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US5548223A Expired / Lapsed US ⏱️ 0.0 years remaining

Probe adapter for electronic device

Assignee: Tektronix Inc
•
Filing: 1995-02-16
•
Granted: 1996-08-20
•
Expires: 2015-02-16
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Abstract

Abstract An adapter for a measurement test instrument electrical probe has a flexible dielectric substrate with electrically conductive runs thereon. One end of the conductive runs has first electrical contacts with a pitch geometry corresponding to the pitch geometry of electrical contacts of an electronic device that is electrically connected to a substrate via the electrical contacts of the device. The other end of the conductive runs has second electrical contacts that have a pitch geometry compatible with the electrical probe of the measurement test instrument.

Inventors

  • 👤 Paul A. Cole
  • 👤 Emory J. Harry
  • 👤 Michael A. Wright

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 13:43
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07364; G01R1/07378; G01R1/04; G01R1/0408; G01R1/0416

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 156 words
An adapter for coupling an electrical test probe of a measurement test instrument to an electronic device having multiple electrical leads directly connected to a substrate with separation between the electrical leads defining a pitch geometry comprising a flexible dielectric substrate having electrically conductive runs formed thereon between first and second edge surfaces of the flexible substrate with one end of the runs forming first electrical contacts adjacent to the first edge surface having a pitch geometry corresponding to the pitch geometry of the electrical leads of the electronic device for connecting to the electrical leads of the device, and tabs extending from the first edge surface for engaging the electrical leads of the device for aligning the first electrical contacts with the electrical leads, the other end of the conductive runs forming second electrical contacts adjacent to the second edge surface having a pitch geometry compatible with the electrical probe of the measurement test instrument.
Claim 2
Dependent Claim 156 words
An adapter for coupling an electrical test probe of a measurement test instrument to an electronic device having multiple electrical leads directly connected to a substrate with separation between the electrical leads defining a pitch geometry comprising a flexible dielectric substrate having electrically conductive runs formed thereon between first and second edge surfaces of the flexible substrate with one end of the runs forming first electrical contacts adjacent to the first edge surface having a pitch geometry corresponding to the pitch geometry of the electrical leads of the electronic device for connecting to the electrical leads of the device, and tabs extending from the first edge surface for engaging the electrical leads of the device for aligning the first electrical contacts with the electrical leads, the other end of the conductive runs forming second electrical contacts adjacent to the second edge surface having a pitch geometry compatible with the electrical probe of the measurement test instrument.
Claim 3
Dependent Claim 64 words
The adapter as recited in claim 1 further comprising a dielectric material disposed between each of the first electrical contacts for maintaining electrical isolation between the contacts, the dielectric material between each contact having sidewalls depending from the flexible dielectric substrate and a top surface with the sidewalls extending beyond the first electrical contacts for positioning between the electrical leads of the electronic device.
Claim 4
Dependent Claim 24 words
The adapter as recited in claim 1 wherein the second electrical contacts further comprise electrically conductive pins electrically connected to the second electrical contacts.

References Cited (Backward Citations)

US3405361A Cited
US3596228A Cited
US4065717A Cited
US4636722A Cited
US4922192A Cited
US4963821A Cited
US5087877A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-08-20 2000-02-19 2000-08-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-08-20 2004-02-19 2004-08-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-08-20 2008-02-19 2008-08-20 $7700.00 Window Closed / Lapsed

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