US5498971A
Expired / Lapsed
US
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Method and control circuit for measuring the temperature of an integrated circuit
Assignee: NEC Corp
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Filing: 1995-06-06
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Granted: 1996-03-12
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Expires: 2015-06-06
Abstract
Abstract A method and circuit for relatively accurately measuring the die temperature of an IC, such as a microprocessor, by sensing one or more internal circuit elements which have an electrical parameter which varies as a function of temperature, such as an input protection diode. By sensing the one or more circuit elements which have an electrical parameter that is temperature dependent, the method provides a relatively more accurate measurement of the die temperature than measuring the outside temperature of the IC package. In addition, a control circuit is provided for cooling the IC during excessive temperature conditions by slowing down the clock frequency of the IC until the die temperature is within the temperature limit in order to optimize the utility of the IC during excessive temperature conditions.
Inventors
- 👤 Robert R. Turnbull
- 👤 David J. DeLisle
- 👤 Robert A. Kohtz
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 11:44
CPC Classifications
G; G01; G01K; G01K7/00; G01K7/01; G01R; G01R31/00; G01R31/28; G01R31/30; G01R31/26; G01R31/2601
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
116 words
A control circuit for measuring the internal die temperature of an integrated circuit (IC) having a predetermined internal circuit element whose voltage varies with temperature connected between predetermined output pins of said IC, said control circuit comprising: first means for generating a predetermined first voltage at one of said predetermined output pins; second means for generating a second predetermined voltage at the other of said predetermined output pins; means for measuring the voltage difference between said first predetermined voltage and said second predetermined voltage to generate a signal representative of the internal die temperature of said IC and means for controlling the clock frequency of said IC as a function of said die temperature representative signal.
Claim 2
Dependent Claim
116 words
A control circuit for measuring the internal die temperature of an integrated circuit (IC) having a predetermined internal circuit element whose voltage varies with temperature connected between predetermined output pins of said IC, said control circuit comprising: first means for generating a predetermined first voltage at one of said predetermined output pins; second means for generating a second predetermined voltage at the other of said predetermined output pins; means for measuring the voltage difference between said first predetermined voltage and said second predetermined voltage to generate a signal representative of the internal die temperature of said IC and means for controlling the clock frequency of said IC as a function of said die temperature representative signal.
Claim 3
Dependent Claim
20 words
A control circuit as recited in claim 1 wherein said second predetermined voltage is greater than said first predetermined voltage.
Claim 4
Dependent Claim
22 words
A control circuit as recited in claim 1 wherein said first predetermined voltage is the supply voltage V cc for said IC.
Claim 5
Dependent Claim
38 words
A control circuit as recited in claim 1 wherein said predetermined internal circuit element is internally connected between a voltage supply pin and an input pin and said voltage supply V cc is connected to said supply pin.
Claim 6
Dependent Claim
37 words
A control circuit as recited in claim 4 wherein said second voltage generating means includes a predetermined resistive element connected on one end and a predetermined voltage source connected on an opposing end of said resistive clement.
Claim 7
Dependent Claim
29 words
A control circuit as recited in claim 5, wherein said predetermined resistive element and said predetermined voltage source are selected to generate a voltage greater than said supply voltage.
Claim 8
Dependent Claim
32 words
A control circuit as recited in claim 5, wherein said resistive element and said predetermined voltage source are selected to limit the input current to the input pin to a predetermined value.
Claim 9
Independent Claim
111 words
A method for measuring the internal die temperature of an integrated circuit (IC) having an internal circuit element which has an electrical characteristic which varies as a function of temperature, connected between two or more output pins comprising the steps of: (a) supplying a first voltage to one of said output supply pins; (b) supplying a second voltage to the other of said output supply pins; (c) measuring the voltage difference between said first voltage and said second voltage, and generating a signal that is representative of the die temperature of said IC; and (d) controlling the clock frequency of said IC as a function of said die temperature representative signal.
Claim 10
Independent Claim
111 words
A method for measuring the internal die temperature of an integrated circuit (IC) having an internal circuit element which has an electrical characteristic which varies as a function of temperature, connected between two or more output pins comprising the steps of: (a) supplying a first voltage to one of said output supply pins; (b) supplying a second voltage to the other of said output supply pins; (c) measuring the voltage difference between said first voltage and said second voltage, and generating a signal that is representative of the die temperature of said IC; and (d) controlling the clock frequency of said IC as a function of said die temperature representative signal.
