layer on the sacrificing layer to fill said two concentrically cylindrical slits in the sacrificing layer with the deposited conductor; and (k) etching the second conductor layer until the upper surface of the sacrificing layer is exposed and removing the sacrificing layer, whereby the conductor in said two concentrically cylindrical slits in the sacrificing layer appear as two hollow cylinders concentrically standing on said first conductor layer.

Claim 6

A method of producing a cylindrical storage node of a capacitor on a semiconductor substrate, the storage node having at least two concentrically cylindrical parts, the method comprising the steps of: (a) forming a first conductor layer, which becomes a base part of the storage node, on the substrate; (b) forming a sacrificing layer over the first conductor layer; (c) overlaying the sacrificing layer with a positive resist for electron beam lithography which undergoes a reversal to negative and becomes dissolvable by a slight overexposure; (d) exposing the positive resist layer to an electron beam in a first circular area above the first conductor layer to perform a slight overexposure in the major region of the circular area and a proper exposure only in a peripheral region of said circular area; (e) developing the resist layer to thereby form a first cylindrical slit in the resist layer in the peripheral region of said circular area; (f) again exposing the resist layer to an electron beam in a second circular area, which is concentrical with and wider than said first circular area, to perform a slight overexposure in a major region of the second circular area and a proper exposure only in a peripheral region of the second circular area; (g) again developing the resist layer to thereby form a second cylindrical slit in the resist layer in the peripheral region of said second circular area; (h) etching said sacrificing layer by using the remaining resist layer as mask to thereby form two concentrically cylindrical slits in the sacrificing layer under the first and second cylindrical slits in the resist layer; (i) removing the resist layer; (j) depositing a second conductor layer on the sacrificing layer to fill said two concentrically cylindrical slits in the sacrificing layer with the deposited conductor; and (k) etching the second conductor layer until the upper surface of the sacrificing layer is exposed and removing the sacrificing layer, whereby the conductor in said two concentrically cylindrical slits in the sacrificing layer appear as two hollow cylinders concentrically standing on said first conductor layer.