Testing clip and circuit board contacting method

Claim 1

A test probe, comprising: a handle formed by an electrically insulating elongated sleeve; an electrically insulating tubular guide formed at one end of said sleeve; a metallic test needle anchored in said guide and extending at most limitedly beyond said guide into said sleeve, said needle having a contact end projecting longitudinally from said guide and formed with a contact point for direct engagement with an electrical test connection by pressing of said needle thereagainst; an insulated wire connected to said needle remote from said contact point, within said sleeve but proximal to said one end of said sleeve for electrical connection of the probe to test equipment; a rod extending through said guide and longitudinally guided therein, said rod having a hook retractable toward said guide inwardly past said point into a retracted position and extendable outwardly past said point into an extended position upon displacement of said rod in said sleeve; a button affixed to said rod in said sleeve, projecting axially from said sleeve at an opposite end thereof, and manually displaceable to retract and extend said hook, whereby said hook can engage a structure and hold said point against an electrical test connection; and resilient means in said sleeve biasing said button away from said guide and drawing said hook toward said retracted position.