Claim 11
Independent Claim
120 words
A method for optimizing the utility of an integrated circuit (IC) having an internal circuit element which has an electrical characteristic that varies as a function of temperature connected between two or more output pins comprising the steps of: (a) applying a first voltage to an output pin connected to one end of said internal circuit element; (b) applying a second relatively higher voltage to an output pin connected to an opposing end of said internal circuit element; (c) measuring the difference between said first voltage and said second voltage to generate a signal representative of the die temperature of said IC: and (d) controlling the clock frequency of said IC as a function of said die temperature representative signal.
Claim 12
Independent Claim
120 words
A method for optimizing the utility of an integrated circuit (IC) having an internal circuit element which has an electrical characteristic that varies as a function of temperature connected between two or more output pins comprising the steps of: (a) applying a first voltage to an output pin connected to one end of said internal circuit element; (b) applying a second relatively higher voltage to an output pin connected to an opposing end of said internal circuit element; (c) measuring the difference between said first voltage and said second voltage to generate a signal representative of the die temperature of said IC: and (d) controlling the clock frequency of said IC as a function of said die temperature representative signal.
Claim 13
Dependent Claim
34 words
A method as recited in claim 9 wherein step (d) includes the steps of decreasing the clock frequency applied to said IC when said die temperature representative signal is greater than a predetermined threshold.
Claim 14
Dependent Claim
34 words
A method as recited in claim 10 wherein step (d) further includes the step of increasing the clock frequency to said IC when said die temperature representative signal is less than a predetermined threshold.
Claim 15
Dependent Claim
134 words
A control circuit for optimizing the utility of an integrated circuit (IC) having an internal circuit element which has an electrical characteristic that varies as a function of temperature, said circuit element being connected to two or more output pins; said control circuit comprising; means for applying a first predetermined voltage to a first output pin connected to one end of said internal circuit element; means for applying a second predetermined voltage to a second output pin connected to an opposing end of said internal circuit element; means or measuring the voltage difference between said first predetermined voltage and said second predetermined voltage and generating a signal representative of the internal temperature of said IC; and means for controlling the clock frequency of said IC as a function of said internal temperature representative signal.
Claim 16
Dependent Claim
134 words
A control circuit for optimizing the utility of an integrated circuit (IC) having an internal circuit element which has an electrical characteristic that varies as a function of temperature, said circuit element being connected to two or more output pins; said control circuit comprising; means for applying a first predetermined voltage to a first output pin connected to one end of said internal circuit element; means for applying a second predetermined voltage to a second output pin connected to an opposing end of said internal circuit element; means or measuring the voltage difference between said first predetermined voltage and said second predetermined voltage and generating a signal representative of the internal temperature of said IC; and means for controlling the clock frequency of said IC as a function of said internal temperature representative signal.
Claim 17
Dependent Claim
26 words
A control circuit as recited in claim 12 wherein said first applying means includes means for connecting a predetermined supply voltage to said first output pin.
Claim 18
Dependent Claim
27 words
A control circuit as recited in claim 13 wherein said second applying means includes means for generating a second relatively higher voltage at said second output pin.
Claim 19
Dependent Claim
57 words
A control circuit as recited in claim 13 wherein said generating means includes a resistive element connected between said second output pin and a predetermined voltage source; said resistive element and said predetermined voltage source being selected such that the voltage at said second output pin is relatively larger than the voltage at said first output pin.
Claim 20
Dependent Claim
34 words
A control circuit as recited in claim 12 wherein said controlling means includes means for decreasing the clock frequency of the IC when said internal temperature representative signal is greater than a predetermined threshold.
Claim 21
Dependent Claim
35 words
A control circuit as recited in claim 16 wherein said controlling means further includes means for increasing the clock frequency of the IC when said internal temperature representative signal is less than a predetermined threshold.
References Cited (Backward Citations)
US3835458A
Cited
US4390972A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-03-12 | 1999-09-11 | 2000-03-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-03-12 | 2003-09-11 | 2004-03-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-03-12 | 2007-09-11 | 2008-03-12 | $7700.00 | Window Closed / Lapsed |