Coaxial double-headed spring contact probe assembly

Claim 2

A double-headed spring contact probe for loaded board testing, comprising: a barrel having a hollow interior; a pair of opposite plungers positioned and axialy slidable and rotatable in said barrel and outwardly biased against each other, said plungers having outer portions extending through respective opposite open ends of the barrel, each plunger terminating in a contact tip outside the barrel, a first one of said plungers having a hollow receptacle extending into the barrel with a keyway opening into the receptacle, the other plunger having a twisted guide member extending through the barrel into the keyway of the first plunger, wherein axial translation of the plungers relative to each other causes a rotation of the contact tips relative to each other, and a bias device biasing said plungers.

Claim 3

A double-headed spring contact probe for loaded board testing, comprising: a barrel; first and second plungers housed by said barrel, having respective first and second contact tips, said first and second contact tips axially sliding and rotating relative to each other; and bias means for outwardly biasing said first and second plungers.

Claim 4

A double-headed spring contact probe for loaded board testing, comprising: a barrel; first and second plungers housed by said barrel, having respective first and second contact tips, said first and second contact tips axially sliding and rotating relative to each other; and bias means for outwardly biasing said first and second plungers.

Claim 5

The electrical probe assembly according to claim 2, wherein said barrel includes first and second opposite ends have restricted apertures for limiting axial travel of said first and second plungers.

Claim 6

The electrical probe assembly according to claim 2, wherein a spiral channel is formed along a length of one of said first and second plungers, and a bearing surface is formed by a wall of said spiral channel.

Claim 7

The electrical probe assembly according to claim 2, wherein one of said first and second plungers includes an aperture with a keyway, and another of said first and second plungers comprises a cylindrical solid member having a helical channel forming a bearing surface for engaging said keyway.

Claim 8

The electrical probe assembly according to claim 5, wherein said helical channel subtends a radial angle of between 90 and 150 degrees over a length of the another of said first and second plungers.

Claim 9

The electrical probe assembly according to claim 5, wherein said helical channel subtends a radial angle of between 115 and 125 degrees over a length of the another of said first and second plungers.

Claim 10

The electrical probe assembly according to claim 5, wherein said helical channel subtends a radial angle of approximately 120 degrees over a length of the another of said first and second plungers.

Claim 11

The electrical probe assembly according to claim 5, further comprising another helical channel formed opposite said helical channel in said cylindrical solid member.

Claim 12

The electrical test probe assembly according to claim 5, wherein said keyway is of a geometric shape.

Claim 13

The electrical test probe assembly according to claim 10, wherein said geometric-shaped keyway is a regular polygon.

Claim 14

The electrical test probe assembly according to claim 10, wherein said geometric-shaped keyway includes radially extending tabs engaging said helical channel.

Claim 15

The electrical test probe assembly according to claim 5, wherein said barrel includes a collar portion for longitudinal retention of said barrel in a mounting member.

Claim 16

The electrical test probe assembly according to claim 5, wherein said first and second plungers are free to rotate within said barrel.

Claim 17

The electrical test probe assembly according to claim 5, wherein said barrel has necked down portions at opposite ends thereof to limit travel of said first and second plungers.

Claim 18

The electrical test probe assembly according to claim 2, wherein one of said first and second plungers includes an aperture with a keyway, and another of said first and second plungers comprises a guide member for engagement with said keyway.

Claim 19

The electrical test probe assembly according to claim 16, wherein said guide member comprises a rod having a plurality of outer bearing surfaces for engaging said keyway, said rod being twisted about it axis.

Claim 20

The electrical test probe assembly according to claim 16, wherein said guide member is twisted about it axis through an angle of between 90 and 150 degrees from one end to another end of a portion of said guide member and is engageable with said keyway.

Claim 21

The electrical test probe assembly according to claim 16, wherein said guide member is twisted about it axis through an angle of approximately 120 degrees from one end to another end of a portion of said guide member and is engageable with said keyway.

Claim 22

The electrical test probe assembly according to claim 16, wherein said guide member comprises a cylindrical rod having opposing helical channels formed in an outer surface of said cylindrical rod along the length of said cylindrical rod.

Claim 23

The electrical test probe assembly according to claim 20, wherein said cylindrical rod has a rounded free end.

