Atomic layered materials and temperature control for giant magnetoresistive sensor

Claim 3

The apparatus of claim 1 wherein said material is positioned in a head for use in retrieving data from magnetic storage media in a memory system.

Claim 4

The apparatus of claim 1 wherein said material is FeRh.

Claim 5

The apparatus of claim 1 wherein said second means includes third means for passing a current through said material, and fourth means for generating a signal indicative of the voltage across said material.

Claim 6

The apparatus of claim 1 wherein said first means includes means for controlling the temperature T of said material at T±0.1 Kelvin.

Claim 7

The apparatus of claim 1 wherein said temperature is below the transition temperature T cr of said material at a predetermined pressure.

Claim 8

The apparatus of claim 6 wherein said temperature is less than 0.1 K. below said transition temperature.

Claim 9

The apparatus of claim 1 wherein said magnetic atoms or ions are selected from the group consisting of Mn, Fe, Co and Ni.

Claim 10

The apparatus of claim 1 wherein said material is Mn Pt.

Claim 11

The apparatus of claim 1 wherein said material is FeRh.

Claim 12

The apparatus of claim 1 wherein said material is selected from the group consisting of MnPt and FePd.

Claim 13

A memory system for retrieving data stored in a magnetic layer comprising: a disk including said magnetic layer thereon, said material having a critical field H cr , a positioner for moving said disk relative to a head, said head positioned to intercept magnetic flux emerging or returning to said magnetic layer for generating signals indicative of the data stored in said magnetic layer, said head including a material consisting of at least one type of magnetic atom or ion and at least one type of nonmagnetic atom or ion, said magnetic atoms or ions being regularly arrayed in a crystal interspersed with said nonmagnetic atoms or ions, said magnetic atoms or ions of said material at a predetermined temperature being antiferromagnetically aligned with all nearest neighbor magnetic atoms or ions at first times when said magnetic field to be detected being below the critical field H cr adjacent said material, said magnetic atoms or ions of said material at said predetermined temperature being changed to ferromagnetic order at second times when said magnetic field to be detected being increased above a predetermined value whereby the magnetic field in said material being greater than the critical field H cr , first means for controlling the temperature of said material with a predetermined temperature range, and second means for determining whether said material is ferromagnetically ordered.

Claim 14

A memory system for retrieving data stored in a magnetic layer comprising: a disk including said magnetic layer thereon, said material having a critical field H cr , a positioner for moving said disk relative to a head, said head positioned to intercept magnetic flux emerging or returning to said magnetic layer for generating signals indicative of the data stored in said magnetic layer, said head including a material consisting of at least one type of magnetic atom or ion and at least one type of nonmagnetic atom or ion, said magnetic atoms or ions being regularly arrayed in a crystal interspersed with said nonmagnetic atoms or ions, said magnetic atoms or ions of said material at a predetermined temperature being antiferromagnetically aligned with all nearest neighbor magnetic atoms or ions at first times when said magnetic field to be detected being below the critical field H cr adjacent said material, said magnetic atoms or ions of said material at said predetermined temperature being changed to ferromagnetic order at second times when said magnetic field to be detected being increased above a predetermined value whereby the magnetic field in said material being greater than the critical field H cr , first means for controlling the temperature of said material with a predetermined temperature range, and second means for determining whether said material is ferromagnetically ordered.

Claim 15

The memory system of claim 12 wherein said second means includes third means for passing a current through said material, and fourth means for generating a signal indicative of the voltage across said material.

Claim 16

The memory system of claim 12 wherein said material is FeRh.

Claim 17

The memory system of claim 12 wherein said first means includes means for controlling the temperature of said material at T±0.1 Kelvin.

Claim 18

The memory system of claim 12 wherein said magnetic atoms or ions are selected form the group consisting of Mn, Fe, Co and Ni.

Claim 19

The memory system of claim 12 wherein said material is MnPt.

Claim 20

The memory system of claim 12 wherein said material is FeRu.

Claim 21

The memory system of claim 12 wherein said material is selected form the group consisting of MnPt and FePd.

Claim 22

The memory system of claim 12 wherein said temperature is below the transition temperature T cr of said material at a predetermined pressure and at a predetermined applied magnetic field.

Claim 23

The memory system of claim 20 wherein said temperature is less than 0.1 K. below said transition temperature.

Claim 24

A magnetoresistive sensor positioned in the head of head/disk assembly comprising: a material consisting of FeRh having a surface adapted for positioning in the proximity of the surface of said disk, first means for controlling the temperature of said material within a predetermined temperature range whereby said FeRh transitions from an antiferromagnetic state to a ferromagnetic state in a first predetermined magnetic field and from a ferromagnetic state to an antiferromagnetic state in a second predetermined magnetic field, second means for passing electrical current through said material, and third means for generating a signal indicative of the voltage across said material.

Claim 25

A magnetoresistive sensor positioned in the head of head/disk assembly comprising: a material consisting of FeRh having a surface adapted for positioning in the proximity of the surface of said disk, first means for controlling the temperature of said material within a predetermined temperature range whereby said FeRh transitions from an antiferromagnetic state to a ferromagnetic state in a first predetermined magnetic field and from a ferromagnetic state to an antiferromagnetic state in a second predetermined magnetic field, second means for passing electrical current through said material, and third means for generating a signal indicative of the voltage across said material.

Claim 26

The magnetoresistive sensor of claim 22 further including a head housing for supporting said material, said head housing adapted for attachment to a slider.

Claim 29

The method of claim 24 further including the step of positioning said material in a head for use in retrieving data from magnetic storage media in a memory system.

Claim 30

The method of claim 24 wherein said step of determining includes the steps of passing a current through said material, and generating a signal indicative of the voltage across said material.

Claim 31

The method of claim 24 wherein said step of controlling includes the step of controlling the temperature of T± said material at T±0.1 Kelvin.

Claim 32

The method of claim 24 wherein said step of controlling includes the step of selecting said predetermined temperature range below the transition temperature T cr of said material at a predetermined pressure and at a predetermined applied magnetic field.

Claim 33

The method of claim 24 wherein said step of controlling includes the step of selecting a temperature wherein said temperature is less than 0.1 K. below the transition temperature T cr of said material at a predetermined pressure and at a predetermined applied magnetic field.

Claim 34

The method of claim 24 wherein said step of selecting a material includes selecting a material with magnetic atoms or ions selected from the group consisting of Mn, Fe, Co and Ni.

Claim 35

The method of claim 24 wherein said step of selecting a material includes selecting a material from the group consisting of FeRh, FeRu, FePd and MnPt.