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US5504435A Expired / Lapsed US ⏱️ 0.0 years remaining

Testing contactor for small-size semiconductor devices

Assignee: STMicroelectronics SRL
•
Filing: 1995-06-05
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Granted: 1996-04-02
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Expires: 2015-06-05
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Abstract

Abstract A testing contactor is provided for testing small-size semiconductor devices with large currents at high frequencies. Each semiconductor device to be tested has a plurality of leads. The testing contactor includes a plurality of first electric contact elements. A first Kelvin contact for a lead is formed of a first electric contact element in contact with the lead. The testing contactor further includes a plurality of second electric contact elements and a plurality of electric connection elements. An electric connection element in contact with the lead effectively extends the lead. A second Kelvin contact is formed of a second electric contact element and an electric connection element, the second electric contact element in contact with the electric connection element and the electric connection element in contact with the lead.

Inventors

  • 👤 Romano Perego

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 14:45
CPC Classifications
H; H05; H05K; H05K7/00; H05K7/02; H05K7/10; H05K7/1015; H05K7/1023; G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 113 words
A method for providing Kelvin contacts to a lead of a small-size semiconductor device, the contacts suitable for use in testing the device with large currents at high frequencies, comprising the steps of: bringing together a first contact element and the lead until the first contact element makes contact with a first point on the lead; maintaining a predetermined spatial relationship between the first contact element and a second contact element; and bringing together an electric connection element and the lead, the electric connection element having a first end and a second end, until the first end contacts a second point on the lead and the second end contacts the second contact element.
Claim 2
Independent Claim 113 words
A method for providing Kelvin contacts to a lead of a small-size semiconductor device, the contacts suitable for use in testing the device with large currents at high frequencies, comprising the steps of: bringing together a first contact element and the lead until the first contact element makes contact with a first point on the lead; maintaining a predetermined spatial relationship between the first contact element and a second contact element; and bringing together an electric connection element and the lead, the electric connection element having a first end and a second end, until the first end contacts a second point on the lead and the second end contacts the second contact element.
Claim 3
Dependent Claim 22 words
A method according to claim 1, wherein the second point is on the opposite side of the lead from the first point
Claim 4
Dependent Claim 28 words
A method according to claim 1, wherein bringing together an electric connection element and the lead includes moving the electric connection element in an arc of a circle.
Claim 5
Dependent Claim 26 words
A method according to claim 1, wherein bringing together the electric connection element and the lead includes moving the electric connection element in a straight line.

References Cited (Backward Citations)

US4316231A Cited
US4887969A Cited
EP0295007A2 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1999-04-02 1999-10-02 2000-04-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2003-04-02 2003-10-02 2004-04-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2007-04-02 2007-10-02 2008-04-02 $7700.00 Window Closed / Lapsed

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