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US5542171A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of selectively releasing plastic molding material from a surface

Assignee: NXP USA Inc
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Filing: 1991-10-04
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Granted: 1996-08-06
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Expires: 2011-10-04
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Abstract

Abstract A method of making a transfer molded chip carrier. A semiconductor device (10) is first electrically and mechanically attached to a substrate (12). The substrate (12) is then treated by sputter etching so that it will provide good adhesion between the substrate and a molding compound (18) that is subsequently molded to the substrate (25). Portions of the treated substrate are then selectively contaminated in order to reduce the adhesion between these selected portions of the substrate and the molding compound. The molding compound is then formed around the semiconductor device so as to encapsulate it and also part of the surface of the substrate. Portions (20) of the transfer molded material that were molded over the selectively contaminated portions of the substrate (12) are then removed by breaking away.

Inventors

  • 👤 Frank J. Juskey
  • 👤 Anthony B. Suppelsa
  • 👤 Fadia Nounou

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 18:43
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/01; H10W74/016; B; B29; B29C; B29C45/00; B29C45/14; B29C45/14639; B29C45/14655; B29C45/14754; B29C2045/1477; B29C2045/1486; B29C2045/14868; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T29/49144; Y10T29/49146; Y10T29/49155; Y10T29/49162

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 83 words
A method of forming a transfer molded chip carrier, comprising: electrically and mechanically attaching a semiconductor device to a substrate; selectively contaminating at least a portion of the substrate in order to reduce adhesion between said portion of the substrate and a molding compound subsequently attached to the substrate; encapsulating the semiconductor device by molding a plastic molding compound onto the device and the substrate; and breaking away the plastic molding compound that is molded over said selectively contaminated portion of the substrate.
Claim 2
Independent Claim 83 words
A method of forming a transfer molded chip carrier, comprising: electrically and mechanically attaching a semiconductor device to a substrate; selectively contaminating at least a portion of the substrate in order to reduce adhesion between said portion of the substrate and a molding compound subsequently attached to the substrate; encapsulating the semiconductor device by molding a plastic molding compound onto the device and the substrate; and breaking away the plastic molding compound that is molded over said selectively contaminated portion of the substrate.
Claim 3
Dependent Claim 27 words
The method of forming a transfer molded chip carrier as described in claim 1, wherein the step of selectively contaminating comprises applying a coating of a polymer.
Claim 4
Dependent Claim 31 words
The method of forming a transfer molded chip carrier as described in claim 1, wherein the step of selectively contaminating comprises marking with a permanent ink pen, or a china marker.
Claim 5
Independent Claim 138 words
A method of forming a transfer molded chip carrier, comprising: electrically and mechanically attaching a semiconductor device to a substrate comprising a printed circuit material; sputter etching at least one surface of the substrate in order to increase adhesion between the substrate and a transfer molding compound subsequently attached to the substrate; selectively depositing a coating of a permanent ink on at least a portion of the sputter etched surface in order to reduce adhesion between the substrate surface and a transfer molding compound subsequently attached to the substrate; encapsulating the semiconductor device by transfer molding a plastic molding compound onto the sputter etched substrate surface and the semiconductor device, said plastic molding compound completely encapsulating the semiconductor device; and breaking away the plastic molding compound that is over the selectively coated portion of the sputter etched surface.
Claim 6
Independent Claim 138 words
A method of forming a transfer molded chip carrier, comprising: electrically and mechanically attaching a semiconductor device to a substrate comprising a printed circuit material; sputter etching at least one surface of the substrate in order to increase adhesion between the substrate and a transfer molding compound subsequently attached to the substrate; selectively depositing a coating of a permanent ink on at least a portion of the sputter etched surface in order to reduce adhesion between the substrate surface and a transfer molding compound subsequently attached to the substrate; encapsulating the semiconductor device by transfer molding a plastic molding compound onto the sputter etched substrate surface and the semiconductor device, said plastic molding compound completely encapsulating the semiconductor device; and breaking away the plastic molding compound that is over the selectively coated portion of the sputter etched surface.
Claim 7
Dependent Claim 33 words
The method of forming a transfer molded chip carrier as described in claim 4, wherein the step of selectively depositing a coating comprises marking with a permanent ink pen, or a china marker.
Claim 8
Independent Claim 54 words
A method of releasing a molding cavity entrance gate from a substrate surface being overmolded without damaging the substrate surface, comprising selectively contaminating the substrate surface with a carbon containing material, molding a plastic molding compound onto the substrate surface, and removing the molding cavity entrance gate by peeling it from the substrate surface.
Claim 9
Independent Claim 54 words
A method of releasing a molding cavity entrance gate from a substrate surface being overmolded without damaging the substrate surface, comprising selectively contaminating the substrate surface with a carbon containing material, molding a plastic molding compound onto the substrate surface, and removing the molding cavity entrance gate by peeling it from the substrate surface.
Claim 10
Independent Claim 59 words
A method of selectively releasing molding materials from a surface being potted without damaging the surface, comprising selectively contaminating at least a portion of the surface with a carbon containing material, potting the molding material onto the surface, and removing the potted material from the contaminated portion of the surface by peeling the potted molding material from the surface.
Claim 11
Independent Claim 59 words
A method of selectively releasing molding materials from a surface being potted without damaging the surface, comprising selectively contaminating at least a portion of the surface with a carbon containing material, potting the molding material onto the surface, and removing the potted material from the contaminated portion of the surface by peeling the potted molding material from the surface.

References Cited (Backward Citations)

US4460537A Cited
US4906311A Cited
US4795600A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-08-06 2000-02-05 2000-08-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-08-06 2004-02-05 2004-08-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-08-06 2008-02-05 2008-08-06 $7700.00 Window Closed / Lapsed

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