US5543357A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process of manufacturing a semiconductor device by filling a via hole in an interlayered film of the device with wiring metal
Assignee: Renesas Electronics Corp
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Filing: 1994-12-08
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Granted: 1996-08-06
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Expires: 2014-12-08
Abstract
Abstract The present invention discloses a process for manufacturing a semiconductor device in which characteristics of an aluminum alloy film are prevented from deteriorating, when a titanium film is used as an under film and the aluminum alloy film is heated to fill a via hole therewith. Interlayered insulating film is formed on a first aluminum wire, and after the formation of a via hole which reaches the first aluminum wire, a titanium film and an aluminum alloy film are formed in turn by a sputtering process. Next, a silicon substrate is heated up to 450° to 500° C. to melt the aluminum alloy film, thereby filling the via hole therewith. In this case, the thickness of the titanium film is set to 10% or less of the thickness of the aluminum alloy film and at most 25 nm. In particular, in the case of the aluminum alloy film containing no silicon, the thickness of the titanium film is set to 5% or less of the thickness of the aluminum alloy film, whereby the deterioration of characteristics of the aluminum alloy film by titanium can be minimized, and the via hole can be surely filled therewith.
Inventors
- 👤 Yoshiaki Yamada
- 👤 Nobukazu Ito
- 👤 Kuniko Miyakawa
- 👤 Michiko Yamanaka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 12:59
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10W20/059; Y; Y10; Y10S; Y10S438/00; Y10S438/913
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
215 words
A process for manufacturing a semiconductor device, comprising the steps of forming a titanium film on a via hole and an interlayered insulating film through which the via hole extending to a semiconductor element or a lower wire is formed; forming an aluminum film or an aluminum alloy film at a temperature of 200° C. or lower by a sputtering process; and heating a substrate to melt the aluminum film or the aluminum alloy film, thereby filling the via hole therewith, the thickness of the titanium film being 10% or less of the thickness of the aluminum film or the aluminum alloy film and being 25 nm or less, wherein at least the step of forming the aluminum film or the aluminum alloy film and the step of heating the substrate to melt the aluminum film or the aluminum alloy film, thereby filling the via hole therewith are carried out in same vacuum atmosphere in a chamber; and wherein a step of performing a reverse sputter etching of the titanium film with argon in the same vacuum atmosphere as in the step of forming the aluminum film or the aluminum alloy film is interposed between the step of forming the titanium film and the step of forming the aluminum film or the aluminum alloy film.
Claim 2
Dependent Claim
215 words
A process for manufacturing a semiconductor device, comprising the steps of forming a titanium film on a via hole and an interlayered insulating film through which the via hole extending to a semiconductor element or a lower wire is formed; forming an aluminum film or an aluminum alloy film at a temperature of 200° C. or lower by a sputtering process; and heating a substrate to melt the aluminum film or the aluminum alloy film, thereby filling the via hole therewith, the thickness of the titanium film being 10% or less of the thickness of the aluminum film or the aluminum alloy film and being 25 nm or less, wherein at least the step of forming the aluminum film or the aluminum alloy film and the step of heating the substrate to melt the aluminum film or the aluminum alloy film, thereby filling the via hole therewith are carried out in same vacuum atmosphere in a chamber; and wherein a step of performing a reverse sputter etching of the titanium film with argon in the same vacuum atmosphere as in the step of forming the aluminum film or the aluminum alloy film is interposed between the step of forming the titanium film and the step of forming the aluminum film or the aluminum alloy film.
Claim 3
Dependent Claim
65 words
The process for manufacturing a semiconductor device according to claim 1 wherein a base pressure of the chamber, where the step of forming the aluminum film or the aluminum alloy film and the step of heating the substrate to melt the aluminum film or the aluminum alloy film and to thereby fill the via hole therewith are carried out, is lower than 10 -7 Torr.
Claim 4
Dependent Claim
39 words
The process for manufacturing a semiconductor device according to claim 1 wherein a step of forming a titanium nitride film (a TiN film) is initially carried out under the titanium film before the step of forming the titanium film.
Claim 5
Dependent Claim
41 words
The process for manufacturing a semiconductor device according to claim 1 wherein the formation of the titanium film is carried out by arranging a plate provided with many openings between a target and the substrate, and then performing a sputtering process.
Claim 6
Dependent Claim
64 words
The process for manufacturing a semiconductor device according to claim 1 wherein a base pressure of the chamber, where the step of forming the aluminum film or the aluminum alloy film and the step of heating the substrate to melt the aluminum film or the aluminum alloy film and to thereby fill the via hole therewith are carried out, is about 10 -9 Torr.
References Cited (Backward Citations)
JPH02186634A
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JPH03188267A
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US5266521A
Cited
JPH0620994A
Cited
US5371042A
Cited
US5356836A
Cited
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1999-08-06 | 2000-02-05 | 2000-08-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-08-06 | 2004-02-05 | 2004-08-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-08-06 | 2008-02-05 | 2008-08-06 | $7700.00 | Window Closed / Lapsed |