US5596283A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Continuous motion electrical circuit interconnect test method and apparatus
Assignee: Samsung Electronics Co Ltd
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Filing: 1995-12-19
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Granted: 1997-01-21
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Expires: 2015-12-19
Abstract
Abstract Electrical test method and apparatus for performing the method. The method operates to determine an electrical characteristic of a node (2) disposed upon a surface of a substrate (3), such as a printed wiring board (PWB). The method includes a first step of providing relative motion between a probe (1) and the surface of the PWB. A second step measures the electrical characteristic during a time that there is relative motion between the probe and the surface of the PWB. In one embodiment of the invention the step of measuring measures capacitance while in another embodiment of the invention the step of measuring measures charge capacity. The step of providing relative motion, in one embodiment of the invention, includes the steps of maintaining the PWB stationary while linearly translating the probe over the surface. In another embodiment of the invention the step of providing relative motion includes the steps of maintaining the probe stationary while moving the PWB.
Inventors
- 👤 Richard I. Mellitz
- 👤 Michael V. Dowd
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 20:01
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2801; G01R31/2806; G01R31/2808
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
148 words
Test apparatus for determining an electrical characteristic of a node disposed upon a surface of a printed wiring board (PWB) substrate comprising: contact probe means; means for providing continuous contact and relative omnidirectional motion between the probe means and the surface of the PWB substrate having a plurality of individual nodes disposed upon its surface; position synchronization means for determining when the probe means is contacting an individual node of said plurality of nodes while there is continuous relative motion between the probe means and the surface of the substrate; means, coupled to the probe means and responsive to the position synchronization means, for measuring an electrical characteristic of an individual node of the plurality of individual nodes, said electrical characteristic being measured for said individual node of the plurality of nodes when the position synchronization means indicates that said individual node is being contacted by the probe.
Claim 2
Dependent Claim
148 words
Test apparatus for determining an electrical characteristic of a node disposed upon a surface of a printed wiring board (PWB) substrate comprising: contact probe means; means for providing continuous contact and relative omnidirectional motion between the probe means and the surface of the PWB substrate having a plurality of individual nodes disposed upon its surface; position synchronization means for determining when the probe means is contacting an individual node of said plurality of nodes while there is continuous relative motion between the probe means and the surface of the substrate; means, coupled to the probe means and responsive to the position synchronization means, for measuring an electrical characteristic of an individual node of the plurality of individual nodes, said electrical characteristic being measured for said individual node of the plurality of nodes when the position synchronization means indicates that said individual node is being contacted by the probe.
Claim 3
Dependent Claim
13 words
Apparatus as set forth in claim 1 wherein the measuring means measures capacitance.
Claim 4
Dependent Claim
14 words
Apparatus as set forth in claim 1 wherein the measuring means measures charge capacity.
Claim 5
Dependent Claim
26 words
Apparatus as set forth in claim 1 wherein the substrate is stationary and wherein the relative motion providing means translates the probe means during a measurement.
Claim 6
Dependent Claim
24 words
Apparatus as set forth in claim 1 wherein the probe means is stationary and wherein the relative motion providing means translates the substrate means.
Claim 7
Dependent Claim
60 words
Apparatus as set forth in claim 1 and further comprising: means for storing a reference value for the electrical characteristic; and means, having a first input coupled to an output of the measuring means and a second input coupled to an output of the storing means, for comparing a measured value of the electrical characteristic to the stored reference value.
Claim 8
Dependent Claim
25 words
Apparatus as set forth in claim 1 and further comprising means for repositioning the probe means from one location to another location upon the substrate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-01-21 | 2000-07-22 | 2001-01-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-01-21 | 2004-07-22 | 2005-01-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-01-21 | 2008-07-22 | 2009-01-21 | $7700.00 | Window Closed / Lapsed |