US5469072A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated circuit test system
Assignee: NXP USA Inc
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Filing: 1993-11-01
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Granted: 1995-11-21
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Expires: 2013-11-01
Abstract
Abstract An integrated circuit test system provides a quick change flexible circuit membrane (214). The flexible circuit membrane is a quadrant based design which allows steep launch angles away from a rectangular die under test (112). The flexible circuit membrane is edge guided (308,309) for positioning and concentric alignment in a probe tooling fixture (212). The system may include a focusing force member (528) focusing force only at the test point locations in line with the die pad contact positions (512) which allows greater force to be concentrated on the contact area, and helps to alleviate the debris tracking or "dust mop" effect. Additionally, a relieved area (620) may be provided on the pressure applicator (616) to prevent membrane droop or the pillowing effects.
Inventors
- 👤 William M. Williams
- 👤 Anthony Angelo
- 👤 Gregory L. Westbrook
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 14:39
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/0735
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
120 words
An integrated circuit test system, comprising: a semiconductor die including a plurality of die electrical contacts; a plurality of external electrical contacts corresponding to the die electrical contacts; a force focusing member exerting an isolated force against the external electrical contacts, the isolated force being aligned with the die electrical contacts, wherein the force focusing member comprises an elastomeric pressure pad configured to have pad portions aligned with the die electrical contacts; and a rigid force applicator and an elastomeric pedestal, the elastomeric pedestal located between the rigid force applicator and a rigid portion of the force focusing member, the elastomeric pedestal allowing the force focusing member to adjust to a position occupying a plane parallel with the semiconductor die.
Claim 2
Dependent Claim
120 words
An integrated circuit test system, comprising: a semiconductor die including a plurality of die electrical contacts; a plurality of external electrical contacts corresponding to the die electrical contacts; a force focusing member exerting an isolated force against the external electrical contacts, the isolated force being aligned with the die electrical contacts, wherein the force focusing member comprises an elastomeric pressure pad configured to have pad portions aligned with the die electrical contacts; and a rigid force applicator and an elastomeric pedestal, the elastomeric pedestal located between the rigid force applicator and a rigid portion of the force focusing member, the elastomeric pedestal allowing the force focusing member to adjust to a position occupying a plane parallel with the semiconductor die.
Claim 3
Dependent Claim
156 words
An integrated circuit test system, comprising: a semiconductor die including a plurality of die electrical contacts; a plurality of external electrical contacts corresponding to the die electrical contacts; a force focusing member exerting an isolated force against the external electrical contacts, the isolated force being aligned with the die electrical contacts; and a rigid force applicator and an elastomeric pedestal, the elastomeric pedestal located between the rigid force applicator and a rigid portion of the force focusing member, the elastomeric pedestal allowing the force focusing member to adjust to a position occupying a plane parallel with the semiconductor die, wherein the force focusing member lies between the rigid force applicator and the semiconductor die, and wherein the external electrical contacts are disposed on a flexible membrane positioned between the force focusing member and the semiconductor die, and wherein a portion of the flexible membrane is recessed toward the force applicator and away from the semiconductor die.
Claim 4
Dependent Claim
156 words
An integrated circuit test system, comprising: a semiconductor die including a plurality of die electrical contacts; a plurality of external electrical contacts corresponding to the die electrical contacts; a force focusing member exerting an isolated force against the external electrical contacts, the isolated force being aligned with the die electrical contacts; and a rigid force applicator and an elastomeric pedestal, the elastomeric pedestal located between the rigid force applicator and a rigid portion of the force focusing member, the elastomeric pedestal allowing the force focusing member to adjust to a position occupying a plane parallel with the semiconductor die, wherein the force focusing member lies between the rigid force applicator and the semiconductor die, and wherein the external electrical contacts are disposed on a flexible membrane positioned between the force focusing member and the semiconductor die, and wherein a portion of the flexible membrane is recessed toward the force applicator and away from the semiconductor die.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-11-20 | 1999-05-22 | 1999-11-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-11-20 | 2003-05-22 | 2003-11-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-11-20 | 2007-05-22 | 2007-11-21 | $7700.00 | Window Closed / Lapsed |