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US5452070A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for analyzing solid sample

Assignee: JFE Steel Corp
•
Filing: 1994-06-27
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Granted: 1995-09-19
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Expires: 2014-06-27
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Abstract

Abstract A method for analyzing solid sample comprises the steps of: introducing an inert carrier gas into a cell; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, the laser beam having a pulse half width of 0.001 mu sec or more, a pulse energy density of 0.001 GW/cm2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V ( mu g/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a retio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample; S</=0.25 log V+1.5, S>/=-0.2 log V+0.6, 0.1</=V</=100 intoducing the generated fine particles to a detector.

Inventors

  • 👤 Tadashi Mochizuki
  • 👤 Yohichi Ishibashi
  • 👤 Takanori Akiyoshi
  • 👤 Yoshihito Iwata
  • 👤 Satoshi Kinoshiro
  • 👤 Akiko Sakashita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 15:37
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/62; G01N21/71; G01N21/718

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 178 words
A method for analyzing solid sample comprising the steps of: positioning a solid sample in a cell; introducing an inert carrier gas into the cell, said carrier gas having a carbon content of 1 ppm or less as impurity; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, said laser beam having a pulse half width of 0.001 μsec or more, a pulse energy density of 0.001 GW/cm 2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V (μg/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a ratio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample; S≦0.25 log V+1.5, S≧-0.2 log V+0.6, 0.1≦V≦100 intoducing the generated fine particles to a detector; and analyzing the concentration of the target element within the fine particles.
Claim 2
Independent Claim 178 words
A method for analyzing solid sample comprising the steps of: positioning a solid sample in a cell; introducing an inert carrier gas into the cell, said carrier gas having a carbon content of 1 ppm or less as impurity; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, said laser beam having a pulse half width of 0.001 μsec or more, a pulse energy density of 0.001 GW/cm 2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V (μg/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a ratio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample; S≦0.25 log V+1.5, S≧-0.2 log V+0.6, 0.1≦V≦100 intoducing the generated fine particles to a detector; and analyzing the concentration of the target element within the fine particles.
Claim 3
Dependent Claim 44 words
The method of claim 1, wherein the step of generating fine particles is carried out by irradiating laser beam having a pulse half width of 0.05-0.5 μsec, a pulse energy density of 0.01-50 GW/cm 2 , and a frequency of 100 Hz or more.
Claim 4
Dependent Claim 34 words
The method of claim 2, wherein the laser beam is irradiated while moving a focusing point of the laser beam at a speed of 0.1 mm/sec or more in parallel to the sample surface.
Claim 5
Dependent Claim 26 words
The method of claim 3, wherein the moving of the focusing point is carried out by moving a forcusing lens in parallel to the sample surface.
Claim 6
Dependent Claim 20 words
The method of claim 3, wherein the moving of the focusing point is carried out by rotating a reflection mirror.
Claim 7
Dependent Claim 20 words
The method of claim 1, wherein the inert carrier gas is a gas purified by a getter gas purification device.
Claim 8
Dependent Claim 36 words
The method of claim 1, wherein the inert carrier gas is introduced to the cell through a gas piping system which is made of at least one selected from the group consisting of metal and glass.

References Cited (Backward Citations)

JPH03118440A Cited

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