Claim 24

An electrical interface board, comprising: a frame including a first plate, said frame is positioned on a personality board, and includes a lower surface having a gasket, and the gasket provides a compressible air seal between said frame and the personality board; and a plurality of double-headed probe assemblies extending axially through said first plate, each of said double-headed probe assemblies including (i) a housing having first and second opposite open ends, (iii) a first plunger partially .positioned within said housing, said first plunger having a first portion extending out from said housing through said first open end and terminating in a first electrical contact probe, (iii) a second plunger partially positioned within said housing, said second plunger having a first portion extending out from said housing through said second open end and terminating in a second electrical contact probe, and (iv) a compression spring positioned within said housing, axially biasing said first and second plungers outward from said housing, wherein each of said first plungers further include a rod-like second portion, lengthwise contiguous with said first portion, positioned within respective housing, said second portion having a bearing surface for transmitting a torque, and each of said second plungers further include a tubular second portion, lengthwise contiguous with said first portion, positioned within said respective housing with said second portion of said first plunger positioned within said second portion of said second plunger, said second portion of said second plunger having an aperture for engaging said bearing surface of said first plunger, said first and second plungers being free to rotate within said housings and axially sliding and rotating the first and second electrical contact probes relative to each other.

Claim 25

An electrical interface board, comprising: a frame including a first plate, said frame is positioned on a personality board, and includes a lower surface having a gasket, and the gasket provides a compressible air seal between said frame and the personality board; and a plurality of double-headed probe assemblies extending axially through said first plate, each of said double-headed probe assemblies including (i) a housing having first and second opposite open ends, (iii) a first plunger partially .positioned within said housing, said first plunger having a first portion extending out from said housing through said first open end and terminating in a first electrical contact probe, (iii) a second plunger partially positioned within said housing, said second plunger having a first portion extending out from said housing through said second open end and terminating in a second electrical contact probe, and (iv) a compression spring positioned within said housing, axially biasing said first and second plungers outward from said housing, wherein each of said first plungers further include a rod-like second portion, lengthwise contiguous with said first portion, positioned within respective housing, said second portion having a bearing surface for transmitting a torque, and each of said second plungers further include a tubular second portion, lengthwise contiguous with said first portion, positioned within said respective housing with said second portion of said first plunger positioned within said second portion of said second plunger, said second portion of said second plunger having an aperture for engaging said bearing surface of said first plunger, said first and second plungers being free to rotate within said housings and axially sliding and rotating the first and second electrical contact probes relative to each other.

Claim 26

The electrical interface board according to claim 22, wherein said shoulder portion each comprise a pair of retaining rings formed spaced along a length of a respective housing, said retaining rings positioned between said first and second plates.

Claim 27

An electrical interface board, comprising: a frame including a first plate, said frame is positioned on a personality board, and includes a lower surface having a gasket, and the gasket provides a compressible air seal between said frame and the personality board, said frame further including a second plate positioned parallel to said first plate, said first and second plates having pairs of aligned through-holes wherein opposite ends of each of said double-headed probe assemblies extend through a respective pair of said through-holes; and a plurality of double-headed probe assemblies extending axially through said first plate, each of said double-headed probe assemblies including (i) a housing having first and second opposite open ends, (ii) a first plunger partially positioned within said housing, said first plunger having a first portion extending out from said housing through said first open end and terminating in a first electrical contact probe, (iii) a second plunger partially positioned within said housing, said second plunger having a first portion extending out from said housing through said second open end and terminating in a second electrical contact probe, and (iv) a compression spring positioned within said housing, axially biasing said first and second plungers outward from said housing, wherein each of said first plungers further include a rod-like second portion, lengthwise contiguous with said first portion, positioned within a respective housing, said second portion having a bearing surface for transmitting a torque, and each of said second plungers further include a tubular second portion, lengthwise contiguous with first portion of a respective second plunger, positioned within said respective housing with said second portion of said first plunger positioned within said second portion of said second plunger, said second portion of said second plunger having an aperture for engaging said bearing surface of said first plunger, said first and second plungers being free to rotate within said housings and axially sliding and rotating the first and second electrical contact probes relative to each other.

