Multi-layer conductor leads in a magnetoresistive head

Claim 2

A magnetoresistive sensor comprising: a magnetoresistive material, formed on a substrate, having a first edge and a second edge; a first hard bias layer; a second herd bias layer; a first multilayered conductive lead structure formed over the first hard bias layer electrically connected to the first edge; and a second multilayered conductive lead structure formed over the second hard bias layer electrically connected to the second edge, wherein the first and second conductive lead structures are constructed of multiple layers of thin film materials, wherein the layers alternate between a thin film of a refractory metal and a thin film of a highly conductive metal, and further wherein the first and second conductive lead structures have a first refractory layer formed in contact with the first and second hard biased layers, respectively, and have at least a second refractory layer interlayered between two layers composed of the highly conductive metal.

Claim 3

A magnetoresistive head assembly according to claim 1, wherein the refractory metal is taken from the group consisting of tantalum, tungsten, titanium, niobium, and chromium.

Claim 4

A magnetoresistive head assembly according to claim 2, wherein the refractory metal is tantalum.

Claim 5

A magnetoresistive head assembly according to claim 1, wherein the highly conductive metal is taken from the group consisting of gold, an alloy of gold and nickel, and an alloy of gold and copper.

Claim 6

A magnetoresistive head assembly according to claim 4, wherein the highly conductive metal is gold.

Claim 7

A magnetoresistive head assembly according to claim 4, wherein the highly conductive metal is a gold binary alloy in the range from zero (0) to fifty percent (50%) copper (Cu) content.

Claim 8

A magnetoresistive head assembly according to claim 6, wherein the highly conductive metal is a gold binary alloy of forty-five percent (45%) copper (Cu) content.

Claim 9

A magnetoresistive head assembly according to claim 4, wherein the highly conductive metal is a gold binary alloy in the range from zero (0) to fifteen percent (15%) nickel (Ni) content.

Claim 10

A magnetoresistive head assembly according to claim 8, wherein the highly conductive metal is a gold binary alloy of ten percent (10%) nickel (Ni) content.

Claim 11

A magnetoresistive head assembly according to claim 1, wherein the refractory metal is tantalum and the highly conductive material is gold, and further wherein the ratio of tantalum layer thickness to gold layer thickness is less than thirty-three percent (33%).

Claim 12

A magnetoresistive head assembly according to claim 10, wherein the ratio of tantalum layer thickness to gold layer thickness is greater than ten percent (10%).

Claim 13

A magnetoresistive head assembly according to claim 11, wherein the tantalum layer thickness is thirty-five Angstroms (35 Å) and the gold layer thickness is two hundred Angstroms (200 Å).

Claim 14

A magnetoresistive head assembly according to claim 1, wherein the magnetoresistive material is comprised of: a shield layer overlaying the substrate; an insulation layer overlaying the shield layer; a soft film layer overlaying the insulation layer; a tantalum spacer layer overlaying the soft film layer; a nickel-iron layer overlaying the spacer layer; and a tantalum cap layer overlaying the nickel-iron layer.

Claim 15

A magnetoresistive head assembly according to claim 1, wherein the first and second conductive lead structures are further comprised of: a chromium layer overlaying the substrate; and a hard-bias material overlaying the chromium layer, wherein the conductive lead structure overlays the hard-bias material.

Claim 16

A magnetoresistive head assembly according to claim 14, wherein the hard-bias material is cobalt-platinum-chromium.

Claim 17

A magnetic storage system comprising: a magnetic storage medium having a plurality of tracks for recording of data; and a magnetic transducer maintained in a closely spaced position relative to the magnetic storage medium during relative movement between the magnetic transducer and the magnetic storage medium, the magnetic transducer further including: a magnetoresistive material, formed on a substrate, having a first edge and a second edge; a first hard bias layer; a second hard bias layer; a first multilayered conductive lead structure formed over the first hard bias layer electrically connected to the first edge; a second multilayered conductive lead structure formed over the second hard bias layer electrically connected to the second edge, wherein the first and second conductive lead structures are constructed of multiple layers of thin film materials, wherein the layers alternate between a thin film of a refractory metal and a thin film of a highly conductive metal, and further wherein the first and second conductive lead structures have a first refractory layer formed in contact with the first and second hard biased layers, respectively, and have at least a second refractory layer interlayered between two layers composed of the highly conductive metal; actuator means coupled to the magnetic transducer for moving the magnetic transducer to selected tracks on the magnetic storage medium; and means coupled between the first and second multilayered conductive lead structures for detecting resistance changes in the magnetoresistive material responsive to magnetic fields representative of data bits recorded in the magnetic storage medium intercepted by the layer of magnetoresistive material.

Claim 18

A magnetic storage system comprising: a magnetic storage medium having a plurality of tracks for recording of data; and a magnetic transducer maintained in a closely spaced position relative to the magnetic storage medium during relative movement between the magnetic transducer and the magnetic storage medium, the magnetic transducer further including: a magnetoresistive material, formed on a substrate, having a first edge and a second edge; a first hard bias layer; a second hard bias layer; a first multilayered conductive lead structure formed over the first hard bias layer electrically connected to the first edge; a second multilayered conductive lead structure formed over the second hard bias layer electrically connected to the second edge, wherein the first and second conductive lead structures are constructed of multiple layers of thin film materials, wherein the layers alternate between a thin film of a refractory metal and a thin film of a highly conductive metal, and further wherein the first and second conductive lead structures have a first refractory layer formed in contact with the first and second hard biased layers, respectively, and have at least a second refractory layer interlayered between two layers composed of the highly conductive metal; actuator means coupled to the magnetic transducer for moving the magnetic transducer to selected tracks on the magnetic storage medium; and means coupled between the first and second multilayered conductive lead structures for detecting resistance changes in the magnetoresistive material responsive to magnetic fields representative of data bits recorded in the magnetic storage medium intercepted by the layer of magnetoresistive material.

Claim 19

A magnetic storage system assembly according to claim 16, wherein the refractory metal is taken from the group consisting of tantalum, tungsten, titanium, niobium, and chromium.

Claim 20

A magnetic storage system according to claim 16, wherein the highly conductive metal is taken from the group consisting of gold, an alloy of gold and nickel, and an alloy of gold and copper.

Claim 21

A magnetic storage system according to claim 16, wherein the refractory metal is tantalum and the highly conductive material is gold, and further wherein the ratio of tantalum layer thickness to gold layer thickness is in the range between ten percent (10%) and thirty-three percent (33%).

Claim 22

A magnetic storage system according to claim 19, wherein the tantalum layer thickness is thirty-five Angstroms (35 Å) and the gold layer thickness is two hundred Angstroms (200 Å).