Nonvolatile semiconductor memory device equipped with means for suppressing drain disturbance phenomenon

Claim 1

A nonvolatile semiconductor memory device comprising c sets of memory blocks each including a word lines, b bit lines, and a x b memory cell transistors arranged at intersections of said word lines and said bit lines; a plurality of source lines; a row decoder which selects one word line based on a row address; a column decoder which selects one bit line based on a column address; and a source line control circuit which selects one source line of said plurality of source lines, based on a part of said row address, wherein: each of said memory cell transistors comprises a floating gate, a control gate electrode connected to a corresponding one of said word lines, a drain electrode connected to a corresponding one of said bit lines and a source electrode connected to a corresponding one of said source lines, said row decoder supplies a first voltage to said selected one word line, based on the row address and a second voltage lower than said first voltage to other word lines, and said source line control circuit supplies a third voltage lower than said second voltage to the selected one source line and sets voltages of other source lines to be equal to the voltage of said bit line selected by said column decoder at writing operation.