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US5565709A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Nitto Denko Corp
•
Filing: 1995-11-02
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Granted: 1996-10-15
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Expires: 2015-11-02
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Abstract

Abstract A semiconductor device comprising a semiconductor element encapsulated with a cured resin having at least two secondary differential peaks of linear thermal expansion by a thermomechanical analytical measurement, the interval between the peaks being at least 20 DEG C. The semiconductor device encapsulated with the cured resin does not cause a warp and is excellent in the TCT test characteristics and the cracking resistance.

Inventors

  • 👤 Takashi Fukushima
  • 👤 Satoshi Ito
  • 👤 Makoto Kuwamura
  • 👤 Shinya Akizuki
  • 👤 Kazuhiro Ikemura
  • 👤 Shinichiro Sudo

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 16:04
CPC Classifications
H; H10; H10W; H10W40/00; H10W40/70; H10W40/77; H10W40/778; H10W74/00; H10W74/10; H10W74/111; H10W74/114; H10W74/117; H10W72/00; H10W72/50; H10W72/551; H10W72/552; H10W90/00; H10W90/701; H10W90/751; H10W90/754; H10W90/756

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 43 words
A semiconductor device comprising a semiconductor element encapsulated with a cured resin, wherein the cured resin has at least two secondary differential peaks of linear thermal expansion by a thermomechanical analytic measurement and the interval between the peaks is at least 20° C.
Claim 2
Dependent Claim 43 words
A semiconductor device comprising a semiconductor element encapsulated with a cured resin, wherein the cured resin has at least two secondary differential peaks of linear thermal expansion by a thermomechanical analytic measurement and the interval between the peaks is at least 20° C.
Claim 3
Dependent Claim 44 words
The semiconductor device as claimed in claim 1, wherein the cured resin is a cured product of a mixture of at least two kinds of resin compositions each having a different glass transition point (Tg) with a temperature difference of at least 20° C.
Claim 4
Dependent Claim 52 words
The semiconductor device as claimed in claim 1, wherein the semiconductor element is loaded on a substrate, the semiconductor element on the substrate is encapsulated with the cured resin, and the encapsulation of the semiconductor device is a one-surface encapsulation on only the side of the substrate which loads the semiconductor element.
Claim 5
Dependent Claim 25 words
The semiconductor device as claimed in claim 1, wherein the cured resin is a cured product of an epoxy resinphenol resin curing system resin composition.
Claim 6
Dependent Claim 97 words
The semiconductor device as claimed in claim 1, wherein the cured resin is a cured resin product of a mixture of following resin composition (a) and resin composition (b), and the organic resin component concentration of the mixture of the resin composition (a) and the resin composition (b) is from 5 to 25% by weight; (a): A resin composition the cured product of which has a glass transition point (Tg) of from 170° to 250° C., (b): A resin composition the cured product of which has a glass transition point (Tg) of from 100° to 140° C.

References Cited (Backward Citations)

US5218030A Cited
US5107327A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-10-15 2000-04-15 2000-10-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-10-15 2004-04-15 2004-10-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-10-15 2008-04-15 2008-10-15 $7700.00 Window Closed / Lapsed

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