Broad band waveguide spectrometer

Claim 2

A spectrometer for analyzing a sample of material by utilization of an electromagnetic radiation source and a detector comprising: a. a waveguide possessing an entry for admission of electromagnetic radiation from the source and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a surface between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation from the waveguide to pass from said waveguide; b. a tapered portion forming a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; c. a substrate adjacent said waveguide, said substrate being capable of passing electromagnetic radiation from the source to said tapered portion forming part of said waveguide entry; and d. capturing means for directing electromagnetic radiation passing from said exit of said waveguide to a detector.

Claim 3

The spectrometer of claim 1 in which said capturing means comprises a grating formed at said exit of said waveguide.

Claim 4

The spectrometer of claim 1 in which said capturing means comprises an edge formed at said exit of said waveguide.

Claim 5

The spectrometer of claim 1 in which said capturing means comprises a prism placed at said exit of said waveguide.

Claim 6

The spectrometer of claim 1 in which said capturing means comprises a tapered coupler formed at said exit of said waveguide.

Claim 7

The spectrometer of claim 1 which additionally comprises optical means for altering the electromagnetic radiation traveling between the source and the tapered portion of said entry.

Claim 8

The spectrometer of claim 6 in which said optical means comprises a fiber optic element.

Claim 9

The spectrometer of claim 6 in which said optical means comprises a lens.

Claim 10

The spectrometer of claim 6 in which said optical means comprises a filter.

Claim 11

The spectrometer of claim 9 in which said filter comprises polarizing filter.

Claim 12

The spectrometer of claim 1 in which said tapered portion increases uniformly in thickness from an edge to the thickness of the coupled waveguide.

Claim 13

The spectrometer of claim 1 in which said substrate includes a material possessing lower refractive index than said waveguide.

Claim 14

The spectrometer of claim 1 which additionally comprises channel means for permitting continuous flow of the sample across said surface of said waveguide.

Claim 15

The spectrometer of claim 1 in which said substrate includes a non planar surface, and said waveguide being formed on said non planar substrate surface.

Claim 16

The spectrometer of claim 14 in which additionally includes a fiber optic element conducting electromagnetic radiation from the source to said waveguide entry, and a fiber optic element exiting said waveguide to said capturing means.

Claim 17

A spectrometer for analyzing a sample of material by utilization of an electromagnetic radiation source and a detector comprising: a. a waveguide possessing an entry for admission of electromagnetic radiation from the source and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a surface between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation from the waveguide to pass from said waveguide; b. a tapered portion comprising a curved body, said tapered portion forming a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; and c. capturing means for directing electromagnetic radiation passing from said exit of said waveguide to a detector.

Claim 18

A spectrometer for analyzing a sample of material by utilization of an electromagnetic radiation source and a detector comprising: a. a waveguide possessing an entry for admission of electromagnetic radiation from the source and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a surface between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation from the waveguide to pass from said waveguide; b. a tapered portion comprising a curved body, said tapered portion forming a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; and c. capturing means for directing electromagnetic radiation passing from said exit of said waveguide to a detector.

Claim 19

A spectrometer for analyzing a sample of material utilizing an electromagnetic radiation source and a detector, comprising: a. a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a material of a certain refractive index having a surface, between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation in the waveguide to pass from said waveguide; b. a tapered portion forming at least a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; c. a coating on a portion of said waveguide surface of said waveguide of sufficient thickness to measurably reduce interaction of the electromagnetic radiation with the sample, said coating including a material possessing a lower refractive index than the material included in said waveguide; and d. capturing means for directing electromagnetic radiation that has interacted with the sample, passing from said exit of said waveguide to a detector.

Claim 20

A spectrometer for analyzing a sample of material utilizing an electromagnetic radiation source and a detector, comprising: a. a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a material of a certain refractive index having a surface, between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation in the waveguide to pass from said waveguide; b. a tapered portion forming at least a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; c. a coating on a portion of said waveguide surface of said waveguide of sufficient thickness to measurably reduce interaction of the electromagnetic radiation with the sample, said coating including a material possessing a lower refractive index than the material included in said waveguide; and d. capturing means for directing electromagnetic radiation that has interacted with the sample, passing from said exit of said waveguide to a detector.

Claim 21

The spectrometer of claim 17 in which said coating on said waveguide surface possesses a thickness of at least 0.2 microns.

Claim 22

The spectrometer of claim 17 which further comprises recondensing means for steering electromagnetic radiation exiting said waveguide to the detector.

Claim 23

The spectrometer of claim 17 which additionally comprises optical means for altering the electromagnetic radiation traveling between the source and the tapered portion of said entry.

Claim 24

A spectrometer for analyzing a sample of material utilizing an electromagnetic radiation source and a detector, comprising: a. a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a surface between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation in the waveguide to pass from said waveguide; b. a tapered portion forming at least a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; c. a coating on a portion of said waveguide surface of said waveguide of sufficient thickness to measurably reduce interaction of the electromagnetic radiation with the sample, said coating including at least a first portion and a second portion, said first portion of said coating possessing a thickness less than said second portion of said coating; and d. capturing means for directing electromagnetic radiation that has interacted with the sample, passing from said exit of said waveguide to a detector.

Claim 25

A spectrometer for analyzing a sample of material utilizing an electromagnetic radiation source and a detector, comprising: a. a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source, said waveguide further including a surface between said entry and exit portions, permitting interaction between electromagnetic radiation passing through said waveguide and a sample of material, said waveguide exit permitting electromagnetic radiation in the waveguide to pass from said waveguide; b. a tapered portion forming at least a part of said entry of said waveguide, said tapered portion coupling electromagnetic radiation emanating from the source to said waveguide; c. a coating on a portion of said waveguide surface of said waveguide of sufficient thickness to measurably reduce interaction of the electromagnetic radiation with the sample, said coating including at least a first portion and a second portion, said first portion of said coating possessing a thickness less than said second portion of said coating; and d. capturing means for directing electromagnetic radiation that has interacted with the sample, passing from said exit of said waveguide to a detector.

Claim 26

The spectrometer of claim 21 in which said first and second portions of said coating thicknesses are less than the evanescent penetration depth of the electromagnetic radiation passing through said waveguide.