Abnormal pattern detecting apparatus pattern finding aparatus and liner pattern width calculating apparatus

Claim 2

An abnormal pattern detecting apparatus for detecting an abnormal pattern having an approximately circular pattern from a radiation image of an object, said radiation image being constituted by an image signal comprising a series of image signal components, the abnormal pattern detecting apparatus comprising: i) a first finding means including a first filter for finding a prospective abnormal pattern of an approximately circular pattern, which may appear in said radiation image, by processing said image signal representing said radiation image, ii) a second finding means including a second filter for finding a linear pattern, which may appear in said radiation image, by processing said image signal representing said radiation image, said second filter comprising means for finding a linear pattern or a linear pattern, the width and the length of which are approximately equal to each other, said linear pattern appearing in said radiation image, and iii) a judgement means for determining whether said prospective abnormal pattern is a true abnormal pattern, said judgement means comprising: a) means for selecting an enlarged prospective abnormal pattern region in an area in said radiation image, said area including both said prospective abnormal pattern and said linear pattern found by said first and second finding means, respectively, said enlarged prospective abnormal pattern region including said prospective abnormal pattern and extending to parts in the vicinity of said prospective abnormal pattern, b) means for calculating the area of said linear pattern falling within said enlarged prospective abnormal pattern region and the maximum width of said linear pattern falling within said enlarged prospective abnormal pattern region, and c) means for judging, from the area and the maximum width of said linear pattern falling within said enlarged prospective abnormal pattern region, whether said prospective abnormal pattern is or is not a true abnormal pattern.

Claim 3

An abnormal pattern detecting apparatus as defined in claim 1 wherein said means for calculating the maximum width of said linear pattern falling within said enlarged prospective abnormal pattern region comprises: means for sequentially taking a plurality of picture elements, which are located in said linear pattern falling within said enlarged prospective abnormal pattern region, as a predetermined picture element, means for calculating the width of said linear pattern falling within said enlarged prospective abnormal pattern region, which width is taken at the position at which each said predetermined picture element is located, and means for finding the maximum width from the widths, which have thus been calculated at the positions at which said predetermined picture elements are located, the width of said linear pattern falling within said enlarged prospective abnormal pattern region, which width is taken at a position at which each said predetermined picture element is located, is calculated by width calculating means comprising: (1) means for finding the intersection of each of a plurality of lines, which extend from said predetermined picture element toward edges of said radiation image such that two lines extending from said predetermined picture element in opposite directions may be grouped into a single set and a plurality of sets of lines may thus be obtained, and either one of boundary lines defining said linear pattern, (2) means for calculating the distance between each of the intersections, which have thus been found, and said predetermined picture element, (3) means for adding two distances, which have been calculated for each set of two said lines, the distance between the two intersections for each set of two said lines being thereby calculated, (4) means for finding the minimum distance from a plurality of said distances, each of which has been calculated between the two intersection for each set of two said lines, and (5) means for determining the minimum distance as the width of said linear pattern, which width is taken at the position at which said predetermined picture element is located.

Claim 4

An abnormal pattern detecting apparatus as defined in claim 1 further comprising means for storing said radiation image on a stimulable phosphor sheet.

Claim 5

An abnormal pattern detecting apparatus as defined in claim 3, further comprising means for obtaining said image signal representing said radiation image by exposing said stimulable phosphor sheet to stimulating rays, which cause said stimulable phosphor to emit light in proportion to the amount of energy stored thereon during its exposure to radiation, means for exposing said stimulable phosphor sheet to stimulating rays, and means for photoelectrically detecting the light emitted by said stimulable phosphor sheet.

Claim 6

An abnormal pattern detecting apparatus as defined in claim 4 wherein said stimulating rays are a laser beam.

Claim 7

An abnormal pattern detecting apparatus as defined in claim 1, further comprising means for recording said radiation image on photographic film.

Claim 8

A linear pattern width calculating apparatus, wherein the width of a linear pattern is calculated from an image signal representing a radiation image, in which the linear pattern is embedded, the width of the linear pattern being taken at the position at which a predetermined picture element falling within the region corresponding to the linear pattern is located, the linear pattern width calculating apparatus comprising: i) a first distance calculating means comprising: means for finding an intersection of each of a plurality of lines, which extend from said predetermined picture element toward edges of said radiation image such that two lines extending from said predetermined picture element in opposite directions may be grouped into a single set and a plurality of sets of lines may thus be obtained, and either one of boundary lines defining said linear pattern, and means for calculating the distance between each of the intersections, which have thus been found, and said predetermined picture element, ii) a second distance calculating means for adding two distances, which have been calculated for each set of two said lines, and calculating the distance between the two intersections for each set of two said lines, and iii) a finding means comprising: means for finding the minimum distance from a plurality of said distances, each of which has been calculated between the two intersections for each set of two said lines, and means for determining said minimum distance as the width of said linear pattern, which width is taken at the position at which said predetermined picture element is located.

Claim 9

A linear pattern width calculating apparatus, wherein the width of a linear pattern is calculated from an image signal representing a radiation image, in which the linear pattern is embedded, the width of the linear pattern being taken at the position at which a predetermined picture element falling within the region corresponding to the linear pattern is located, the linear pattern width calculating apparatus comprising: i) a first distance calculating means comprising: means for finding an intersection of each of a plurality of lines, which extend from said predetermined picture element toward edges of said radiation image such that two lines extending from said predetermined picture element in opposite directions may be grouped into a single set and a plurality of sets of lines may thus be obtained, and either one of boundary lines defining said linear pattern, and means for calculating the distance between each of the intersections, which have thus been found, and said predetermined picture element, ii) a second distance calculating means for adding two distances, which have been calculated for each set of two said lines, and calculating the distance between the two intersections for each set of two said lines, and iii) a finding means comprising: means for finding the minimum distance from a plurality of said distances, each of which has been calculated between the two intersections for each set of two said lines, and means for determining said minimum distance as the width of said linear pattern, which width is taken at the position at which said predetermined picture element is located.

Claim 10

A linear pattern width calculating apparatus as defined in claim 7, further comprising means for storing said radiation image on a stimulable phosphor sheet.

Claim 11

A linear pattern width calculating apparatus as defined in claim 8, further comprising means for obtaining said image signal representing said radiation image by exposing said stimulable phosphor sheet to stimulating rays, which cause said stimulable phosphor sheet to emit light in proportion to the amount of energy stored thereon during its exposure to radiation, means for exposing said stimulable phosphor sheet to stimulating rays, and means for photoelectrically detecting the light emitted by said stimulable phosphor sheet.

Claim 12

A linear pattern width calculating apparatus as defined in claim 9 wherein said stimulating rays are a laser beam.

Claim 13

A linear pattern width calculating apparatus as defined in claim 7, further comprising means for recording said radiation image on photographic film.