US5424246A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing semiconductor metal wiring layer by reduction of metal oxide
Assignee: Toshiba Corp
•
Filing: 1993-07-30
•
Granted: 1995-06-13
•
Expires: 2013-07-30
Abstract
Abstract According to this invention, there is provided a method of forming a groove wiring layer, including the steps of forming a metal oxide film, consisting of a metal oxide having a decrease in standard free energy smaller than a decrease in standard free energy of a hydrogen oxide or of a carbon oxide, on an insulating film formed on a semiconductor substrate, and reducing the metal oxide film to form an electrode-wiring layer consisting of a metal which is a main component constituting the metal oxide. In this manner, an electrode-wiring layer having high EM and SM resistances without causing an increase in electric resistivity caused by an impurity or the like can be obtained.
Inventors
- 👤 Mie Matsuo
- 👤 Haruo Okano
- 👤 Nobuo Hayasaka
- 👤 Kyoichi Suguro
- 👤 Hideshi Miyajima
- 👤 Jun-ichi Wada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 16:17
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/056; H10D; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0112; H10W20/032; H10W20/033; H10W20/037; H10W20/071; H10W20/093; H10W20/094; H10W20/40; H10W20/41; H10W20/425; H10W20/435
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
123 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a metal oxide film, consisting essentially of a metal oxide having a decrease in standard free energy smaller than a decrease in standard free energy of a hydrogen oxide or of a carbon oxide, on an insulating film formed on a semiconductor substrate; and reducing said metal oxide film to form an electrode wiring layer consisting essentially of a metal which is the main component constituting the metal oxide, wherein reduction of said metal oxide film is performed such that a film consisting essentially of at least one metal selected from the group consisting of chromium, vanadium, niobium, nickel, titanium and tantalum is brought into contact with said metal oxide film.
Claim 2
Independent Claim
123 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a metal oxide film, consisting essentially of a metal oxide having a decrease in standard free energy smaller than a decrease in standard free energy of a hydrogen oxide or of a carbon oxide, on an insulating film formed on a semiconductor substrate; and reducing said metal oxide film to form an electrode wiring layer consisting essentially of a metal which is the main component constituting the metal oxide, wherein reduction of said metal oxide film is performed such that a film consisting essentially of at least one metal selected from the group consisting of chromium, vanadium, niobium, nickel, titanium and tantalum is brought into contact with said metal oxide film.
Claim 3
Dependent Claim
41 words
The method according to claim 1, wherein a groove for at least one member selected from the group consisting of electrode and wiring is formed in a surface of said insulating film, and said electrode-wiring layer is formed in said groove.
Claim 4
Dependent Claim
26 words
The method according to claim 1, wherein said electrode-wiring layer consists essentially of at least one metal selected from the group consisting of copper and silver.
Claim 5
Dependent Claim
25 words
The method according to claim 1, wherein reduction of said metal oxide film is performed by annealing in a gas atmosphere containing hydrogen or carbon.
Claim 6
Dependent Claim
27 words
The method according to claim 1, further comprising the step of patterning said metal oxide film in the form of an electrode or a wiring before reduction.
Claim 7
Dependent Claim
25 words
The method according to claim 1, wherein formation of said metal oxide film on said semiconductor substrate is performed by sputtering while rotating said substrate.
Claim 8
Dependent Claim
41 words
The method according to claim 6, wherein the semiconductor is swung such that the axis perpendicular to a surface of said substrate is more than -90° and less than +90° with respect to the incident direction of particles to be sputtered.
Claim 9
Dependent Claim
17 words
The method according to claim 1, wherein said metal oxide film is formed by a collimation sputtering.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-06-12 | 1998-12-12 | 1999-06-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-06-12 | 2002-12-12 | 2003-06-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-06-12 | 2006-12-12 | 2007-06-13 | $7700.00 | Window Closed / Lapsed |