Selector circuit selecting and outputting voltage applied to one of first and second terminal in response to voltage level applied to first terminal

Claim 2

A selector circuit comprising: a first input terminal, a second input terminal, an output terminal, a first switching circuit coupled between said first input terminal and said output terminal, a second switching circuit coupled between said second input terminal and said output terminal, and a control circuit which is coupled to said second input terminal, and which (1) renders said first switching circuit conductive when a voltage at said second input terminal is smaller than a threshold voltage, and (2) renders said second switching circuit conductive when said voltage at said second input terminal is equal to or greater than said threshold voltage; wherein said first switching circuit includes a first transistor of a first channel type and a second transistor of a second channel type connected in parallel to each other, said second switching circuit includes a third transistor of said first channel type and a fourth transistor of said second channel type connected in parallel to each other, said control circuit includes (1) a first inverter having an input node coupled to said second input terminal and an output node coupled to gates of said first and fourth transistors, and (2) a second inverter having an input node coupled to said output node of said first inverter and an output node coupled to gates of said second and third transistors, and said threshold voltage is (1) a voltage equal to a threshold level of said first inverter, and (2) is independent of a voltage at said first input terminal; and wherein a voltage at said output terminal is selected by said selector circuit to be one of said voltage at said first input terminal and said voltage at said second input terminal depending on said voltage at said second input terminal.

Claim 3

The circuit as claimed in claim 1, wherein: said second input terminal is supplied with a reference voltage, and said threshold voltage is smaller than said reference voltage.

Claim 4

The circuit as claimed in claim 2, wherein said second input terminal is connected through an impedance element to a potential line receiving a potential level that is smaller than said reference voltage.

Claim 5

The circuit as claimed in claim 1, wherein said second input terminal is coupled to a reference potential line through a resistor.

Claim 6

For a semiconductor circuit having (1) a voltage generator generating a predetermined voltage at an output node, and (2) a terminal pad which is supplied with a test voltage when said semiconductor circuit is in a test mode and which is in an open state when said semiconductor circuit is in a normal operation mode, a selector circuit comprising: a first input node connected to the output node of said voltage generator, a second input node connected to said terminal pad, an output line, a first transfer gate coupled between said first input node and said output line, a second transfer gate coupled between said second input node and said output line, and a control gate coupled to said second input node, and (1) rendering said first gate conductive when said terminal pad is in said open state, and (2) rendering said second transfer gate conductive when said terminal pad is supplied with said test voltage; wherein said control gate includes a gate circuit which has a threshold level that is smaller than said test voltage, said threshold level is independent of said predetermined voltage at said first input node, said second input node is connected to a reference potential line through an impedance element, and said second input node is supplied with a potential level on said reference potential line when said terminal pad is in said open state; wherein a level at said output node is selected only by controlling a level at said second input node.

Claim 7

For a semiconductor circuit having (1) a voltage generator generating a predetermined voltage at an output node, and (2) a terminal pad which is supplied with a test voltage when said semiconductor circuit is in a test mode and which is in an open state when said semiconductor circuit is in a normal operation mode, a selector circuit comprising: a first input node connected to the output node of said voltage generator, a second input node connected to said terminal pad, an output line, a first transfer gate coupled between said first input node and said output line, a second transfer gate coupled between said second input node and said output line, and a control gate coupled to said second input node, and (1) rendering said first gate conductive when said terminal pad is in said open state, and (2) rendering said second transfer gate conductive when said terminal pad is supplied with said test voltage; wherein said control gate includes a gate circuit which has a threshold level that is smaller than said test voltage, said threshold level is independent of said predetermined voltage at said first input node, said second input node is connected to a reference potential line through an impedance element, and said second input node is supplied with a potential level on said reference potential line when said terminal pad is in said open state; wherein a level at said output node is selected only by controlling a level at said second input node.

Claim 8

A selector circuit for a semiconductor memory circuit having a memory cell array including a plurality of memory cells, an address circuit for selecting at least one of said memory cells in response to address information, a data read/write circuit for performing a data read/write operation on a selected memory cell, and a power circuit generating and supplying an internal power voltage to said memory cell array, said power circuit including a reference voltage generator generating at an output node a reference voltage and a voltage source circuit responding to said reference voltage and supplying said internal power voltage to said memory cell array, said selector circuit comprising: a first input node coupled to the output node of said reference voltage generator and a second input node coupled to a terminal pad, an impedance element coupled between said second input node and ground line, said terminal pad being supplied with a test voltage when said semiconductor memory circuit operates in a test mode and brought into a floating state when said semiconductor memory circuit operates in a normal mode so that said second input terminal is supplied with said test voltage in said test mode and with a ground voltage on said ground line in said normal mode, an output line coupled to said voltage source circuit, and circuit means responsive to a voltage at said second input node for forming (1) a first electrical path between said first input node and said output line in said normal mode, and (2) a second electrical path between said second input node and said output line in said test mode; wherein said circuit means includes a gate circuit (1) having a threshold level that is intermediate between said ground voltage and said test voltage, (2) causing a formation of said first electrical path when the voltage at said second input node does not exceed said threshold voltage, and causing a formation of said second electrical path when the voltage at said second input node exceeds said threshold voltage.

Claim 9

A selector circuit for a semiconductor memory circuit having a memory cell array including a plurality of memory cells, an address circuit for selecting at least one of said memory cells in response to address information, a data read/write circuit for performing a data read/write operation on a selected memory cell, and a power circuit generating and supplying an internal power voltage to said memory cell array, said power circuit including a reference voltage generator generating at an output node a reference voltage and a voltage source circuit responding to said reference voltage and supplying said internal power voltage to said memory cell array, said selector circuit comprising: a first input node coupled to the output node of said reference voltage generator and a second input node coupled to a terminal pad, an impedance element coupled between said second input node and ground line, said terminal pad being supplied with a test voltage when said semiconductor memory circuit operates in a test mode and brought into a floating state when said semiconductor memory circuit operates in a normal mode so that said second input terminal is supplied with said test voltage in said test mode and with a ground voltage on said ground line in said normal mode, an output line coupled to said voltage source circuit, and circuit means responsive to a voltage at said second input node for forming (1) a first electrical path between said first input node and said output line in said normal mode, and (2) a second electrical path between said second input node and said output line in said test mode; wherein said circuit means includes a gate circuit (1) having a threshold level that is intermediate between said ground voltage and said test voltage, (2) causing a formation of said first electrical path when the voltage at said second input node does not exceed said threshold voltage, and causing a formation of said second electrical path when the voltage at said second input node exceeds said threshold voltage.

Claim 10

The circuit as claimed in claim 6, wherein said gate circuit comprises an inverter.