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US5541422A Expired / Lapsed US ⏱️ 0.0 years remaining

Tunnel diode with several permanent switching states

Assignee: NXP BV
•
Filing: 1994-12-12
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Granted: 1996-07-30
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Expires: 2014-12-12
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Abstract

Abstract The invention relates to a tunnel diode provided with two metallically conducting electrodes (1, 2) with an insulating dielectric (3) in between, which forms a barrier with a barrier level for electrons and which has a thickness such that electrons can tunnel through the barrier from the one to the other electrode. Such a tunnel diode has the disadvantage that it has no memory. In many applications it is desirable for the tunnel diode to hold a certain switching state, such as open/closed. According to the invention, the tunnel diode is characterized in that the dielectric (3) comprises a layer of a material which is ferroelectric at room temperature with a remanent polarization which influences the barrier level. It is achieved thereby that the tunnel diode has various switching states in dependence on the remanent polarization of the dielectric (3). The switching state is maintained until the polarization of the dielectric (3) changes.

Inventors

  • 👤 Ronald M. Wolf
  • 👤 Paulus W. M. Blom
  • 👤 Marcellinus P. C. M. Krijn

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 08:27
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/22; G11C11/34; G11C11/36; G11C11/38; G11C11/56; G11C11/5657; H; H10; H10B; H10B69/00; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682; H10D62/00; H10D62/10; H10D62/13; H10D62/165; H10D64/00; H10D64/60; H10D64/66; H10D64/68; H10D8/00; H10D8/70; H10N; H10N70/00; H10N70/20; H10N70/801; H10N70/821; H10N70/826; H10N70/881; H10N70/883; H10N70/8836

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 87 words
A tunnel diode comprising two metallically conducting electrodes with an insulating dielectric in between, said insulating dielectric forming a barrier with a barrier level for electrons and having a thickness such that electrons can tunnel through the barrier from the one to the other electrode at a voltage higher than a threshold voltage, characterized in that the dielectric comprises a layer of a material being ferroelectric at room temperature with a remanent polarization influencing the barrier level to achieve several switching states according to said remanent polarization.
Claim 2
Dependent Claim 87 words
A tunnel diode comprising two metallically conducting electrodes with an insulating dielectric in between, said insulating dielectric forming a barrier with a barrier level for electrons and having a thickness such that electrons can tunnel through the barrier from the one to the other electrode at a voltage higher than a threshold voltage, characterized in that the dielectric comprises a layer of a material being ferroelectric at room temperature with a remanent polarization influencing the barrier level to achieve several switching states according to said remanent polarization.
Claim 3
Dependent Claim 21 words
A tunnel diode as claimed in claim 1, wherein the thickness of the layer of ferroelectric material is below 100 Å.
Claim 4
Dependent Claim 22 words
A tunnel diode as claimed in claim 1, wherein the thickness of the layer of ferroelectric material is greater than 20 Å.
Claim 5
Dependent Claim 27 words
A tunnel diode as claimed in claim 1, wherein the direction of a greatest component of the remanent polarization is substantially perpendicular to plates of said electrodes.
Claim 6
Dependent Claim 28 words
A tunnel diode as claimed in claim 1, wherein the layer of ferroelectric material is an epitaxial layer disposed on an electrode of a monocrystalline, metallically conducting oxide.
Claim 7
Dependent Claim 17 words
A tunnel diode in claim 5, wherein the metallically conducting electrode is disposed on a monocrystalline substrate.
Claim 8
Dependent Claim 34 words
A tunnel diode as claimed in claim 1, wherein the dielectric comprises at least two layers of ferroelectric materials, each of said layers having different directions of remanent polarization and different electric switching fields.
Claim 9
Dependent Claim 66 words
A tunnel diode structure comprising a number of tunnel diodes as claimed in claim 1, said number of tunnel diodes being connected in series, characterized in that each tunnel diode comprises a layer of said ferroelectric material disposed on a first of said electrodes together with a second of said electrode disposed thereon and being a first electrode to a next tunnel diode of said number.
Claim 10
Dependent Claim 31 words
A tunnel diode as claimed in claim 8, wherein the layers of ferroelectric material comprise different ferroelectric materials which change the directions of their remanent polarization at different electric switching fields.
Claim 11
Dependent Claim 30 words
A memory element, characterized in that the memory element comprises a tunnel diode element as claimed in claim 1, in which current is measured and information is unaffected by read-out.
Claim 12
Dependent Claim 17 words
A tunnel diode as claimed in claim 8, wherein the layers of ferroelectric material have different thicknesses.
Claim 13
Dependent Claim 15 words
A tunnel diode as claimed in claim 8, wherein said number is greater than 2.

References Cited (Backward Citations)

US5206788A Cited

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