Band matching system and method for enabling accurate determination of a disparity between two surfaces using an interferometer

Claim 2

A band matching method for enabling accurate determination of a disparity between two surfaces using an interferometer, comprising the steps of: (a) capturing an image of first and second surfaces with a pattern of interferometric fringes superimposed over said image and over said surfaces; (b) identifying a discontinuity in a primary fringe that is used for said determination of said disparity; (c) moving a pixel value from an adjacent fringe to said primary fringe to fill in said discontinuity; (d) arithmetically fitting first and second equations to portions of said primary fringe over said first and second surfaces respectively; and (e) determining said disparity between said surfaces based upon said first and second equations.

Claim 3

The method of claim 1, further comprising the steps of: tracking said primary fringe from a first side of said image to a first end pixel situated in close proximity to a central region, to thereby form a first trace; tracking said primary fringe from a second side of said image to a second end pixel situated in close proximity to said central region, to thereby form a second trace; and determining whether said first and second traces are both derived from a singular fringe of said pattern by comparing said first and second end pixels.

Claim 4

The method of claim 1, wherein said disparity corresponds to undercut of an optical fiber relative to a curvature associated with a surrounding material.

Claim 5

The method of claim 1, wherein said disparity corresponds to protrusion of an optical fiber relative to a curvature associated with a surrounding material.

Claim 6

The method of claim 1, wherein said primary fringe is a darkest fringe of said pattern and wherein said pattern is produced with white light.

Claim 7

The method of claim 1, wherein step (a) comprises the steps of: (1) exposing said surfaces to an interferometer disposed at an angle relative to an axis that is substantially perpendicular to said surfaces; and (2) capturing said image with a camera coupled to said interferometer.

Claim 8

The method of claim 1, wherein step (a) comprises the step of moving said interferometric fringe at a desired location in said image by adjusting a displacement of an interferometer relative to said surfaces.

Claim 9

The method of claim 1, wherein said equations are circles and wherein step (d) further comprises the step of deriving said disparity by subtracting distances between said circles over said second surface.

Claim 10

The method of claim 1, wherein step (b) comprises the step of comparing a spacing between adjacent pixel values to determine said discontinuity.

Claim 11

The method of claim 1, wherein step (c) comprises the steps of: (1) producing a most probable curve from pixel values along said primary fringe; (2) analyzing pixel values in a line running transverse to said fringes of said pattern to identify locations of said fringes of said pattern and to determine whether pixels reside on said most probable curve; (3) when a particular pixel value does not reside on said most probable curve, then determining whether a distance between said particular pixel value and said most probable curve corresponds with an integer multiple of a spacing between said fringes of said pattern; (4) when said distance does not correspond with said multiple of said fringe spacing, discarding said pixel value as noise; and (5) when said distance does correspond with said multiple of said fringe spacing, shifting a location of said particular pixel value by said fringe spacing to cause said location to fit on said most probable curve.

Claim 12

The method of claim 2, wherein when said first and second traces are derived from different fringes, further comprising the steps of: tracing another fringe from said second side of said image to a third endpoint pixel, to thereby form a third trace; and determining whether said third trace and said first trace are both derived from a singular fringe by comparing said first and third end pixels.

Claim 13

A band matching method for enabling accurate determination of a disparity between first and second surfaces using an interferometer, said first surface surrounding said second surface, comprising the steps of: (a) capturing an image of said surfaces with a pattern of interferometric fringes superimposed over said image and over said surfaces; (b) isolating zones in said image for analysis, while discarding regions characterized by noise, by: (1) determining first and fourth zones in said image over said first surface and over said fringe on opposing sides of said second surface; (2) defining second and third zones over said second surface and over said fringe on opposing sides of a center of said second surface; (c) enhancing a primary fringe of said pattern that is used for said determination of said disparity by the following steps: (1) checking for discontinuities in said primary fringe in said first and fourth zones; (2) moving a pixel value from another fringe to said primary fringe to fill in said discontinuity; (3) after step (c)(1), checking for discontinuities in said primary fringe in a first transition zone residing between said first and second zones and repeating step (c)(2); (4) after step (c)(3), checking for discontinuities in said primary fringe in a second transition zone residing between said third and fourth zones and repeating step (c)(2); (d) arithmetically fitting a first equation to said fringe in said first and fourth zones; (e) arithmetically fitting a second equation to said fringe in said second and third zones; and (f) determining said disparity between said surfaces based upon said first and second equations.

