US5583634A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for elementary analysis by optical emission spectrometry on plasma produced by a laser in the presence of argon
Assignee: Commissariat à l'Énergie Atomique et Aux Énergies Alternatives
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Filing: 1994-11-10
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Granted: 1996-12-10
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Expires: 2014-11-10
Abstract
Abstract A process for simultaneously blowing a gas jet onto a sample 6 to be analyzed and subsequently focusing a laser beam 4 onto the sample so as to produce a plasma 12 on the surface of the sample. An analysis is made of the spectrum S' of the light radiation emitted by the plasma and this spectrum analysis provides the basis for determining the composition of the isotopic composition of the sample.
Inventors
- 👤 Nadine Andre
- 👤 Patrick Mauchien
- 👤 Alexandre Semerok
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 04:34
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/62; G01N21/71; G01N21/718
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
88 words
Process for the elementary analysis of a sample, characterized in that, in a natural atmosphere, it consists of simultaneously blowing an argon gas jet onto the sample with a flow rate of approximately 3 l/mn to be analyzed and focusing a laser beam onto said sample to be analyzed, so as to produce a plasma on the surface of said sample, analyzing a spectrum, (S') of the light radiation emitted by the plasma and determining, on the basis of said spectrum analysis, the elementary composition of the sample.
Claim 2
Dependent Claim
88 words
Process for the elementary analysis of a sample, characterized in that, in a natural atmosphere, it consists of simultaneously blowing an argon gas jet onto the sample with a flow rate of approximately 3 l/mn to be analyzed and focusing a laser beam onto said sample to be analyzed, so as to produce a plasma on the surface of said sample, analyzing a spectrum, (S') of the light radiation emitted by the plasma and determining, on the basis of said spectrum analysis, the elementary composition of the sample.
Claim 3
Dependent Claim
29 words
Process according to claim 1, characterized in that the gas jet blown onto the sample has a diameter larger than that of the plasma obtained on the sample surface.
Claim 4
Dependent Claim
25 words
Process according to claim 1, characterized in that the laser beam forms on the sample a focal spot with a diameter of approximately 10 μm.
References Cited (Backward Citations)
US4645342A
Cited
JPH02254345A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-12-10 | 2000-06-10 | 2000-12-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-12-10 | 2004-06-10 | 2004-12-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-12-10 | 2008-06-10 | 2008-12-10 | $7700.00 | Window Closed / Lapsed |