Semiconductor matrix type sensor for very small surface pressure distribution

Claim 2

An analog finger print reader comprising a semiconductor matrix of surface pressure distribution sensors having a plurality of semiconductor crosspoint switching elements formed on a semiconductor substrate, a field of partially exposed electrodes on said semiconductor substrate, each of said electrodes being individually associated with a corresponding one of said switching elements, a flexible film suspended over said field of electrodes, said flexible film having a conductive coating formed on a surface thereof which confronts said field of electrodes, said flexible film being deflected and said conductive coating being placed in a varying degree of electrical contact with some of the electrodes at positions corresponding to a pattern of surface pressure applied to said film by ridges and valleys on a finger tip, said degree of contact being dependent upon the amount of pressure applied to said electrical contact, contact resistances being formed between the conductive coating of the contacted electrodes, said contact resistance having a resistance value which varies with the degree of contact between the conductive coating and the electrode, measuring means comprising X- and Y-direction shift registers and detector means formed on said semiconductor substrate, means responsive to said shift registers for sequentially generating addresses of said electrodes in order to scan said electrodes in said field, means responsive to said addresses for extending a circuit through an addressed electrode to said detector means, and said detector means detecting said resistance values as analog values corresponding to said degree of pressures applied at said positions where said conductive coating is pressed into contact with said electrodes.

Claim 3

The reader of claim 1 wherein said measuring means measures the voltage level at said contact between said conductive coating and an electrode in order to detect the surface pressure distribution in terms of analog values.

Claim 4

The reader according to claim 1, wherein said electrodes are orthogonally arranged in a matrix formed on a major surface of a semiconductor chip, the distribution of said output electrodes being located at very small pitches in the range of about 10 to 200 μm.

Claim 5

The reader according to claim 1, wherein each of said contacts between said conductive coating and said electrodes form a variable resistance, said detector means detecting an analog voltage level at each of said contact means.

Claim 6

The reader according to claim 1, wherein said contact between said conductive coating and said electrodes form a variable resistance for limiting current as an analog of said surface pressure applied by said finger tip, said analog current being applied as an input to said electrodes and to said switching elements.

Claim 7

An electronic finger print reader comprising an integrated circuit chip, said integrated circuit comprising means for scanning an array of electrodes which are individually associated with electronic switching elements formed in an area on said chip corresponding to at least an area of a finger print, there being enough of said switching elements within said area to read a pattern of ridges and valleys in said finger print, each of said switching elements having an individually associated one of said electrodes at least partially exposed above a surface of said chip, a thin film having a conductive surface suspended over said electrodes, the ridges of said finger print pressing said conductive surface against individual ones of said electrodes to make contact therewith on a basis selected by the amount of contact between the ridges in said finger print and the individual electrodes touched by said ridges, the area of said contact between said conductive surface and said electrode being an analog value of the pressure applied by a ridge to an electrode, whereby the resistance across said contact varies with variations of said applied pressure, means responsive to said contact between said electrodes and said conductive surface for applying said potential to operate those of said switching elements which are individually associated with a contacted electrode, means for applying a source potential to said operated contact via a resistor so that the voltage drop across said resistor varies with the variations in resistance across said contact, detector means formed on said integrated circuit chip, said detector means being connected to said resistor to detect the voltage level resulting from said voltage drop, and means responsive to said scanning means for detecting an address of each operated one of said switching elements and for effectively applying said voltage level corresponding to said operated switching element to said detector means.

Claim 8

An electronic finger print reader comprising an integrated circuit chip, said integrated circuit comprising means for scanning an array of electrodes which are individually associated with electronic switching elements formed in an area on said chip corresponding to at least an area of a finger print, there being enough of said switching elements within said area to read a pattern of ridges and valleys in said finger print, each of said switching elements having an individually associated one of said electrodes at least partially exposed above a surface of said chip, a thin film having a conductive surface suspended over said electrodes, the ridges of said finger print pressing said conductive surface against individual ones of said electrodes to make contact therewith on a basis selected by the amount of contact between the ridges in said finger print and the individual electrodes touched by said ridges, the area of said contact between said conductive surface and said electrode being an analog value of the pressure applied by a ridge to an electrode, whereby the resistance across said contact varies with variations of said applied pressure, means responsive to said contact between said electrodes and said conductive surface for applying said potential to operate those of said switching elements which are individually associated with a contacted electrode, means for applying a source potential to said operated contact via a resistor so that the voltage drop across said resistor varies with the variations in resistance across said contact, detector means formed on said integrated circuit chip, said detector means being connected to said resistor to detect the voltage level resulting from said voltage drop, and means responsive to said scanning means for detecting an address of each operated one of said switching elements and for effectively applying said voltage level corresponding to said operated switching element to said detector means.

Claim 9

The reader of claim 6 wherein said detector means formed on said semiconductor chip reads signals which said scanning means sends to said electronic switching elements.

Claim 10

The reader of claim 6 wherein said resistor is connected to said conductive surface, said detector means being connected to detect said voltage drop across said resistor responsive to current flow through an electronic switch when it turns on responsive to said conductive surface being pressed against an electrode.

Claim 11

The reader of claim 6 wherein said resistor is connected between each output of said scanning means and an input to said electronic switching elements, and said detector means is connected to detect said voltage drop across said resistors when an electronic switch operates responsive to said conductive surface touching an electrode individually associated with said operated switch.

Claim 12

A semiconductor device comprising a semiconductor substrate having an integrated circuit thereon, said integrated circuit having an orthogonal array of horizontal and vertical buses forming a matrix of crosspoints, a first shift register means coupled to said horizontal busses and a second shift register coupled to said vertical busses for scanning said crosspoints, a resilient conductive film stretched over said electrodes, said film selectively touching said electrodes in response to minute pressures, the area of contact between said touching film and said electrode being a function of pressure applied through said film to said electrode, whereby a resistance measured across said contact is an analog of the applied pressure, and detector means for detecting an address of a crosspoint which is operated when scanned by said shift registers, said detector means giving an analog output signal responsive to the area of said contact.

Claim 13

A semiconductor device comprising a semiconductor substrate having an integrated circuit thereon, said integrated circuit having an orthogonal array of horizontal and vertical buses forming a matrix of crosspoints, a first shift register means coupled to said horizontal busses and a second shift register coupled to said vertical busses for scanning said crosspoints, a resilient conductive film stretched over said electrodes, said film selectively touching said electrodes in response to minute pressures, the area of contact between said touching film and said electrode being a function of pressure applied through said film to said electrode, whereby a resistance measured across said contact is an analog of the applied pressure, and detector means for detecting an address of a crosspoint which is operated when scanned by said shift registers, said detector means giving an analog output signal responsive to the area of said contact.