Claim 14

A band matching method for enabling accurate determination of a disparity between first and second surfaces using an interferometer, said first surface surrounding said second surface, comprising the steps of: (a) capturing an image of said surfaces with a pattern of interferometric fringes superimposed over said image and over said surfaces; (b) isolating zones in said image for analysis, while discarding regions characterized by noise, by: (1) determining first and fourth zones in said image over said first surface and over said fringe on opposing sides of said second surface; (2) defining second and third zones over said second surface and over said fringe on opposing sides of a center of said second surface; (c) enhancing a primary fringe of said pattern that is used for said determination of said disparity by the following steps: (1) checking for discontinuities in said primary fringe in said first and fourth zones; (2) moving a pixel value from another fringe to said primary fringe to fill in said discontinuity; (3) after step (c)(1), checking for discontinuities in said primary fringe in a first transition zone residing between said first and second zones and repeating step (c)(2); (4) after step (c)(3), checking for discontinuities in said primary fringe in a second transition zone residing between said third and fourth zones and repeating step (c)(2); (d) arithmetically fitting a first equation to said fringe in said first and fourth zones; (e) arithmetically fitting a second equation to said fringe in said second and third zones; and (f) determining said disparity between said surfaces based upon said first and second equations.

Claim 15

A band matching system for enabling accurate determination of a disparity between two surfaces using an interferometer, comprising: first means for capturing an image of said surfaces with a plurality of interferometric fringes superimposed over said image and over said surfaces; second means for identifying a discontinuity in a primary fringe that is used for said determination; third means for moving a pixel value residing on an adjacent fringe to said primary fringe to fill in said discontinuity; fourth means for arithmetically fitting respective equations to portions of said primary fringe over said surfaces; and fifth means for determining said disparity between said surfaces based upon said respective equations.

Claim 16

A band matching system for enabling accurate determination of a disparity between two surfaces using an interferometer, comprising: first means for capturing an image of said surfaces with a plurality of interferometric fringes superimposed over said image and over said surfaces; second means for identifying a discontinuity in a primary fringe that is used for said determination; third means for moving a pixel value residing on an adjacent fringe to said primary fringe to fill in said discontinuity; fourth means for arithmetically fitting respective equations to portions of said primary fringe over said surfaces; and fifth means for determining said disparity between said surfaces based upon said respective equations.

Claim 17

A band matching system for enabling accurate determination of a disparity between two surfaces using an interferometer, comprising: (a) an interferometer disposed at an angle relative to an axis that is substantially perpendicular to a target from which said surfaces are measured so that when said surfaces are exposed to said interferometer at said target, interferometric fringes are superimposed over an image captured by said interferometer; (b) a camera coupled to said interferometer for encoding said image; and (c) a machine vision system connected to said camera for receiving said image, said machine vision system comprising: (1) first means for identifying a discontinuity in a primary fringe that is used for said determination; (2) second means for moving a pixel value residing on an adjacent fringe to said primary fringe to fill in said discontinuity; (3) third means for arithmetically fitting respective equations to portions of said primary fringe over said surfaces; and (4) fourth means for determining said disparity between said surfaces based upon said respective equations.

Claim 18

A band matching system for enabling accurate determination of a disparity between two surfaces using an interferometer, comprising: (a) an interferometer disposed at an angle relative to an axis that is substantially perpendicular to a target from which said surfaces are measured so that when said surfaces are exposed to said interferometer at said target, interferometric fringes are superimposed over an image captured by said interferometer; (b) a camera coupled to said interferometer for encoding said image; and (c) a machine vision system connected to said camera for receiving said image, said machine vision system comprising: (1) first means for identifying a discontinuity in a primary fringe that is used for said determination; (2) second means for moving a pixel value residing on an adjacent fringe to said primary fringe to fill in said discontinuity; (3) third means for arithmetically fitting respective equations to portions of said primary fringe over said surfaces; and (4) fourth means for determining said disparity between said surfaces based upon said respective equations.

Claim 19

The system of claim 14, wherein said disparity corresponds to undercut of an optical fiber relative to a curvature associated with a surrounding material.

Claim 20

The system of claim 14, wherein said disparity corresponds to protrusion of an optical fiber relative to a curvature associated with a surrounding material.

Claim 21

The system of claim 14, wherein said primary fringe is a darkest fringe of said pattern and wherein said pattern is produced with white light.

Claim 22

The system of claim 14, further comprising a focus adjustment means for moving said interferometric fringe at a desired location in said image by adjusting a displacement of said interferometer relative to said surfaces.

Claim 23

The system of claim 14, wherein said first means comprises a means for comparing a spacing between adjacent pixel values to determine said discontinuity.

Claim 24

The system of claim 14, wherein said second means comprises: (1) means for producing a most probable curve from pixel values along said primary fringe; (2) means for analyzing pixel values in a line running transverse to said fringes of said pattern to identify locations of said fringes of said pattern and to determine whether pixels reside on said most probable curve; (3) means, when a particular pixel value does not reside on said most probable curve, for determining whether a distance between said particular pixel value and said most probable curve corresponds with a spacing between said fringes of said pattern; (4) means, when said distance does not correspond with said fringe spacing, for discarding said pixel value as noise; and (5) means, when said distance does correspond with said fringe spacing, for shifting a location of said particular pixel value by said fringe spacing to cause said location to fit on said most probable curve.