Claim 28

An electrical interface board, comprising: a frame including a first plate, said frame is positioned on a personality board, and includes a lower surface having a gasket, and the gasket provides a compressible air seal between said frame and the personality board, said frame further including a second plate positioned parallel to said first plate, said first and second plates having pairs of aligned through-holes wherein opposite ends of each of said double-headed probe assemblies extend through a respective pair of said through-holes; and a plurality of double-headed probe assemblies extending axially through said first plate, each of said double-headed probe assemblies including (i) a housing having first and second opposite open ends, (ii) a first plunger partially positioned within said housing, said first plunger having a first portion extending out from said housing through said first open end and terminating in a first electrical contact probe, (iii) a second plunger partially positioned within said housing, said second plunger having a first portion extending out from said housing through said second open end and terminating in a second electrical contact probe, and (iv) a compression spring positioned within said housing, axially biasing said first and second plungers outward from said housing, wherein each of said first plungers further include a rod-like second portion, lengthwise contiguous with said first portion, positioned within a respective housing, said second portion having a bearing surface for transmitting a torque, and each of said second plungers further include a tubular second portion, lengthwise contiguous with first portion of a respective second plunger, positioned within said respective housing with said second portion of said first plunger positioned within said second portion of said second plunger, said second portion of said second plunger having an aperture for engaging said bearing surface of said first plunger, said first and second plungers being free to rotate within said housings and axially sliding and rotating the first and second electrical contact probes relative to each other.

Claim 29

The electrical interface board according to claim 24, wherein said housing of each of said doubled-headed probe assemblies include a shoulder portion having an outer diameter greater than an inner diameter of said through-holes wherein said double-headed probe assemblies are maintained between said first and second plates by said shoulder portions.

Claim 30

A double-headed spring contact probe for loaded board testing, comprising: a barrel; first and second plungers housed by said barrel, having respective first and second contact tips, said first and second contact tips axially sliding and rotating relative to each other; and a bias device biasing said first and second plungers.

Claim 31

A double-headed spring contact probe for loaded board testing, comprising: a barrel; first and second plungers housed by said barrel, having respective first and second contact tips, said first and second contact tips axially sliding and rotating relative to each other; and a bias device biasing said first and second plungers.

Claim 32

The electrical probe assembly according to claim 26, wherein said barrel includes first and second opposite ends have restricted apertures for limiting axial travel of said first and second plungers.

Claim 33

The electrical probe assembly according to claim 26, wherein a spiral channel is formed along a length of one of said first and second plungers, and a bearing surface is formed by a wall of said spiral channel.

Claim 34

The electrical probe assembly according to claim 26, wherein one of said first and second plungers includes an aperture with a keyway, and another of said first and second plungers comprises a cylindrical solid member having a helical channel 5forming a bearing surface for engaging said keyway.

Claim 35

The electrical probe assembly according to claim 29, wherein said helical channel subtends a radial angle of between 90 and 150 degrees over a length of the another of said first and second plungers.

Claim 36

The electrical probe assembly according to claim 29, wherein said helical channel subtends a radial angle of between 115 and 125 degrees over a length of the another of said first and second plungers.

Claim 37

The electrical probe assembly according to claim 29, wherein said helical channel subtends a radial angle of approximately 120 degrees over a length of the another of said first and second plungers.

Claim 38

The electrical probe assembly according to claim 29, further comprising another helical channel formed opposite said helical channel in said cylindrical solid member.

Claim 39

The electrical test probe assembly according to claim 29, wherein said keyway is of a geometric shape.

Claim 40

The electrical test probe assembly according to claim 34, wherein said geometric-shaped keyway is a regular polygon.

Claim 41

The electrical test probe assembly according to claim 34, wherein said geometric-shaped keyway includes radially extending tabs engaging said helical channel.

Claim 42

The electrical test probe assembly according to claim 26, wherein said barrel includes a collar portion for longitudinal retention of said barrel in a mounting member.

Claim 43

The electrical test probe assembly according to claim 26, wherein said first and second plungers are free to rotate within said barrel.

Claim 44

The electrical test probe assembly according to claim 26, wherein said barrel has necked down portions at opposite ends thereof to limit travel of said first and second plungers.

Claim 45

The electrical test probe assembly according to claim 26, wherein one of said first and second plungers includes an aperture with a keyway, and another of said first and second plungers comprises a guide member for engagement with said keyway.

Claim 46

The electrical test probe assembly according to claim 40, wherein said guide member comprises a rod having a plurality of outer bearing surfaces for engaging said keyway, said rod being twisted about it axis.

Claim 47

The electrical test probe assembly according to claim 40, wherein said guide member is twisted about it axis through an angle of between 90 and 150 degrees from one end to another end of a portion of said guide member and is engageable with said keyway.

Claim 48

The electrical test probe assembly according to claim 40, wherein said guide member is twisted about it axis through an angle of approximately 120 degrees from one end to another end of a portion of said guide member and is engageable with said keyway.

Claim 49

The electrical test probe assembly according to claim 40, wherein said guide member comprises a cylindrical rod having opposing helical channels formed in an outer surface of said cylindrical rod along the length of said cylindrical rod.

Claim 50

The electrical test probe assembly according to claim 44, wherein said cylindrical rod has a rounded free end.