US5449955A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Film circuit metal system for use with bumped IC packages
Assignee: AT&T Inc
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Filing: 1994-04-01
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Granted: 1995-09-12
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Expires: 2014-04-01
Abstract
Abstract A multilayer composite interconnection for use in circuits including thin film elements and electrical interconnections includes a copper barrier layer interposed between a nickel layer and a gold layer of the interconnection. The copper layer is in a thickness sufficient to bar or at least to restrict diffusion of nickel through the gold layer under processing and operating conditions. The interconnection multilayer composite interconnection includes in an ascending order, titanium, palladium or palladium-titanium alloy, copper, nickel, copper barrier and gold layers.
Inventors
- 👤 Richard P. Debiec
- 👤 Michael D. Evans
- 👤 Warren J. Pendergast
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 18:30
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/30; H05K3/32; H05K3/34; H05K3/3452; H05K3/22; H05K3/24; H05K3/244; H05K3/38; H05K3/388; H10; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/66; H10W90/00; H05K2203/00; H05K2203/03; H05K2203/0315
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
93 words
A circuit including thin film elements and electrical interconnections on the major surface of an insulating substrate, said interconnections comprising a plurality of metal layers deposited on said substrate in a preselected pattern, said plurality of metal layers comprises in an ascending order from the substrate titanium, palladium or a palladium-titanium alloy, copper nickel and gold, wherein a thin barrier layer of copper is interposed between the gold layer and the nickel layer, said thin barrier layer of copper being in a thickness sufficient to restrict diffusion of nickel through said gold layer.
Claim 2
Dependent Claim
93 words
A circuit including thin film elements and electrical interconnections on the major surface of an insulating substrate, said interconnections comprising a plurality of metal layers deposited on said substrate in a preselected pattern, said plurality of metal layers comprises in an ascending order from the substrate titanium, palladium or a palladium-titanium alloy, copper nickel and gold, wherein a thin barrier layer of copper is interposed between the gold layer and the nickel layer, said thin barrier layer of copper being in a thickness sufficient to restrict diffusion of nickel through said gold layer.
Claim 3
Dependent Claim
19 words
The circuit of claim 1 in which said copper barrier layer ranges from 200 to 1,000 nanometers in thickness.
Claim 4
Dependent Claim
15 words
The circuit of claim 1 in which said copper barrer layer is 200 nanometers thick.
Claim 5
Dependent Claim
74 words
The circuit of claim 1 in which said titanium layer is form 100 to 400 nm, said palladium layer is from 3 to 100 nm, said palladium titanium alloy layer is from 50 to 300 nm, said copper layer is from 2,500 to 10,000 nm, said nickel layer is from 800 to 2,500 nm, said copper barrier layer is from 200 to 1000 nm, and said gold layer is from 700 to 4,000 nm.
Claim 6
Dependent Claim
57 words
The circuit of claim 1 which said Ti layer is 250 nm thick, said Pd is 50 nm thick, said Pd-Ti alloy layer is 100-150 nm thick, said copper layer is 3,500 nm thick, said Ni layer is 1,000 nm thick, said copper barrier layer is 200 nm thick, and said Au layer is 2,000 nm thick.
Claim 7
Dependent Claim
54 words
The circuit of claim 1 in which said gold preferably overlays those areas of each interconnection which are to be used for soldering contacts or bonding conductors thereto, and in which those of laterally extending portions of the Ni layer which are not covered with Au, are provided on purpose with nickel oxide coating.
Claim 8
Dependent Claim
99 words
A composite electrical interconnection for use in circuits including thin film elements and electrical interconnections on the major surface of an insulating substrate, said interconnection comprising a plurality of metal layers deposited on said substrate in a preselected pattern said plurality of metal layers comprises in an ascending order from the substrate titanium, palladium or a palladium-titanium alloy, copper, nickel and gold, wherein a thin barrier layer of copper is interposed between the gold layer and the nickel layer, said thin barrier layer of copper being in a thickness sufficient to bar diffusion of nickel through said gold layer.
Claim 9
Dependent Claim
99 words
A composite electrical interconnection for use in circuits including thin film elements and electrical interconnections on the major surface of an insulating substrate, said interconnection comprising a plurality of metal layers deposited on said substrate in a preselected pattern said plurality of metal layers comprises in an ascending order from the substrate titanium, palladium or a palladium-titanium alloy, copper, nickel and gold, wherein a thin barrier layer of copper is interposed between the gold layer and the nickel layer, said thin barrier layer of copper being in a thickness sufficient to bar diffusion of nickel through said gold layer.
Claim 10
Dependent Claim
55 words
The interconnection of claim 7 in which said gold layer preferably overlays those areas of said interconnections which are to be used for soldering contacts or bonding conductors thereto, and in which those of laterally extending portions of the Ni layer, which are not covered with Au, are provided on purpose with nickel oxide coating.
Claim 11
Dependent Claim
19 words
The interconnection of claim 7 in which said copper barrier layer ranges from 200 to 1,000 nanometers in thickness.
Claim 12
Dependent Claim
15 words
The interconnection of claim 7 in which said copper barrer layer is 200 nanometers thick.
Claim 13
Dependent Claim
74 words
The interconnection of claim 7 in which said titanium layer is form 100 to 400 nm, said palladium layer is from 3 to 100 nm, said palladium titanium alloy layer is from 50 to 300 nm, said copper layer is from 2,500 to 10,000 nm, said nickel layer is from 800 to 2,500 nm, said copper barrier layer is from 200 to 1000 nm, and said gold layer is from 700 to 4,000 nm.
Claim 14
Dependent Claim
57 words
The interconnection claim 7 in which said Ti layer is 250 nm thick, said Pd is 50 nm thick, said Pd-Ti alloy layer is 100-150 nm thick, said copper layer is 3,500 nm thick, said Ni layer is 1,000 nm thick, said copper barrier layer is 200 nm thick, and said Au layer is 2,000 nm thick.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1998-09-11 | 1999-03-13 | 1999-09-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-09-11 | 2003-03-13 | 2003-09-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-09-11 | 2007-03-13 | 2007-09-12 | $7700.00 | Window Closed / Lapsed |